Works about SECONDARY electron emission

Results: 238

Secondary electron emission from nanocomposite carbon films.

Published in:

Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 10, p. 996, doi. 10.1007/s10854-008-9822-y

By:

González-Berríos, Adolfo;
Makarov, Vladimir I.;
Goenaga-Vázquez, Yamila;
Morell, Gerardo;
Weiner, Brad R.

Publication type:

Article

PFIB and STEM EBIC: A Potent Combination for Operando TEM of Electronic Devices.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.785

By:

Hubbard, William A;
Regan, B C

Publication type:

Article

Chasing Down Leads: Imaging Conductivity Networks in a FinFET Processor.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.072

By:

Hubbard, William A;
Bonifacio, C S;
Li, R;
Ray, M L;
Regan, B C;
Fischione, P

Publication type:

Article

From Imaging Conductivity to Imaging Electron Density.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.065

By:

Dyck, Ondrej;
Almutlaq, Jawaher;
Lingerfelt, David;
Swett, Jacob L;
Huang, Bevin;
Lupini, Andrew R;
Englund, Dirk;
Jesse, Stephen

Publication type:

Article

Getting Structural and Compositional Insights into Biological and Beam Sensitive Samples Using Three Complementary Detection Modalities on a Cryo-FIB Instrument.

Published in:

2023

By:

De Castro, Olivier;
Taubitz, Tatjana;
Biesemeier, A;
Wirtz, T

Publication type:

Abstract

Secondary Electron Contrast in STEM Electron Beam-Induced Current (EBIC): a Path Towards Mapping Electronic Structure.

Published in:

Microscopy & Microanalysis, 2019, p. 1846, doi. 10.1017/S1431927618009716

By:

Hubbard, William A.;
Mecklenburg, Matthew;
Chan, Ho Leung;
Regan, B. C.

Publication type:

Article

Helium-Ion Microscopy Of Carbon Nanomembranes.

Published in:

2012

By:

Beyer, A.;
Gölzhäuser, A.

Publication type:

Abstract

Role of surface excitations on secondary electron emission from metals.

Published in:

2012

By:

Salvat-Pujol, F.;
Werner, W.;
Salvat, F.

Publication type:

Abstract

Highly Reproducible Secondary Electron Imaging under Electron Irradiation Using High-Pass Energy Filtering in Low-Voltage Scanning Electron Microscopy.

Published in:

Microscopy & Microanalysis, 2012, v. 18, n. 2, p. 385, doi. 10.1017/S1431927611012852

By:

Tsurumi, Daisuke;
Hamada, Kotaro;
Kawasaki, Yuji

Publication type:

Article

Possibility of Scanning Electron Microscope Observation and Energy Dispersive X-Ray Analysis in Microscale Region of Insulating Samples Using Diluted Ionic Liquid.

Published in:

Microscopy & Microanalysis, 2012, v. 18, n. 2, p. 365, doi. 10.1017/S1431927611012669

By:

Imashuku, Susumu;
Kawakami, Tetsuo;
Ze, Long;
Kawai, Jun

Publication type:

Article

Is Microanalysis Possible in the Helium Ion Microscope?

Published in:

Microscopy & Microanalysis, 2011, v. 17, n. 4, p. 643, doi. 10.1017/S1431927611000596

By:

Joy, David C.;
Griffin, Brendan J.

Publication type:

Article

Angular Dependence of the Ion-Induced Secondary Electron Emission for He+ and Ga+ Beams.

Published in:

Microscopy & Microanalysis, 2011, v. 17, n. 4, p. 624, doi. 10.1017/S1431927611000225

By:

Castaldo, Vincenzo;
Withagen, Josephus;
Hagen, Cornelius;
Kruit, Pieter;
van Veldhoven, Emile

Publication type:

Article

X-ray Microanalysis Artifacts Visualized.

Published in:

2011

By:

Dusevich, V;
Melander, J;
Eick, J

Publication type:

Abstract

Development of Environmental Specimen Holder for Hitachi S-5500 UHR SEM Microscope.

Published in:

2011

By:

Dogel, S;
Hoyle, D;
Malac, M;
Salomons, M;
Mitsuhiro, N;
Wolkow, R

Publication type:

Abstract

A photo-thermally stimulated exoemission technique used to study the properties of HTSC ceramics based on YBa2Cu3O7-d.

Published in:

Russian Journal of Nondestructive Testing, 2004, v. 40, n. 12, p. 830, doi. 10.1007/s11181-005-0114-9

By:

Syurdo, A.;
Kortov, V.;
Mil’man, I.;
Slesarev, A.;
Mikhailovich, A.

