Works about SURFACE defects
1
- Scientific Data, 2025, v. 12, n. 1, p. 1, doi. 10.1038/s41597-025-05395-w
- Li, Ruiping;
- Zhao, Linchang;
- Wei, Hao;
- Hu, Guoqing;
- Xu, Yongchi;
- Ouyang, Bocheng;
- Tan, Jin
- Article
2
- China Mechanical Engineering, 2025, v. 36, n. 5, p. 1054, doi. 10.3969/jJssn.l004-132X.2025.05.017
- Article
3
- Composite Interfaces, 2025, v. 32, n. 7, p. 987, doi. 10.1080/09276440.2024.2448881
- Zhen, Guoqing;
- Liu, Long;
- Chen, Ping
- Article
4
- Engineering Letters, 2025, v. 33, n. 7, p. 2673
- Article
5
- IAENG International Journal of Computer Science, 2025, v. 52, n. 7, p. 2141
- Wenhui Zhang;
- Dajian Yi;
- Zheng Fang;
- Yi Zhao;
- Zhangping You
- Article
6
- World Electric Vehicle Journal, 2025, v. 16, n. 6, p. 328, doi. 10.3390/wevj16060328
- Zhang, Xiaolin;
- Lu, Lei;
- Luo, Hanyun;
- Wang, Lei
- Article
7
- Advanced Functional Materials, 2025, v. 35, n. 26, p. 1, doi. 10.1002/adfm.202500765
- Pan, Jianyong;
- Hu, Jingyang;
- Dong, Xinning;
- Wang, Yuhui;
- Zhang, Xiaoyu;
- McLachlan, Martyn A.;
- Wang, Zhongrui;
- Zhang, Jiaqi;
- Zhang, Lijun
- Article
8
- Advanced Functional Materials, 2025, v. 35, n. 26, p. 1, doi. 10.1002/adfm.202424070
- Zhou, Yuan;
- Zhang, Xuhao;
- Feng, Zhuo;
- Zheng, Wenwen;
- Li, Guang;
- Shen, Weicheng;
- Ai, Wei;
- Pu, Dexin;
- Fu, Shiqiang;
- Chen, Weiqing;
- Wang, Jiahao;
- Fang, Guojia;
- Ke, Weijun
- Article
9
- Photonics, 2025, v. 12, n. 6, p. 599, doi. 10.3390/photonics12060599
- Su, Xu;
- Peng, Xing;
- Zhou, Xingyu;
- Cao, Hongbing;
- Shan, Chong;
- Li, Shiqing;
- Qiao, Shuo;
- Shi, Feng
- Article
10
- Metals (2075-4701), 2025, v. 15, n. 6, p. 593, doi. 10.3390/met15060593
- Zhang, Ji;
- Zhu, Sihua;
- Wang, Zhixuan;
- Zhu, Jiahao;
- Bai, Zhenhua
- Article
11
- Infrastructures, 2025, v. 10, n. 6, p. 129, doi. 10.3390/infrastructures10060129
- Dow, Hamish;
- Perry, Marcus;
- McAlorum, Jack;
- Pennada, Sanjeetha
- Article
12
- Horticulturae, 2025, v. 11, n. 6, p. 652, doi. 10.3390/horticulturae11060652
- Jiang, Lili;
- Wang, Yunfei;
- Yan, Haohao;
- Yin, Yingzi;
- Wu, Chong
- Article
13
- ACI Materials Journal, 2015, v. 112, n. 6, p. 755, doi. 10.14359/51687769
- Yan Cheng;
- Hagan, Paul C.;
- Mitra, Rudrajit;
- Shuren Wang
- Article
14
- International Journal of Nanoscience, 2011, v. 10, n. 4/5, p. 681, doi. 10.1142/S0219581X11008940
- LAYEK, ARUNASISH;
- CHOWDHURY, ARINDAM
- Article
15
- Particle & Particle Systems Characterization, 2024, v. 41, n. 1, p. 1, doi. 10.1002/ppsc.202300062
- Zhang, Jiapeng;
- Zhang, Hui;
- Du, Qinghua;
- Xie, Xinjian;
- Fang, Yi;
- Tang, Chengchun;
- Chen, Guifeng
- Article
16
- Particle & Particle Systems Characterization, 2023, v. 40, n. 7, p. 1, doi. 10.1002/ppsc.202300010
- Du, Qinghua;
- Zhang, Hui;
- Zhang, Jiapeng;
- Xie, Xinjian;
- Liu, Guodong;
- Chen, Guifeng
- Article
17
- Particle & Particle Systems Characterization, 2022, v. 39, n. 7, p. 1, doi. 10.1002/ppsc.202200054
- Zhang, Yongliang;
- Chang, Cheng;
- Liu, Peifeng;
- Lei, Junyu;
- Cai, Jing
- Article
18
- Particle & Particle Systems Characterization, 2019, v. 36, n. 9, p. N.PAG, doi. 10.1002/ppsc.201900141
- Kim, Hye Ri;
- Lee, Daae;
- Lee, Ga Hyeon;
- Kim, Seong Kyun;
- Choi, Seong Jin;
- Hwang, Ee Taek;
- Maharjan, Anoth;
- Kim, Beom Soo;
- Kim, Dongyoung;
- Joo, Jong Hoon
- Article
19
- Annalen der Physik, 2019, v. 531, n. 9, p. N.PAG, doi. 10.1002/andp.201900026
- Wang, Yangbo;
- Zhou, Jie;
- Gao, Jiaxin;
- Zhang, Kun;
- Gao, Chao;
- Xie, Xiaoji;
- Huang, Ling
- Article
20
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 400, doi. 10.1007/s10854-008-9642-0
- Kouissa, S.;
- Aida, M. S.;
- Djemel, A.
