Works about SECONDARY ion mass spectrometry

Results: 1446

The Growth of Aligned Carbon Nanotubes on FeNiCo Catalyst Films.

Published in:

International Journal of Nanoscience, 2002, v. 1, n. 1, p. 79, doi. 10.1142/S0219581X02000036

By:

Ho, G. W.;
Wee, A. T. S.;
Lin, J.;
Liu, R.

Publication type:

Article

Gold Raspberry Shell Grown onto Nonspherical Lithium Niobate Nanoparticles for Second Harmonic Generation and Photothermal Applications.

Published in:

Particle & Particle Systems Characterization, 2022, v. 39, n. 11, p. 1, doi. 10.1002/ppsc.202200093

By:

Taitt, Rachael;
Urbain, Mathias;
Bredillet, Kévin;
Behel, Zacharie;
Ceccone, Giacomo;
Bañuls‐Ciscar, Jorge;
Beauquis, Sandrine;
Mugnier, Yannick;
Brevet, Pierre‐François;
Le Dantec, Ronan;
Chevolot, Yann;
Monnier, Virginie

Publication type:

Article

Quantitative imaging of magnesium distribution at single-cell resolution in brain tumors and infiltrating tumor cells with secondary ion mass spectrometry (SIMS).

Published in:

Journal of Neuro-Oncology, 2016, v. 127, n. 1, p. 33, doi. 10.1007/s11060-015-2022-8

By:

Chandra, Subhash;
Parker, Dylan;
Barth, Rolf;
Pannullo, Susan

Publication type:

Article

SIMS depth profiling of Mg back-diffusion in (AlGaIn)N light-emitting diodes.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 176, doi. 10.1007/s10854-007-9515-y

By:

Kirste, Lutz;
Köhler, Klaus;
Maier, Manfred;
Kunzer, Michael;
Maier, Markus;
Wagner, Joachim

Publication type:

Article

Investigation of NiO x -based contacts on p-GaN.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 855, doi. 10.1007/s10854-007-9520-1

By:

Liday, J.;
Hotový, I.;
Sitter, H.;
Vogrinčič, P.;
Vincze, A.;
Vávra, I.;
Šatka, A.;
Ecke, G.;
Bonanni, A.;
Breza, J.;
Simbrunner, C.;
Plochberger, B.

Publication type:

Article

Au agglomerates observed in the out-diffusion process of supersaturated high-temperature substitutional Au in Si.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 111, doi. 10.1007/s10854-007-9311-8

By:

Morooka, M.

Publication type:

Article

The effect of the dispersion of microfibrillated cellulose on the mechanical properties of melt-compounded polypropylene–polyethylene copolymer.

Published in:

Cellulose, 2019, v. 26, n. 18, p. 9645, doi. 10.1007/s10570-019-02756-8

By:

Palange, Caterina;
Johns, Marcus A.;
Scurr, David J.;
Phipps, Jonathan S.;
Eichhorn, Stephen J.

Publication type:

Article

Magnetic Sector SIMS Systems for FIB Platforms: New Developments, Applications, and Prospects.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.236

By:

Wirtz, T;
Castro, O De;
Hoang, H Q;
Biesemeier, A;
Eswara, S;
Audinot, J N

Publication type:

Article

Determining Electronic and Thermal Properties of β-Ga2O3 Based Devices Using In Situ STEM Combined with Spectroscopic Methods.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.068

By:

Chae, Christopher;
Zhu, Menglin;
Huang, Hsien-Lien;
Islam, Minhazul;
Hwang, Jinwoo

Publication type:

Article

Improvement of Boron Dopant Quantification Accuracy in Atom Probe Tomography via High Electric Field Analysis.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.036

By:

Guerguis, Bavley;
Cuduvally, Ramya;
Morris, Richard J H;
Arcuri, Gabriel;
Langelier, Brian;
Bassim, Nabil

Publication type:

Article

O2 vs. Ar Gas Cluster Ion Beam Sources for ToF-SIMS Depth Profiling of Thick Polymer and Metal Film Samples.