Publication type:

Article

Experimental Studies of Microwave Tubes with Components of Electron–Optical and Electrodynamic Systems Implemented Using Novel 3D Additive Technology.

Published in:

Instruments (2410-390X), 2022, v. 6, n. 4, p. 81, doi. 10.3390/instruments6040081

By:

Proyavin, Mikhail D.;
Morozkin, Mikhail V.;
Ginzburg, Naum S.;
Denisenko, Andrej N.;
Kamenskiy, Maxim V.;
Kotomina, Valentina E.;
Manuilov, Vladimir N.;
Orlovskiy, Alexey A.;
Osharin, Ivan V.;
Peskov, Nikolay Y.;
Savilov, Andrei V.;
Zaslavsky, Vladislav Y.

Publication type:

Article

Secondary Emission Calorimetry.

Published in:

Instruments (2410-390X), 2022, v. 6, n. 4, p. 48, doi. 10.3390/instruments6040048

By:

Bilki, Burak;
Dilsiz, Kamuran;
Ogul, Hasan;
Onel, Yasar;
Southwick, David;
Tiras, Emrah;
Wetzel, James;
Winn, David Roberts

Publication type:

Article

Development of Novel Designs of Resistive Plate Chambers.

Published in:

Instruments (2410-390X), 2022, v. 6, n. 3, p. N.PAG, doi. 10.3390/instruments6030035

By:

Bilki, Burak;
Onel, Yasar;
Repond, Jose;
Sahbaz, Kutlu Kagan;
Tosun, Mehmet;
Xia, Lei

Publication type:

Article

Study of the Charging of Dust Grains in Space Plasma.

Published in:

Plasma Physics Reports, 2022, v. 48, n. 11, p. 1203, doi. 10.1134/S1063780X22600888

By:

Masheyeva, R. U.;
Dzhumagulova, K. N.;
Myrzaly, M.

Publication type:

Article

Simulations of a surface glow discharge in a supersonic gas flow in the presence of external ionization.

Published in:

Plasma Physics Reports, 2011, v. 37, n. 9, p. 755, doi. 10.1134/S1063780X11070014

By:

Aleksandrov, A.

Publication type:

Article

Role of secondary electrons and metastable atoms in the electron-beam activation of argon-silane mixtures.

Published in:

Plasma Physics Reports, 2008, v. 34, n. 1, p. 60, doi. 10.1134/S1063780X08010078

By:

Sukhinin, G.;
Fedoseev, A.;
Khmel’, S.

Publication type:

Article

Structure of Steady-State Debye Layers in a Low-Density Plasma near a Dielectric Surface.

Published in:

Plasma Physics Reports, 2004, v. 30, n. 4, p. 299, doi. 10.1134/1.1707151

By:

Morozov, A. I.;
Savel’ev, V. V.

Publication type:

Article

Low-Current Moderate-Pressure RF Discharge with Secondary Electron Photoemission.

Published in:

Plasma Physics Reports, 2002, v. 28, n. 1, p. 71, doi. 10.1134/1.1434298

By:

Baranov, I. Ya.

Publication type:

Article

Study of the Effect of Magnetic Fields on the Secondary Electron Model.

Published in:

Electronics (2079-9292), 2025, v. 14, n. 12, p. 2446, doi. 10.3390/electronics14122446

By:

Deng, Chenhui;
Huang, Jingyu;
Zheng, Libing;
Han, Li;
Niu, Geng;
Wang, Pengfei

Publication type:

Article

Contribution from recoiling atoms in secondary electron emission induced by slow highly charged ions from tungsten surface.

Published in:

Laser & Particle Beams, 2012, v. 30, n. 4, p. 707, doi. 10.1017/S026303461200064X

By:

Zeng, Lixia;
Xu, Zhongfeng;
Zhao, Yongtao;
Wang, Yuyu;
Wang, Jianguo;
Cheng, Rui;
Zhang, Xiaoan;
Ren, Jieru;
Zhou, Xianming;
Wang, Xing;
Lei, Yu;
Li, Yongfeng;
Yu, Yang;
Liu, Xueliang;
Xiao, Guoqing;
Li, Fuli

Publication type:

Article

Reduced multi-scale kinetic models for the relativistic electron transport in solid targets: Effects related to secondary electrons.

Published in:

Laser & Particle Beams, 2010, v. 28, n. 1, p. 165, doi. 10.1017/S0263034610000042

By:

Duclous, R.;
Morreeuw, J.-P.;
Tikhonchuk, V. T.;
Dubroca, B.

Publication type:

Article

Features of Ion-Electronic Emission from Surface of Semiconductors.