- Article
21
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 182, doi. 10.1007/s10854-008-9630-4
- Polignano, M. L.;
- Mica, I.;
- Bontempo, V.;
- Cazzaniga, F.;
- Mariani, M.;
- Mauri, A.;
- Pavia, G.;
- Sammiceli, F.;
- Spoldi, G.
- Article
22
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 87, doi. 10.1007/s10854-008-9629-x
- Renaud, Cédric;
- Josse, Yves;
- Chih-Wen Lee;
- Nguyen, Thien-Phap
- Article
23
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 101, doi. 10.1007/s10854-008-9703-4
- Kaniewska, M.;
- Engström, O.;
- Kaczmarczyk, M.;
- Zaremba, G.
- Article
24
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 96, doi. 10.1007/s10854-008-9657-6
- Nasi, L.;
- Bocchi, C.;
- Germini, F.;
- Prezioso, M.;
- Gombia, E.;
- Mosca, R.;
- Frigeri, P.;
- Trevisi, G.;
- Seravalli, L.;
- Franchi, S.
- Article
25
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 24, doi. 10.1007/s10854-008-9579-3
- Vanhellemont, J.;
- Steenbergen, J. Van;
- Holsteyns, F.;
- Roussel, P.;
- Meuris, M.;
- Młynarczyk, K.;
- Śpiewak, P.;
- Geens, W.;
- Romandic, I..
- Article
26
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 32, doi. 10.1007/s10854-007-9507-y
- Weiyan Wang;
- Deren Yang;
- Xuegong Yu;
- Duanlin Que
- Article
27
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 423, doi. 10.1007/s10854-007-9226-4
- Article
28
- Cellulose, 2020, v. 27, n. 12, p. 7023, doi. 10.1007/s10570-020-03246-y
- Zhou, Man;
- Chen, Jingwen;
- Jiang, Mengting;
- Zhang, Yakang;
- Liang, Qian;
- Xu, Song;
- Yao, Chao;
- Li, Zhongyu
- Article
29
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.004
- Cameron, Douglas;
- Schilling, Marcel;
- Kusch, Gunnar;
- Edwards, Paul R;
- Spulis, Viesturs;
- Wernicke, Tim;
- Kneissl, Michael;
- Oliver, Rachel A;
- Martin, Robert W
- Article
30
- 2019
- York, Warren L.;
- Medlin, Douglas L.;
- Sugar, Joshua D.;
- Noell, Philip
- Abstract
31
- Clinical Rheumatology, 2018, v. 37, n. 3, p. 831, doi. 10.1007/s10067-018-4001-x
- Article
32
- European Radiology, 2023, v. 33, n. 5, p. 3276, doi. 10.1007/s00330-023-09443-0
- Ozel, Mehmet Ali;
- Ogul, Hayri;
- Koksal, Ali;
- Kose, Mehmet;
- Tuncer, Kutsi;
- Eren, Suat;
- Kantarci, Mecit
- Article
33
- Russian Journal of Nondestructive Testing, 2025, v. 61, n. 1, p. 137, doi. 10.1134/S1061830924603192
- Kong, Shiwu;
- Kong, Yiying;
- Chi, Xiaofei;
- Feng, Xuan;
- Ma, Lidong
- Article
34
- Russian Journal of Nondestructive Testing, 2024, v. 60, n. 4, p. 431, doi. 10.1134/S1061830924700633
- Article
35
- Russian Journal of Nondestructive Testing, 2024, v. 60, n. 2, p. 188, doi. 10.1134/S1061830924600114
- Delenkovskii, N. V.;
- Gnusin, A. B.