Published in:

2023

By:

Mahoney, Christine M;
Fahey, Albert J;
Adib, Kaveh;
Yongsunthon, Ruchi;
Zhang, Ming-Hui

Publication type:

Abstract

Hybrid SIMS: Secondary Ion Mass Spectrometry Imaging with High Mass Resolving Power.

Published in:

2023

By:

Kollmer, Felix;
Pirkl, Alexander;
Zakel, Julia;
Arlinghaus, Henrik;
Niehuis, Ewald

Publication type:

Abstract

Fundamentals and Applications of Secondary Ion Mass Spectrometry.

Published in:

2023

By:

Hunter Jr., Jerry L

Publication type:

Abstract

Depth Correction of 3D SIMS Images of Mammalian Cells with Secondary Ion Images Captures the Effects of Differential Sputtering.

Published in:

2023

By:

Kraft, Mary L;
Brunet, Melanie A;
Gorman, Brittney L

Publication type:

Abstract

Coordinated Microanalysis of Phosphates in High-Titanium Lunar Basalts.

Published in:

Microscopy & Microanalysis, 2019, p. 2078, doi. 10.1017/S1431927618010875

By:

Barnes, J. J.;
Thompson, M. S.;
McCubbin, F. M.;
Howe, J. Y.;
Rahman, Z.;
Messenger, S.;
Zega, T.

Publication type:

Article

Imaging Plant Using Time-of-Flight Secondary Ion Mass Spectrometry.

Published in:

Microscopy & Microanalysis, 2019, p. 1332, doi. 10.1017/S1431927618007146

By:

Yu, Xiao-Ying;
Komorek, Rachel;
Zhu, Zihua;
Jansson, Christer

Publication type:

Article

A High Multiple Hits Correction Factor for Atom Probe Tomography.

Published in:

2019

By:

Larson, D.J.;
Prosa, T.J.;
Oltman, E.;
Reinhard, D.A.;
Geiser, B.P.;
Ulfig, R.M.;
Merkulov, A.

Publication type:

Abstract

TOF-SIMS Analysis with High Lateral and High Mass Resolution in Parallel.

Published in:

2019

By:

Kollmer, Felix;
Havercroft, Nathan;
Henss, Anja;
Arlinghaus, Henrik;
Paul, Wolfgang;
Moellers, Rudolf;
Niehuis, Ewald

Publication type:

Abstract

Imaging the Endoplasmic Reticulum within Individual Mammalian Cells with Secondary Ion Mass Spectrometry.

Published in:

2019

By:

Kraft, Mary L.;
Chini, Corryn E.;
Fisher, Gregory L.;
Tamkun, Michael M.

Publication type:

Abstract

Surface Characterization of Biologically Related Systems with Imaging TOF-SIMS and Complementary Techniques.

Published in:

2019

By:

Gamble, Lara;
Angerer, Tina;
Graham, Daniel;
Chudler, Eric

Publication type:

Abstract

Secondary Ion Mass Spectrometry on the Helium Ion Microscope: methodologies for analysis of nanomaterials.

Published in:

2019

By:

Audinot, Jean-Nicolas;
Vollnhals, Florian;
Gratia, Paul;
Eswara, Santhana;
Philipp, Patrick;
Wirtz, Tom

Publication type:

Abstract

NanoFab with SIMS - Recent Results from the BAM-L200 Analytical Standard and Semiconductor Samples.

Published in:

2019

By:

Lewis, Brett;
Khanom, Fouzia;
Notte, John

Publication type:

Abstract

Characterization of the CIGS Solar Cell System in the FIB-SEM Laboratory.

Published in:

2019

By:

Perez-Willard, Fabian;
Braggin, Jennifer;
Friedlmeier, Theresa Magorian

Publication type:

Abstract

Time of Flight Backscatter and Secondary Ion Spectrometry in a Helium Ion Microscope.

Published in:

2019

By:

Klingner, Nico;
Hlawacek, Gregor;
Heller, Rene;
von Borany, Johannes;
Facsko, Stefan

Publication type:

Abstract

Measurement of Elemental Composition of FeNi and SiGe Thin Films by Electron Probe Microanalysis with Stratagem Software.

