Works about SEMICONDUCTOR devices

Results: 1370

Direct Observation of Dry Etch‐Induced Selectivity Tailoring of Alkylate Inhibition Layer Using DMATMS Vapor.

Published in:

Advanced Materials Interfaces, 2025, v. 12, n. 10, p. 1, doi. 10.1002/admi.202400843

By:

Sim, Eunji;
Cho, Ha Eun;
Koo, Somang;
Kim, Jin Gyu;
Hahm, Sukgyu;
Kwon, Myongjong;
Hwang, Seonhye;
Lee, Soyoung;
Park, Byungha;
Ihm, Kyuwook

Publication type:

Article

Aromaticity‐Dependent Memristive Switching.

Published in:

Advanced Electronic Materials, 2025, v. 11, n. 7, p. 1, doi. 10.1002/aelm.202400654

By:

Cechosz, Ewelina;
Alluhaibi, Lulu;
Mazur, Tomasz;
Sławek, Andrzej;
Pandurangan, Nanjan;
Szaciłowski, Konrad

Publication type:

Article

Direct observation of 3D nitrogen distribution in silicon-based dielectrics using atom probe tomography.

Published in:

Nature Communications, 2025, v. 16, n. 1, p. 1, doi. 10.1038/s41467-025-60732-2

By:

Chae, Byeong-Gyu;
Won, Jeong Yeon;
Shin, Young Sik;
Yun, Dong Jin;
Ahn, Jae min;
Park, Seon Tae;
Lee, Ki-bum;
An, Hokyun;
Seol, Mina;
Ro, I-Jun;
Kim, Se-Ho;
Chung, Chunhyung;
Lee, Eunha

Publication type:

Article

Two-Switch High Step-Up DC–DC Converter with Low Input Current Suitable for PV Operation.

Published in:

Journal of Circuits, Systems & Computers, 2025, v. 34, n. 15, p. 1, doi. 10.1142/S0218126625503177

By:

Banaei, Mohamad Reza;
Aghapour, Yahya

Publication type:

Article

Metasurface-Enhanced Infrared Photodetection Using Layered van der Waals MoSe 2.

Published in:

Nanomaterials (2079-4991), 2025, v. 15, n. 12, p. 913, doi. 10.3390/nano15120913

By:

Li, Jinchun;
Xie, Zhixiang;
Zhao, Tianxiang;
Li, Hongliang;
Wu, Di;
Yu, Xuechao

Publication type:

Article

Synthesis of ZnO nanotubes via seed layer modulated by zinc acetate: pH-controlled interface growth.

Published in:

Journal of Solid State Electrochemistry, 2025, v. 29, n. 7, p. 3031, doi. 10.1007/s10008-025-06220-5

By:

Briones, Nicole;
Henríquez, Rodrigo;
Gómez, Humberto;
Rojas, Víctor;
Heyser, Cristopher;
Navarrete, Emilio

Publication type:

Article

A high step-up DC–DC converter based on triple-winding coupled inductor with ZCS and QR: operation principle, analysis, and verification.

Published in:

Electrical Engineering, 2025, v. 107, n. 6, p. 6915, doi. 10.1007/s00202-024-02909-4

By:

Karimi Hajiabadi, Mostafa;
Lahooti Eshkevari, Alireza;
Mosallanejad, Ali;
Salemnia, Ahmad

Publication type:

Article

Comprehensive Diagnostic Assessment of Inverter Failures in a Utility-Scale Solar Power Plant: A Case Study Based on Field and Laboratory Validation.

Published in:

Sensors (14248220), 2025, v. 25, n. 12, p. 3717, doi. 10.3390/s25123717

By:

Kull, Karl;
Asad, Bilal;
Naseer, Muhammad Usman;
Kallaste, Ants;
Vaimann, Toomas

Publication type:

Article

Electronics embedded washable textiles.

Published in:: Man-Made Textiles in India, 2018, v. 46, n. 8, p. 33
Publication type:: Article

Modeling of Electron Transfer in Graphene on SiC Substrate.