- Article
36
- Russian Journal of Nondestructive Testing, 2024, v. 60, n. 1, p. 46, doi. 10.1134/S1061830923601319
- Divin, A. G.;
- Ponomarev, S. V.;
- Mishchenko, S. V.;
- Zakharov, Yu. A.;
- Karpova, N. A.;
- Samodurov, A. A.;
- Golovin, D. Yu.;
- Tyurin, A. I.
- Article
37
- Russian Journal of Nondestructive Testing, 2023, v. 59, n. 12, p. 1315, doi. 10.1134/S1061830923601022
- Krysko, N. V.;
- Skrynnikov, S. V.;
- Shchipakov, N. A.;
- Kozlov, D. M.;
- Kusyy, A. G.
- Article
38
- Russian Journal of Nondestructive Testing, 2023, v. 59, n. 12, p. 1297, doi. 10.1134/S1061830923700596
- Nikitin, A. V.;
- Mikhaylov, A. V.;
- Mikhaylov, L. V.;
- Gobov, Yu. L.;
- Kostin, V. N.;
- Smorodinskiy, Ya. G.
- Article
39
- Russian Journal of Nondestructive Testing, 2023, v. 59, n. 12, p. 204, doi. 10.1134/S1061830923700274
- Dyakin, V. V.;
- Kudryashova, O. V.;
- Rayevskii, V. Ya.
- Article
40
- Russian Journal of Nondestructive Testing, 2023, v. 59, n. 3, p. 346, doi. 10.1134/S1061830922601118
- Liu, Zhiping;
- Zhang, Zhiwu;
- Lyu, Duo;
- Zhou, Yongli;
- Hu, Hongwei
- Article
41
- Russian Journal of Nondestructive Testing, 2023, v. 59, n. 2, p. 204, doi. 10.1134/S1061830923700274
- Dyakin, V. V.;
- Kudryashova, O. V.;
- Rayevskii, V. Ya.
- Article
42
- Russian Journal of Nondestructive Testing, 2022, v. 58, n. 12, p. 1107, doi. 10.1134/S1061830922700115
- Nikitin, A. V.;
- Gobov, Yu. L.;
- Mikhailov, A. V.;
- Mikhailov, L. V.
- Article
43
- Russian Journal of Nondestructive Testing, 2022, v. 58, n. 11, p. 1011, doi. 10.1134/S1061830922700036
- Nikitin, A. V.;
- Mikhailov, A. V.;
- Mikhailov, L. V.;
- Gobov, Yu. L.;
- Kostin, V. N.;
- Smorodinskii, Ya. G.
- Article
44
- Russian Journal of Nondestructive Testing, 2022, v. 58, n. 10, p. 926, doi. 10.1134/S106183092260085X
- Vagapov, R. K.;
- Ibatullin, K. A.
- Article
45
- Russian Journal of Nondestructive Testing, 2021, v. 57, n. 12, p. 1103, doi. 10.1134/S106183092112007X
- Nikitin, A. V.;
- Mikhailov, A. V.;
- Petrov, A. S.;
- Popov, S. E.;
- Gobov, Yu. L.
- Article
46
- Russian Journal of Nondestructive Testing, 2021, v. 57, n. 11, p. 1000, doi. 10.1134/S1061830921110073
- Dedkova, A. A.;
- Florinsky, I. V.;
- Gusev, E. E.;
- Dyuzhev, N. A.;
- Fomichev, M. Yu.;
- Shtern, M. Yu.
- Article
47
- Russian Journal of Nondestructive Testing, 2021, v. 57, n. 6, p. 446, doi. 10.1134/S1061830921060036
- Aleshin, N. P.;
- Krysko, N. V.;
- Skrynnikov, S. V.;
- Kusyy, A. G.
- Article
48
- Russian Journal of Nondestructive Testing, 2021, v. 57, n. 5, p. 361, doi. 10.1134/S1061830921050028
- Aleshin, N. P.;
- Krysko, N. V.;
- Kusyy, A. G.;
- Skrynnikov, S. V.;
- Mogilner, L. Yu.
- Article
49
- Russian Journal of Nondestructive Testing, 2021, v. 57, n. 4, p. 303, doi. 10.1134/S1061830921040057
- Gobov, Yu. L.;
- Popov, S. E.
- Article
50
- Russian Journal of Nondestructive Testing, 2021, v. 57, n. 1, p. 43, doi. 10.1134/S106183092101006X
- Yao Fei;
- Yimin, Cao;
- Guangyu, Chen
- Article