Published in:

2019

By:

Hodoroaba, Vasile-Dan;
Kim, Kyung Joong

Publication type:

Abstract

Quantification of Composition of Epitaxial Si/SiGe by EELS.

Published in:

Microscopy & Microanalysis, 2019, p. 472, doi. 10.1017/S1431927618002854

By:

Gribelyuk, Michael A.;
Zhao, Wayne;
Fu, Bianzhu

Publication type:

Article

Image Fusion in SIMS-based Correlative Microscopy: Methodology and Applications.

Published in:

Microscopy & Microanalysis, 2019, p. 404, doi. 10.1017/S1431927618002519

By:

Audinot, Jean-Nicolas;
Vollnhals, Florian;
Eswara, Santhana;
Wirtz, Tom

Publication type:

Article

Evaluating Compositional Variation in InGaAs Random Alloys Using Atom Probe Tomography.

Published in:

Microscopy & Microanalysis, 2019, p. 398, doi. 10.1017/S1431927618002489

By:

Kotulak, Nicole A.;
Twigg, Mark E.;
Mahadik, Nadeemullah A.;
Tomasulo, Stephanie;
Bonanno, P. L.;
Pereira, N. R.;
Knipling, Keith;
Yakes, Michael K.

Publication type:

Article

In Situ Correlative Microscopy Combining Transmission Electron Microscopy and Secondary Ion Mass Spectrometry.

Published in:

Microscopy & Microanalysis, 2019, p. 380, doi. 10.1017/S1431927618002398

By:

Eswara, Santhana;
Yedra, Lluis;
Pshenova, Alisa;
Sarbada, Varun;
Audinot, Jean-Nicolas;
Hull, Robert;
Wirtz, Tom

Publication type:

Article

In Situ Correlative Imaging and Spectroscopy of Boehmite Particles in Liquid.

Published in:

Microscopy & Microanalysis, 2019, p. 368, doi. 10.1017/S1431927618002337

By:

Yu, Xiao-Ying;
Yao, Juan;
Arey, Bruce;
Zhu, Zihua;
Chun, Jaehun

Publication type:

Article

Correlative Electron Microscopy and NanoSIMS Analysis for Lipid Studies.

Published in:

Microscopy & Microanalysis, 2019, p. 360, doi. 10.1017/S1431927618002295

By:

Jiang, Haibo;
He, Cuiwen;
Fong, Loren;
Young, Stephen

Publication type:

Article

Meso/Nano Correlative Imaging by Multiplex Protein Meso-Imaging with SIMS and Single Protein Nano-Imaging with HIM.

Published in:

Microscopy & Microanalysis, 2019, p. 356, doi. 10.1017/S1431927618002271

By:

Lim, Hee Jin;
Park, YoungHo;
Lee, SunYoung;
In, Suil;
Moon, DaeWon

Publication type:

Article

Quantification by SIMS at the nanoscale : NanoSIMS50 latest developments.

Published in:

2012

By:

Audinot, J.;
Valle, N.;
Migeon, H.

Publication type:

Abstract

Understanding Best Practices for Atom Probe Tomography Implant Analysis.

Published in:

2012

By:

Prosa, T.J.;
Larson, D.J.;
Olson, D.;
Lawrence, D.;
Henry, K.;
Steel, E.;
Anderson, I.

Publication type:

Abstract

Atom Probe Tomography for Surface and Near-Surface Applications.

Published in:

2012

By:

Kelly, T.F.;
Olson, D.P.;
Reinhard, D.;
Martin, I.;
Lawrence, D.;
Prosa, T.J.;
Larson, D.J.

Publication type:

Abstract

Novel Cluster Ion Beams For Secondary Ion Generation, Sputtering And FIB/SIMS Application.

Published in:

2012

By:

Kollmer, F.;
Rading, D.;
Moellers, R.;
Cramer, H.;
Paul, W.;
Niehuis, E.

Publication type:

Abstract

Uranium Microdistribution in Renal Cortex of Rats after Chronic Exposure: A Study by Secondary Ion Mass Spectrometry Microscopy.