Published in:

Journal of Nano- & Electronic Physics, 2013, v. 5, n. 4, p. 04036-1

By:

Kurochka, A.;
Sergienko, A.;
Kurochka, S.;
Kolybelkin, V.;
Emelyanov, S. G.;
Yakushko, E. V.;
Chervjakov, L. M.

Publication type:

Article

An adaptive cracking particle method providing explicit and accurate description of 3D crack surfaces.

Published in:

International Journal for Numerical Methods in Engineering, 2018, v. 114, n. 12, p. 1291, doi. 10.1002/nme.5786

By:

Ai, Weilong;
Augarde, Charles E.

Publication type:

Article

Formulae for maximum yield and mean escape depth of secondary electrons emitted from metals.

Published in:

Modern Physics Letters B, 2017, v. 31, n. 26, p. -1, doi. 10.1142/S0217984917502396

By:

Xie, Ai-Gen;
Xia, Yu-Qing;
Wang, Xing;
Liu, Hao-Yu;
Cheng, Shi

Publication type:

Article

Formulae for low-energy secondary electron yield from different kinds of emitters as a function of measurable variables.

Published in:

Modern Physics Letters B, 2017, v. 31, n. 10, p. -1, doi. 10.1142/S0217984917501056

By:

Xie, Ai-Gen;
Zhon, Kun;
Zhao, De-Lin;
Xia, Yu-Qing

Publication type:

Article

Dynamic secondary electron emission characteristics of polymers in negative charging process.

Published in:

Modern Physics Letters B, 2016, v. 30, n. 11, p. -1, doi. 10.1142/S0217984916501682

By:

Weng, Ming;
Hu, Tian-Cun;
Zhang, Na;
Cao, Meng

Publication type:

Article

Two contributions to the ratio of the mean secondary electron generation of backscattered electrons to primary electrons at high electron energy.

Published in:

Modern Physics Letters B, 2014, v. 28, n. 6, p. 1, doi. 10.1142/S0217984914500468

By:

Ai-Gen Xie;
Chen-Yi Zhang;
Kun Zhong

Publication type:

Article

Two contributions to the ratio of the mean secondary electron generation of backscattered electrons to primary electrons at high electron energy.

Published in:

Modern Physics Letters B, 2014, v. 28, n. 6, p. 1, doi. 10.1142/S0217984914500468

By:

Ai-Gen Xie;
Chen-Yi Zhang;
Kun Zhong

Publication type:

Article

Ti-doped MgO thin film by magnetron sputtering for cesium frequency standard.

Published in:

International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2019, v. 33, n. 19, p. N.PAG, doi. 10.1142/S0217979219502023

By:

Cui, Naiyuan;
Wang, Fei;
Guo, Lei

Publication type:

Article

ThSi10O22 Compound as Target for Production of Isomeric Thorium-229 Nuclei at Electron Beam Irradiation.

Published in:

Physics of Atomic Nuclei, 2020, v. 83, n. 9, p. 1313, doi. 10.1134/S1063778820090021

By:

Borisyuk, P. V.;
Chubunova, E. V.;
Lebedinskii, Y. Y.;
Vasilyev, O. S.;
Yakovlev, V. P.

Publication type:

Article

Self-Oscillating Mode of a Probe with Increased Secondary Emission for Nonequilibrium Plasma Diagnostics.

Published in:

Physics of Atomic Nuclei, 2019, v. 82, n. 10, p. 1368, doi. 10.1134/S1063778819100181

By:

Vizgalov, I. V.;
Gutorov, K. M.;
Kurnaev, V. A.;
Sorokin, I. A.

Publication type:

Article

Primary and secondary sources of formaldehyde in urban atmospheres: Houston Texas region.

Published in:

Atmospheric Chemistry & Physics, 2012, v. 12, n. 7, p. 3273, doi. 10.5194/acp-12-3273-2012

By:

Parrish, D. D.;
Ryerson, T. B.;
Mellqvist, J.;
Johansson, J.;
Fried, A.;
Richter, D.;
Walega, J. G.;
Washenfelder, R. A.;
de Gouw, J. A.;
Peischl, J.;
Aikin, K. C.;
McKeen, S. A.;
Frost, G. J.;
Fehsenfeld, F. C.;
Herndon, S. C.;
Hofzumahaus, A.

Publication type:

Article

FIB/SEM tomography with TEM-like resolution for 3D imaging of high-pressure frozen cells.

Published in:

Histochemistry & Cell Biology, 2012, v. 138, n. 4, p. 549, doi. 10.1007/s00418-012-1020-6

By:

Villinger, Clarissa;
Gregorius, Heiko;
Kranz, Christine;
Höhn, Katharina;
Münzberg, Christin;
Wichert, Götz;
Mizaikoff, Boris;
Wanner, Gerhard;
Walther, Paul

Publication type:

Article

Electron holography study of electric field variations.

