Works matching DE "SAPPHIRES"
1
- International Journal of Nanoscience, 2004, v. 3, n. 4/5, p. 655, doi. 10.1142/S0219581X04002498
- Li, K.;
- Feng, Z. C.;
- Yang, C.-C.;
- Lin, J.
- Article
2
- Annalen der Physik, 2024, v. 536, n. 8, p. 1, doi. 10.1002/andp.202300543
- Wang, Xueqian;
- Liu, Chuanbao;
- Qiao, Lijie;
- Zhou, Ji;
- Bai, Yang;
- Sun, Jingbo
- Article
3
- Annalen der Physik, 2019, v. 531, n. 10, p. N.PAG, doi. 10.1002/andp.201900188
- Wan, Chenghao;
- Zhang, Zhen;
- Woolf, David;
- Hessel, Colin M.;
- Rensberg, Jura;
- Hensley, Joel M.;
- Xiao, Yuzhe;
- Shahsafi, Alireza;
- Salman, Jad;
- Richter, Steffen;
- Sun, Yifei;
- Qazilbash, M. Mumtaz;
- Schmidt‐Grund, Rüdiger;
- Ronning, Carsten;
- Ramanathan, Shriram;
- Kats, Mikhail A.
- Article
5
- Advanced Functional Materials, 2015, v. 25, n. 34, p. 5492, doi. 10.1002/adfm.201502010
- Liu, Yanpeng;
- Kenry;
- Guo, Yufeng;
- Sonam, Surabhi;
- Hong, Seul Ki;
- Nai, Mui Hoon;
- Nai, Chang Tai;
- Gao, Libo;
- Chen, Jianyi;
- Cho, Byung Jin;
- Lim, Chwee Teck;
- Guo, Wanlin;
- Loh, Kian Ping
- Article
6
- Journal of Thermal Analysis & Calorimetry, 2006, v. 85, n. 2, p. 505, doi. 10.1007/s10973-006-7745-5
- Marti, E.;
- Kaisersberger, E.;
- Moukhina, E.
- Article
7
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 176, doi. 10.1007/s10854-007-9515-y
- Kirste, Lutz;
- Köhler, Klaus;
- Maier, Manfred;
- Kunzer, Michael;
- Maier, Markus;
- Wagner, Joachim
- Article
8
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 208, doi. 10.1007/s10854-008-9648-7
- Oliver, R. A.;
- Kappers, M. J.;
- McAleese, C.;
- Datta, R.;
- Sumner, J.;
- Humphreys, C. J.
- Article
9
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 215, doi. 10.1007/s10854-008-9682-5
- Xiaohong Chen;
- Shuping Li;
- Junyong Kang
- Article
10
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 46, doi. 10.1007/s10854-008-9638-9
- Wernicke, Tim;
- Zeimer, Ute;
- Herms, Martin;
- Weyers, Markus;
- Kneissl, Michael;
- Irmer, Gert
- Article
11
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 744, doi. 10.1007/s10854-007-9401-7
- Ahn, C. H.;
- Kim, Y. Y.;
- Kang, S. W.;
- Kong, B. H.;
- Mohanta, S. K.;
- Cho, H. K.;
- Kim, J. H.;
- Lee, H. S.
- Article
12
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 764, doi. 10.1007/s10854-007-9405-3
- Nikishin, Sergey;
- Borisov, Boris;
- Kuryatkov, Vladimir;
- Holtz, Mark;
- Garrett, Gregory A.;
- Sarney, Wendy L.;
- Sampath, Anand V.;
- Hongen Shen;
- Wraback, Michael;
- Usikov, Alexander;
- Dmitriev, Vladimir
- Article
13
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 143, doi. 10.1007/s10854-007-9307-4
- Lankinen, A.;
- Lang, T.;
- Suihkonen, S.;
- Svensk, O.;
- Säynätjoki, A.;
- Tuomi, T. O.;
- McNally, P. J.;
- Odnoblyudov, M.;
- Bougrov, V.;
- Danilewsky, A. N.;
- Bergman, P.;
- Simon, R.
- Article
14
- Journal of Materials Science Letters, 2003, v. 22, n. 2, p. 113, doi. 10.1023/A:1021806702155
- Murray, R.T.;
- Parbrook, P.J.;
- Wood, D.A.
- Article
15
- Microscopy & Microanalysis, 2019, p. 1716, doi. 10.1017/S1431927618009066
- Wu, Yaqiao;
- Callahan, Janet
- Article
16
- 2012
- Kim, H.S.;
- Oh, S.H.;
- Song, K.;
- Yang, J.M.;
- Song, S.A.