Published in:

Microscopy & Microanalysis, 2012, v. 18, n. 1, p. 123, doi. 10.1017/S1431927611012384

By:

Tessier, Christine;
Suhard, David;
Rebière, François;
Souidi, Maâmar;
Dublineau, Isabelle;
Agarande, Michelle

Publication type:

Article

Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films.

Published in:

Microscopy & Microanalysis, 2011, v. 17, n. 5, p. 728, doi. 10.1017/S1431927611000523

By:

Abou-Ras, D.;
Caballero, R.;
Fischer, C.-H.;
Kaufmann, C.A.;
Lauermann, I.;
Mainz, R.;
Mönig, H.;
Schöpke, A.;
Stephan, C.;
Streeck, C.;
Schorr, S.;
Eicke, A.;
Döbeli, M.;
Gade, B.;
Hinrichs, J.;
Nunney, T.;
Dijkstra, H.;
Hoffmann, V.;
Klemm, D.;
Efimova, V.

Publication type:

Article

A Complete Characterization of Samples Using Multivariate Statistical Analysis of 3Dimensional MCs+ ToF-SIMS Data.

Published in:

2011

By:

Smentkowski, V;
Keenan, M

Publication type:

Abstract

Automated Classification of SIMS Images Using K-means Clustering.

Published in:

2011

By:

Konicek, A;
Lefman, J;
Szakal, C

Publication type:

Abstract

Dynamic SIMS Applications for Photovoltaic Technology Development.

Published in:

2010

By:

Davis, A. N.;
Peres, P.;
Merkulov, A.;
Desse, F.;
Choi, S.-Y.;
Schuhmacher, M.

Publication type:

Abstract

Chemical Imaging of the Cell Membrane by NanoSIMS.

Published in:

2010

By:

Weber, P. K.;
Kraft, M. L.;
Frisz, J. F.;
Carpenter, K. J.;
Hutcheon, I. D.

Publication type:

Abstract

Iterative Clustering and Classification Analysis of Secondary Ion Mass Spectrometry Images.

Published in:

2010

By:

Lefman, J.;
Szakal, C.

Publication type:

Abstract

SIMS Imaging and 3D Microanalysis of Organic Structures.

Published in:

2010

By:

Havercroft, N.;
Rading, D.;
Kollmer, F.;
Niehuis, E.

Publication type:

Abstract

Maximizing the Efficiency of Atomic and Molecular Imaging Using SIMS.

Published in:

2010

By:

Williams, Peter

Publication type:

Abstract

3D Cellular Imaging Using Time-of-Flight Secondary Ion Mass Spectrometry.

Published in:

2010

By:

Robinson, M.;
Brison, J.;
Castner, D. G.

Publication type:

Abstract

Determination of the Oxidation State of Irradiated Nuclear Fuel Using SIMS.

Published in:

2010

By:

Walker, C. T.;
Bremier, S.;
Belloni, F.;
Manara, D.;
Hasnoui, R.;
Ernstberger, M.

Publication type:

Abstract

Efficient Polymer Functionalization by Means of Extreme Ultraviolet.

Published in:

Helvetica Chimica Acta, 2025, v. 108, n. 5, p. 1, doi. 10.1002/hlca.202400100

By:

Qu, Di;
Wang, Minglei;
Bezinge, Léonard;
Hensky, Celine;
Longo, Filippo;
Masucci, Claudia;
Suloska, Mirushe;
Wang, Jing;
Bleiner, Davide

Publication type:

Article

Applications and impacts of stable isotope probing for analysis of microbial interactions.

Published in:

Applied Microbiology & Biotechnology, 2014, v. 98, n. 11, p. 4817, doi. 10.1007/s00253-014-5705-8

By:

Abraham, Wolf-Rainer

Publication type:

Article

An appraisal of methods for linking environmental processes to specific microbial taxa.

Published in:

Reviews in Environmental Science & Biotechnology, 2010, v. 9, n. 2, p. 153, doi. 10.1007/s11157-010-9205-8

By:

Gutierrez-Zamora, Maria-Luisa;
Manefield, Mike

Publication type:

Article