Published in:

Journal of Electron Microscopy, 2011, v. 60, n. suppl_1, p. S225

By:

Shindo, Daisuke;
Murakami, Yasukazu

Publication type:

Article

Energy-filtered imaging in a scanning electron microscope for dopant contrast in InP.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S183, doi. 10.1093/jmicro/dfq046

By:

Tsurumi, Daisuke;
Hamada, Kotaro;
Kawasaki, Yuji

Publication type:

Article

Modelling and observations of electron beam charging of an insulator/metal bilayer and its impact on secondary electron images in defect inspection equipment.

Published in:

Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S189, doi. 10.1093/jmicro/dfq047

By:

Ohya, Kaoru;
Inai, Kensuke;
Kawasaki, Ryosuke;
Saito, Misako;
Hayashi, Teruyuki;
Jau, Jack;
Kanai, Kenichi

Publication type:

Article

Comment on Electron holography on dynamic motion of secondary electrons around sciatic nerve tissues.

Published in:

Journal of Electron Microscopy, 2008, v. 57, n. 5, p. 165, doi. 10.1093/jmicro/dfn015

By:

Marco Beleggia;
Giulio Pozzi

Publication type:

Article

Theoretical Analysis and Experimental Verification of Polytetrafluoroethylene Surface Flashover from Electrostatic Electromagnetic Pulse Field.

Published in:

Sensors & Materials, 2022, v. 34, n. 6, Part 4, p. 2325, doi. 10.18494/SAM3724

By:

Yan Zhang;
Xin Zhao;
Hsiung-Cheng Lin;
Xianghu Ge;
Lu Zhang

Publication type:

Article

Total secondary emission effect on the complex plasma sheath with superextensive electrons.

Published in:: Journal of Plasma Physics, 2024, v. 90, n. 5, p. 1, doi. 10.1017/S0022377824001193
Publication type:: Article

Stability of different plasma sheaths near a dielectric wall with secondary electron emission.

Published in:

Journal of Plasma Physics, 2019, v. 85, n. 6, p. 1, doi. 10.1017/S0022377819000862

By:

Qing, Shaowei;
Wei, Jianguo;
Chen, Wen;
Tang, Shengli;
Wang, Xiaogang

Publication type:

Article

Modelling the Impact of Graphene Coating of Different Thicknesses on Polyimide Substrate on the Secondary Electron Yield.

Published in:

Coatings (2079-6412), 2024, v. 14, n. 1, p. 13, doi. 10.3390/coatings14010013

By:

Qi, Xin;
Ma, Yanzhao;
Liu, Sisheng;
Nie, Xiangyu;
Zhang, Tao;
Wu, Yong;
Peng, Weiping;
Hu, Guoming

Publication type:

Article

Suppression of Secondary Electron Emissions on the Graphene-Coated Polyimide Materials Prepared by Chemical Vapor Deposition.

Published in:

Coatings (2079-6412), 2023, v. 13, n. 10, p. 1805, doi. 10.3390/coatings13101805

By:

Qi, Xin;
Ma, Yanzhao;
Liu, Sisheng;
Nie, Xiangyu;
Zhang, Tao;
Wu, Yong;
Peng, Weiping;
Hu, Guoming

Publication type:

Article

Gas Desorption and Secondary Electron Emission from Graphene Coated Copper Due to E-Beam Stimulation.

Published in:

Coatings (2079-6412), 2023, v. 13, n. 2, p. 370, doi. 10.3390/coatings13020370

By:

Feng, Guobao;
Song, Huiling;
Li, Yun;
Li, Xiaojun;
Xie, Guibai;
Zhuang, Jian;
Liu, Lu

Publication type:

Article

Mixed Films Based on MgO for Secondary Electron Emission Application: General Trends and MOCVD Prospects.

Published in:

Coatings (2079-6412), 2021, v. 11, n. 2, p. 176, doi. 10.3390/coatings11020176

By:

Vasilyeva, Inga G.;
Vikulova, Evgeniia S.;
Pochtar, Alena A.;
Morozova, Natalya B.;
Patelli, Alessandro

Publication type:

Article

Comparison of Carbon Thin Films with Low Secondary Electron Yield Deposited in Neon and Argon.

Published in:

Coatings (2079-6412), 2020, v. 10, n. 9, p. 884, doi. 10.3390/coatings10090884

By:

Zhang, Yuxin;
Wang, Yigang;
Wang, Sihui;
Wei, Wei;
Ge, Xiaoqin;
Zhu, Bangle;
Shao, Jieqiong;
Wang, Yong

Publication type:

Article