- Abstract
17
- Russian Journal of Nondestructive Testing, 2010, v. 46, n. 12, p. 911, doi. 10.1134/S1061830910120077
- Article
18
- Russian Journal of Nondestructive Testing, 2010, v. 46, n. 8, p. 603, doi. 10.1134/S1061830910080097
- Article
19
- Journal of Jilin University (Science Edition) / Jilin Daxue Xuebao (Lixue Ban), 2022, v. 60, n. 6, p. 1446, doi. 10.13413/j.cnki.jdxblxb.2021455
- Article
20
- Annals of the University of Craiova, Physics, 2019, v. 29, p. 45
- ABDELHAMID, JALIL;
- HAMID, AMSIL;
- ABDELOUAHED, CHETAINE;
- OUADIE, KABACH;
- ABDELMAJID, SAIDI
- Article
21
- Transactions of Nanjing University of Aeronautics & Astronautics, 2020, v. 37, n. 3, p. 360, doi. 10.16356/j.1005-1120.2020.03.002
- WU Zhe;
- ZHU Yanfei;
- CHEN Junpeng;
- ZHU Zichao;
- LIU Zhifeng;
- YUAN Julong;
- YAO Weifeng
- Article
22
- Metallophysics & Advanced Technologies / Metallofizika i Novejsie Tehnologii, 2020, v. 42, n. 8, p. 1093, doi. 10.15407/mfint.42.08.1093
- Габ, І. І.;
- Стецюк, Т. В.;
- Костюк, Б. Д.
- Article
23
- Metallophysics & Advanced Technologies / Metallofizika i Novejsie Tehnologii, 2019, v. 41, n. 12, p. 1587, doi. 10.15407/mfint.41.12.1587
- Dmitruk, I. M.;
- Berezovska, N. I.;
- Yeshchenko, O. A.;
- Stanovyi, O. P.;
- Dmytruk, A. M.;
- Blonskyi, I. V.
- Article
24
- Chinese Journal of High Pressure Physics, 2024, v. 38, n. 6, p. 1, doi. 10.11858/gywlxb.20240749
- Article
25
- Ferroelectrics, 2009, v. 381, n. 1, p. 74, doi. 10.1080/00150190902869681
- NISHIDA, TAKASHI;
- KUBO, KOICHI;
- TAKEDA, HIROAKI;
- UCHIYAMA, KIYOSHI;
- SHIOSAKI, TADASHI
- Article
26
- Ferroelectrics, 2009, v. 381, n. 1, p. 92, doi. 10.1080/00150190902869715
- WEN-CHING SHIH;
- XIAO-YUN SUN;
- TZYY-LONG WANG;
- MU-SHIANG WU
- Article
27
- Ferroelectrics, 2008, v. 362, n. 1, p. 137, doi. 10.1080/00150190802007143
- Moussavou, A.-G.;
- Députier, S.;
- Bouquet, V.;
- Guilloux-Viry, M.;
- Perrin, A.;
- Sauleau, R.;
- Mahdjoubi, K.
- Article
28
- Ferroelectrics, 2007, v. 360, n. 1, p. 31, doi. 10.1080/00150190701515956
- Khodorov, A.;
- Gomes, M. J. M.
- Article
29
- Ferroelectrics, 2003, v. 293, n. 1, p. 189, doi. 10.1080/00150190390238397
- Verardi, P.;
- Craciun, F.;
- Scarisoreanu, N.;
- Dinescu, M.;
- Grigoriu, C.;
- Galassi, C.;
- Costa, A. L.
- Article
30
- Plasma Physics Reports, 2013, v. 39, n. 13, p. 1074, doi. 10.1134/S1063780X13070106
- Apeksimov, D.;
- Bukin, O.;
- Bykova, E.;
- Geints, Yu.;
- Golik, S.;
- Zemlyanov, A.;
- Il'in, A.;
- Kabanov, A.;
- Matvienko, G.;
- Oshlakov, V.;
- Petrov, A.;
- Sokolova, E.