Published in:

International Journal of Nanoscience, 2019, v. 18, n. 3/4, p. N.PAG, doi. 10.1142/S0219581X19400933

By:

Muravev, V. V.;
Mishchenka, V. N.

Publication type:

Article

Analysis of Interface Charge Densities for High- k Dielectric Materials based Metal Oxide Semiconductor Devices.

Published in:

International Journal of Nanoscience, 2016, v. 15, n. 5/6, p. -1, doi. 10.1142/S0219581X16600115

By:

Maity, N. P.;
Thakur, R. R.;
Maity, Reshmi;
Thapa, R. K.;
Baishya, S.

Publication type:

Article

Atomically Precise Transformations and Millimeter-Scale Patterning of Nanoscale Assemblies by Ambient Electrospray Deposition.

Published in:

Particle & Particle Systems Characterization, 2017, v. 34, n. 7, p. n/a, doi. 10.1002/ppsc.201700101

By:

Som, Anirban;
Sarkar, Depanjan;
Kanhirathingal, Sisira;
Pradeep, Thalappil

Publication type:

Article

Large-Size Growth of Ultrathin SnS2 Nanosheets and High Performance for Phototransistors.

Published in:

Advanced Functional Materials, 2016, v. 26, n. 24, p. 4405, doi. 10.1002/adfm.201600318

By:

Zhou, Xing;
Zhang, Qi;
Gan, Lin;
Li, Huiqiao;
Zhai, Tianyou

Publication type:

Article

Single Crystal-Like Performance in Solution-Coated Thin-Film Organic Field-Effect Transistors.

Published in:

Advanced Functional Materials, 2016, v. 26, n. 14, p. 2379, doi. 10.1002/adfm.201502274

By:

del Pozo, Freddy G.;
Fabiano, Simone;
Pfattner, Raphael;
Georgakopoulos, Stamatis;
Galindo, Sergi;
Liu, Xianjie;
Braun, Slawomir;
Fahlman, Mats;
Veciana, Jaume;
Rovira, Concepció;
Crispin, Xavier;
Berggren, Magnus;
Mas‐Torrent, Marta

Publication type:

Article

Charge Photogeneration in Few-Layer MoS2.

Published in:

Advanced Functional Materials, 2015, v. 25, n. 22, p. 3351, doi. 10.1002/adfm.201500709

By:

Borzda, Tetiana;
Gadermaier, Christoph;
Vujicic, Natasa;
Topolovsek, Peter;
Borovsak, Milos;
Mertelj, Tomaz;
Viola, Daniele;
Manzoni, Cristian;
Pogna, Eva A. A.;
Brida, Daniele;
Antognazza, Maria Rosa;
Scotognella, Francesco;
Lanzani, Guglielmo;
Cerullo, Giulio;
Mihailovic, Dragan

Publication type:

Article

Biodegradable Thin Metal Foils and Spin-On Glass Materials for Transient Electronics.

Published in:

Advanced Functional Materials, 2015, v. 25, n. 12, p. 1789, doi. 10.1002/adfm.201403469

By:

Kang, Seung‐Kyun;
Hwang, Suk‐Won;
Yu, Sooyoun;
Seo, Jung‐Hun;
Corbin, Elise A.;
Shin, Jiho;
Wie, Dae Seung;
Bashir, Rashid;
Ma, Zhenqiang;
Rogers, John A.

Publication type:

Article

State-of-the-Art Progress in Diverse Heterostructured Photocatalysts toward Promoting Photocatalytic Performance.

Published in:

Advanced Functional Materials, 2015, v. 25, n. 7, p. 998, doi. 10.1002/adfm.201401636

By:

Li, Haijin;
Zhou, Yong;
Tu, Wenguang;
Ye, Jinhua;
Zou, Zhigang

Publication type:

Article

Estimation of Dislocation Densities With Nondestructive Scanning Electron Microscope Techniques: Application to Gallium Nitride.

