Works about MICROELECTRONICS


Results: 2071
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    Light emission in silicon nanostructures.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 235, doi. 10.1007/s10854-007-9552-6
    By:
    • Lockwood, David J.
    Publication type:
    Article
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    Gettering of iron in silicon by boron implantation.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 41, doi. 10.1007/s10854-008-9640-2
    By:
    • Haarahiltunen, A.;
    • Talvitie, H.;
    • Savin, H.;
    • Anttila, O.;
    • Yli-Koski, M.;
    • Asghar, M.;
    • Sinkkonen, J.
    Publication type:
    Article
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    Characterization of strained Si wafers by X-ray diffraction techniques.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 189, doi. 10.1007/s10854-008-9641-1
    By:
    • Shimura, Takayoshi;
    • Kawamura, Kohta;
    • Asakawa, Masahiro;
    • Watanabe, Heiji;
    • Yasutake, Kiyoshi;
    • Ogura, Atsushi;
    • Fukuda, Kazunori;
    • Sakata, Osami;
    • Kimura, Shigeru;
    • Edo, Hiroki;
    • Iida, Satoshi;
    • Umeno, Masataka
    Publication type:
    Article
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    Size effects in small scaled lead-free solder joints.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 383, doi. 10.1007/s10854-007-9349-7
    By:
    • Zimprich, P.;
    • Betzwar-Kotas, A.;
    • Khatibi, G.;
    • Weiss, B.;
    • Ipser, H.
    Publication type:
    Article
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