- Article
31
- Sensors & Materials, 2019, v. 31, n. 9, Part 1, p. 2681, doi. 10.18494/SAM.2019.2369
- Chun-Wei Liu;
- Hong-Chang Chen;
- Shih-Chieh Lin
- Article
32
- Sensors & Materials, 2017, v. 29, n. 4, p. 363, doi. 10.18494/SAM.2017.1517
- Kuan-Ting Liu;
- Shoou-Jinn Chang;
- Sean Wu
- Article
33
- Lubricants (2075-4442), 2022, v. 10, n. 12, p. 324, doi. 10.3390/lubricants10120324
- Zhao, Liang;
- Feng, Kaiping;
- Zhao, Tianchen;
- Zhou, Zhaozhong;
- Ding, Junkai
- Article
34
- Lubricants (2075-4442), 2019, v. 7, n. 9, p. 79, doi. 10.3390/lubricants7090079
- Ayerdi, Jon Joseba;
- Slachciak, Nadine;
- Llavori, Iñigo;
- Zabala, Alaitz;
- Aginagalde, Andrea;
- Bonse, Jörn;
- Spaltmann, Dirk
- Article
35
- Electronics (2079-9292), 2024, v. 13, n. 10, p. 1840, doi. 10.3390/electronics13101840
- Paszkiewicz, Bartłomiej K.;
- Paszkiewicz, Bogdan;
- Dziedzic, Andrzej
- Article
36
- Electronics (2079-9292), 2023, v. 12, n. 4, p. 1049, doi. 10.3390/electronics12041049
- Pharkphoumy, Sakhone;
- Janardhanam, Vallivedu;
- Jang, Tae-Hoon;
- Shim, Kyu-Hwan;
- Choi, Chel-Jong
- Article
37
- Electronics (2079-9292), 2022, v. 11, n. 8, p. 1279, doi. 10.3390/electronics11081279
- Zhang, Yichi;
- Zeng, Xu;
- Bai, Ming;
- Jin, Ming;
- Hao, Wenteng;
- Gao, Dongshuo;
- Liu, Qiao;
- Feng, Jinjun
- Article
38
- Electronics (2079-9292), 2021, v. 10, n. 10, p. 1182, doi. 10.3390/electronics10101182
- Hatui, Nirupam;
- Krishna, Athith;
- Pasayat, Shubhra S.;
- Keller, Stacia;
- Mishra, Umesh K.;
- Tang, Ning;
- Shen, Bo;
- Sang, Liwen;
- Ju, Guangxu
- Article
39
- Electronics (2079-9292), 2021, v. 10, n. 4, p. 370, doi. 10.3390/electronics10040370
- Jean Claude, Asseko Ondo;
- Eloi Jean Jacques, Blampain;
- Gaston, N'tchayi Mbourou;
- Adoum, Traore Ndama;
- Elysée, Obame Ndong;
- Omar, Elmazria;
- Marinova, Iliana
- Article
40
- Environmental Technology, 2011, v. 32, n. 15, p. 1799, doi. 10.1080/09593330.2011.556670
- Kuo, Yu-Lin;
- Su, Te-Li;
- Chuang, Kai-Jen;
- Chen, Hua-Wei;
- Kung, Fu-Chen
- Article
41
- Laser & Particle Beams, 2013, v. 31, n. 1, p. 29, doi. 10.1017/S0263034612000924
- Trtica, M.;
- Batani, D.;
- Redaelli, R.;
- Limpouch, J.;
- Kmetik, V.;
- Ciganovic, J.;
- Stasic, J.;
- Gakovic, B.;
- Momcilovic, M.
- Article
42
- Zeitschrift für Kristallographie. Crystalline Materials, 2021, v. 236, n. 11/12, p. 325, doi. 10.1515/zkri-2021-2051
- Finger, Raphael;
- Hansen, Thomas C.;
- Kohlmann, Holger
- Article
43
- Scientific Reports, 2025, v. 15, n. 1, p. 1, doi. 10.1038/s41598-025-88056-7
- Sobih, Naiem Souilam;
- El Nagar, Ahmed Ahmed;
- Abbas, Ali Elsayed;
- Shehab, Samir
- Article
44
- Scientific Reports, 2025, v. 15, n. 1, p. 1, doi. 10.1038/s41598-025-86834-x
- Wei, Chengming;
- Liu, Jiabao;
- Lan, Xinru;
- Yang, Cheng;
- Huang, Shuiping;
- Meng, Dongdong;
- Chen, Zhengwei;
- Duan, Hongguang;
- Wang, Xu
- Article
45
- Scientific Reports, 2015, p. 7747, doi. 10.1038/srep07747
- Seo, Tae Hoon;
- Hahn, Yoon-Bong;
- Kim, Yong Hwan;
- Park, Sungchan;
- Kim, Myung Jong;
- Park, Ah Hyun;
- Lee, Gun Hee;
- Suh, Eun-Kyung;
- Jeong, Mun Seok;
- Lee, Young Hee
- Article
46
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep05426
- Aiping Chen;
- Weigand, Marcus;
- Zhenxing Bi;
- Wenrui Zhang;
- Xuejie Lü;
- Dowden, Paul;
- MacManus-Driscoll, Judith L.;
- Haiyan Wang;
- Quanxi Jia
- Article
47
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep04790
- Motonobu Tomoda;
- Dehoux, Thomas;
- Yohei Iwasaki;
- Osamu Matsuda;
- Gusev, Vitalyi E.;
- Wright, Oliver B.
- Article
48
- Scientific Reports, 2013, p. 1, doi. 10.1038/srep03201
- Jonghak Kim;
- Heeje Woo;
- Kisu Joo;
- Sungwon Tae;
- Jinsub Park;
- Daeyoung Moon;
- Sung Hyun Park;
- Junghwan Jang;
- Yigil Cho;
- Jucheol Park;
- Hwankuk Yuh;
- Gun-Do Lee;
- In-Suk Choi;
- Yasushi Nanishi;
- Heung Nam Han;
- Kookheon Char;
- Euijoon Yoon
- Article
49
- Journal of Nano- & Electronic Physics, 2013, v. 5, n. 2, p. 02003-1
- Kumar, Sudheer;
- Goud, B. Srinivas;
- Singh, R.
- Article
50
- Journal of Nano- & Electronic Physics, 2013, v. 5, n. 2, p. 02001-1
- Kumar, Ashutosh;
- Latzel, Michael;
- Tessarek, C.;
- Christiansen, S.;
- Singh, R.
- Article