Works about MICROELECTRONICS


Results: 2065
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    Light emission in silicon nanostructures.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 235, doi. 10.1007/s10854-007-9552-6
    By:
    • Lockwood, David J.
    Publication type:
    Article
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    Gettering of iron in silicon by boron implantation.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 41, doi. 10.1007/s10854-008-9640-2
    By:
    • Haarahiltunen, A.;
    • Talvitie, H.;
    • Savin, H.;
    • Anttila, O.;
    • Yli-Koski, M.;
    • Asghar, M.;
    • Sinkkonen, J.
    Publication type:
    Article
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    Characterization of strained Si wafers by X-ray diffraction techniques.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 189, doi. 10.1007/s10854-008-9641-1
    By:
    • Shimura, Takayoshi;
    • Kawamura, Kohta;
    • Asakawa, Masahiro;
    • Watanabe, Heiji;
    • Yasutake, Kiyoshi;
    • Ogura, Atsushi;
    • Fukuda, Kazunori;
    • Sakata, Osami;
    • Kimura, Shigeru;
    • Edo, Hiroki;
    • Iida, Satoshi;
    • Umeno, Masataka
    Publication type:
    Article
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    Size effects in small scaled lead-free solder joints.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 383, doi. 10.1007/s10854-007-9349-7
    By:
    • Zimprich, P.;
    • Betzwar-Kotas, A.;
    • Khatibi, G.;
    • Weiss, B.;
    • Ipser, H.
    Publication type:
    Article
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    New Applications in Atom Probe Tomography.

    Published in:
    2012
    By:
    • Larson, D.J.;
    • Reinhard, D.A.;
    • Prosa, T.J.;
    • Olson, D.;
    • Lawrence, D.;
    • Clifton, P.H.;
    • Ulfig, R.M.;
    • Martin, I.;
    • Kelly, T.F.;
    • Smentkowski, V.S.;
    • Gordon, L.M.;
    • Joester, D.;
    • Inoue, K.
    Publication type:
    Abstract
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    Characterization of SiGe Films for Use as a National Institute of Standards and Technology Microanalysis Reference Material (RM 8905).

    Published in:
    Microscopy & Microanalysis, 2010, v. 16, n. 1, p. 1, doi. 10.1017/S1431927609991231
    By:
    • Marinenko, Ryna B.;
    • Turner, Shirley;
    • Simons, David S.;
    • Rabb, Savelas A.;
    • Zeisler, Rolf L.;
    • Yu, Lee L.;
    • Newbury, Dale E.;
    • Paul, Rick L.;
    • Ritchie, Nicholas W. M.;
    • Leigh, Stefan D.;
    • Winchester, Michael R.;
    • Richter, Lee J.;
    • Meier, Douglas C.;
    • Scott, Keana C. K.;
    • Klinedinst, Donna;
    • Small, John A.
    Publication type:
    Article
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