Published in:

Microscopy & Microanalysis, 2025, v. 31, n. 1, p. 1, doi. 10.1093/mam/ozae124

By:

Mandal, Arka;
Beausir, Benoît;
Guyon, Julien;
Taupin, Vincent;
Guitton, Antoine

Publication type:

Article

Understanding Ion Implantation Defect Distributions in Silicon Induced by FIB and Other Ion Sources Using Advanced STEM.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.242

By:

Jauregui, Luis J;
Campbell, Deanna M;
Titze, Michael;
Scrymgeour, David;
Lu, Ping

Publication type:

Article

Denoising of Scanning Electron Microscope Images Acquired at Rapid Frame Rates for Metrology Measurement.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.207

By:

Jung, Haewon;
Kang, Hoon;
Lee, Ha Rim;
Park, In-Yong

Publication type:

Article

Estimating Specimen Height Using SEM Working Distance.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.199

By:

Yoon, Jiwon;
Cheon, Jisung;
Hong, Won Ki;
Baek, Hyeon Ji;
Park, Jin Wook;
Hwang, Kyu Man;
Lee, Sung-Ho

Publication type:

Article

Innovative TEM Auto Metrology by Integrating Statistical Analysis with Improved Accuracy.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.161

By:

Liu, Yong;
Carlton, Christopher Earl;
Taylor, Qi

Publication type:

Article

Precession-Assisted 4D-STEM Strain Characterization of Semiconductor Devices.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.080

By:

Serralta, Eduardo;
Moravek, Tomáš;
Hooley, Rob;
Chandran, Narendraraj

Publication type:

Article

Measurement of Electrostatic Potentials in Semiconductor Devices by Off-axis Electron Holography.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.073

By:

Cooper, David;
Boureau, Victor

Publication type:

Article

Chasing Down Leads: Imaging Conductivity Networks in a FinFET Processor.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.072

By:

Hubbard, William A;
Bonifacio, C S;
Li, R;
Ray, M L;
Regan, B C;
Fischione, P

Publication type:

Article

Microstructural Investigation of Porous Plating Copper by Atom Probe Tomography.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.052

By:

Kon, Naochika;
Nita, Nobuyasu;
Uzuhashi, Jun;
Ohkubo, Tadakatsu

Publication type:

Article

Experimental Tip Shape Imaging Routes to Assist Data Reconstruction in Atom Probe Tomography.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.031

By:

Fleischmann, Claudia;
Krasnov, Vitaly V;
Makhotkin, Igor A;
Scheerder, Jeroen E;
Tu, Yuan;
van der Heide, Paul

Publication type:

Article

Accurate Elemental Mapping of Semiconductor Devices Using EDS – Deconvolving Overlapping Peaks.

Published in:

2023

By:

Mu, Shangshang;
Stowe, David

Publication type:

Abstract

Validation of Minimum Electron Beam Dosage on Characterization of Carbon-Depletion in ULK Dielectric Materials by EELS Quantifications.

Published in:

Microscopy & Microanalysis, 2019, p. 1998, doi. 10.1017/S1431927618010474

By:

Zhao, Wayne;
Gribelyuk, Michael

Publication type:

Article

High Precision Phase-Shifting Electron Holography with Multiple Biprisms for GaN Semiconductor Devices.

Published in:

Microscopy & Microanalysis, 2019, p. 1554, doi. 10.1017/S1431927618008255

By:

Yamamoto, Kazuo

Publication type:

Article

Probing Nanoscale Local Lattice Strains in Semiconductor Nanostructures and Devices by Transmission Electron Microscopy.

Published in:

2019

By:

Wang, Jinguo;
Lian, Guoda;
Kim, Moon J.

Publication type:

Abstract

Automatic End-point Detection for Ar+ Milling of FIB in situ and ex situ Lift-out Specimens from Semiconductor Devices.

Published in:

2019

By:

Bonifacio, C.S.;
Giannuzzi, L.A.;
Nowakowski, P.;
Harbaugh, J.T.;
Campin, M.;
Boccabella, M.;
Ray, M.;
Fischione, P.E.

Publication type:

Abstract

Development of Automated Micro-Sampling System and Application to Semiconductor Devices.

Published in:

2019

By:

Sato, Takahiro;
Aizawa, Yuka;
Suzuki, Masato;
Tomimatsu, Satoshi;
Katane, Junich

Publication type:

Abstract

Multivariate Analysis and Compressed Sensing Methods for Spectroscopic Electron Tomography of Semiconductor Devices.

Published in:

Microscopy & Microanalysis, 2019, p. 500, doi. 10.1017/S1431927618002994

By:

Jacob, Martin;
Sanders, Toby;
Bernier, Nicolas;
Grenier, Adeline;
Pinheiro, Rafael Bortolin;
Mazen, Frederic;
Bayle-Guillemaud, Pascale;
Saghi, Zineb

Publication type:

Article

Effectively Characterize Planar-view FinFET Semiconductor Device Etch Uniformity by Introducing Diffraction Contrast in STEM Imaging.

Published in:

Microscopy & Microanalysis, 2019, p. 390, doi. 10.1017/S1431927618002441

By:

Zhao, Wayne W.

Publication type:

Article

Correlative HAADF-STEM and EDX-STEM Tomography for the 3D Morphological and Elemental Analysis of FinFET Semiconductor Devices.

Published in:

Microscopy & Microanalysis, 2019, p. 388, doi. 10.1017/S143192761800243X

By:

Sorel, Julien;
Jacob, Martin;
Sanders, Toby;
Grenier, Adeline;
Pinheiro, Rafael Bortolin;
Mazen, Frederic;
Epicier, Thierry;
Saghi, Zineb

Publication type:

Article

Analytical TEM Characterization of Source/Drain Contacts in Advanced Semiconductor Devices.

Published in:

Microscopy & Microanalysis, 2019, p. 8, doi. 10.1017/S1431927618000533

By:

Li, J.;
Niimi, H.;
Gluschenkov, O.;
Adusumilli, P.;
Fronheiser, J.;
Mochizuki, S.;
Liu, Z.;
Kamineni, V.;
Raymond, M.;
Carr, A. V;
Yamashita, T.;
Veeraraghavan, B.;
Saulnier, N.;
Gaudiello, J.

Publication type:

Article

Estimate of Errors in the Determination of Parameters of Linear Thermal Circuits of Semiconductor Devices Based on the Frequency Dependence of the Thermal Impedance.

Published in:

Measurement Techniques, 2016, v. 59, n. 8, p. 850, doi. 10.1007/s11018-016-1056-4

By:

Sergeev, V.;
Frolov, I.

Publication type:

Article

Measurement of the Parameters of On-Wafer Semiconductor Devices.

Published in:

Measurement Techniques, 2016, v. 59, n. 7, p. 765, doi. 10.1007/s11018-016-1044-8

By:

Savin, A.;
Guba, V.;
Bykova, O.

Publication type:

Article

防护服用供气背包制冷装置结构设计与性能试验.

Published in:

Fluid Machinery, 2024, v. 52, n. 8, p. 1, doi. 10.3969/j.issn.l005-0329.2024.08.001

By:

李希萌;
索槐;
任建强;
李岳;
蔡庆明;
侯雨雷;
曾达幸

Publication type:

Article

Optimisation of test architecture in three‐dimensional stacked integrated circuits for partial stack/complete stack using hard system‐on‐chips.

Published in:

IET Computers & Digital Techniques (Wiley-Blackwell), 2015, v. 9, n. 5, p. 268, doi. 10.1049/iet-cdt.2014.0137

By:

Roy, Surajit Kumar;
Giri, Chandan;
Rahaman, Hafizur

Publication type:

Article

A High-Flux Compact X-ray Free-Electron Laser for Next-Generation Chip Metrology Needs.

Published in:

Instruments (2410-390X), 2024, v. 8, n. 1, p. 19, doi. 10.3390/instruments8010019

By:

Rosenzweig, James B.;
Andonian, Gerard;
Agustsson, Ronald;
Anisimov, Petr M.;
Araujo, Aurora;
Bosco, Fabio;
Carillo, Martina;
Chiadroni, Enrica;
Giannessi, Luca;
Huang, Zhirong;
Fukasawa, Atsushi;
Kim, Dongsung;
Kutsaev, Sergey;
Lawler, Gerard;
Li, Zenghai;
Majernik, Nathan;
Manwani, Pratik;
Maxson, Jared;
Miao, Janwei;
Migliorati, Mauro

Publication type:

Article

Mechanism Analysis of Bubble Discharge Within Silicone Gels Under Pulsed Electric Field.

Published in:

Gels (2310-2861), 2024, v. 10, n. 12, p. 799, doi. 10.3390/gels10120799

By:

He, Dongxin;
Zhang, Zhe;
Wang, Guangzhu;
Liu, Keming;
Wang, Haochen;
Xu, Zhe;
Teyssedre, Gilbert;
Zhang, Yuantao

Publication type:

Article

Design and Validation of a Bidirectional DC-DC Converter Control for Electric Vehicles Using FPGA-in-the-Loop Methodology.

Published in:

Journal Européen des Systèmes Automatisés, 2024, v. 57, n. 1, p. 77, doi. 10.18280/jesa.570108

By:

Martínez-Vera, Erik;
Bañuelos-Sánchez, Pedro;
Rosado-Muñoz, Alfredo

Publication type:

Article

Mediated Growth of Carbon Nitride Films via Spray‐Coated Seeding Layers for Photoelectrochemical Applications.

Published in:

Advanced Sustainable Systems, 2021, v. 5, n. 11, p. 1, doi. 10.1002/adsu.202100005

By:

Tashakory, Ayelet;
Karjule, Neeta;
Abisdris, Liel;
Volokh, Michael;
Shalom, Menny

Publication type:

Article

MIT Team Draws Roadmap for Artificial Leaf Efficiency.

Published in:

Solar Today, 2013, v. 27, n. 3, p. 10

By:

CHANDLER, DAVID

Publication type:

Article

Effect of pre-surface treatments on p-Cu2O/Au Schottky junctions.

Published in:

Journal of the National Science Foundation of Sri Lanka, 2021, v. 49, n. 1, p. 61, doi. 10.4038/jnsfsr.v49i1.8942

By:

Kafi, F. S. B.;
Jayathilaka, K. M. D. C.;
Wijesundera, R. P.;
Siripala, W.

Publication type:

Article

基于图像处理的扫描电子显微镜校准方法.

Published in:

Journal of Test & Measurement Technology, 2022, v. 36, n. 5, p. 410, doi. 10.3969/j.issn.1671-7449.2022.05.007

By:

张晓东;
赵琳;
李锁印;
韩志国;
许晓青;
吴爱华

Publication type:

Article

Overtaking Collisions of Electrostatic N-Soliton in Electron–Hole Quantum Plasmas.

Published in:

Plasma Physics Reports, 2020, v. 46, n. 1, p. 41, doi. 10.1134/S1063780X20010055

By:

El-Shamy, E. F.;
Mahmoud, M.

Publication type:

Article

UV Total Dose Nonvolatile Sensor Using Silicon-Oxide-Nitride-Oxide-Silicon Capacitor with Oxy-nitride as Charge-trapping Layer.

Published in:

Sensors & Materials, 2018, v. 30, n. 8, Part 2, p. 1831, doi. 10.18494/SAM.2018.1904

By:

Fuh-Cheng Jong;
Wen-Ching Hsieh;
Hao-Tien Daniel Lee;
Shich-Chuan Wu

Publication type:

Article