Works about MICROELECTRONICS

Results: 2065

Design Considerations of an Analog Voltage Mode Readout Circuit for the CMOS-SOI-MEMS Gas Sensor Dubbed GMOS.

Published in:

Micromachines, 2025, v. 16, n. 6, p. 658, doi. 10.3390/mi16060658

By:

Bukshish, Efraim-Lavi;
Bar-Lev, Sharon;
Blank, Tanya;
Nemirovsky, Yael

Publication type:

Article

THE IMPACT OF CHANNEL ENGINEERING ON SHORT CHANNEL BEHAVIOR OF NANO FIN-FETs.

Published in:

International Journal of Nanoscience, 2012, v. 11, n. 2, p. 1250021-1, doi. 10.1142/S0219581X12500214

By:

KUMARI, RITI;
GOSWAMI, MANISH;
SINGH, B. R.

Publication type:

Article

NANOPOROUS SILICON MEMBRANE FOR BIOMOLECULAR SEPARATION.

Published in:

International Journal of Nanoscience, 2011, v. 10, n. 4/5, p. 793, doi. 10.1142/S0219581X11008915

By:

ACHAR, H. V. BALACHANDRA;
BHATTACHARYA, ENAKSHI

Publication type:

Article

NANOMECHANICAL PROPERTIES OF A Sn-Ag-Cu SOLDER REINFORCED WITH Ni-COATED CARBON NANOTUBES.

Published in:

International Journal of Nanoscience, 2010, v. 9, n. 4, p. 283, doi. 10.1142/S0219581X10006818

By:

HAN, Y. D.;
JING, H. Y.;
NAI, S. M. L.;
XU, L. Y.;
TAN, C. M.;
WEI, J.

Publication type:

Article

PHYSICAL AND CHEMICAL NANOLITHOGRAPHY TECHNIQUES:: CHALLENGES AND PROSPECTS.

Published in:

International Journal of Nanoscience, 2005, v. 4, n. 4, p. 575, doi. 10.1142/S0219581X05003644

By:

WEI, J.;
WONG, C. K.

Publication type:

Article

BYCHKOV–RASHBA SPLITTING IN INVERSION LAYERS ON HEAVILY-DOPED p-HgCdTe.

Published in:

International Journal of Nanoscience, 2003, v. 2, n. 6, p. 419, doi. 10.1142/S0219581X03001516

By:

Radantsev, V.F.;
Kulaev, G.I.;
Kruzhaev, V.V.

Publication type:

Article

SCANNING PROBE ANALYSIS OF DEFECTS INDUCED BY SLIGHT IRON CONTAMINATION ON THERMALLY OXIDIZED p-TYPE SILICON WAFERS.

Published in:

International Journal of Nanoscience, 2003, v. 2, n. 4/5, p. 349, doi. 10.1142/S0219581X03001383

By:

Chang, M.N.;
Chen, C.Y.;
Pan, F.M.;
Chang, T.Y.;
Lei, T.F.

Publication type:

Article

Polymer and Molecular Electronic Devices.

Published in:

Innovation, 2006, v. 6, n. 1, p. 74

By:

Valiyaveettil, Suresh;
Mhaisalkar, Subodh

Publication type:

Article

Molecular Electronics -- The Ultimate Nano Research.

Published in:

Innovation, 2005, v. 5, n. 2, p. 51

By:

Lai, T. C.

Publication type:

Article

Novel solvent-free microwave-assisted extraction coupled with low-density solvent-based in-tube ultrasound-assisted emulsification microextraction for the fast analysis of organophosphorus pesticides in soils.

Published in:

Journal of Separation Science, 2013, v. 36, n. 14, p. 2339, doi. 10.1002/jssc.201300102

By:

Su, Yi‐Song;
Yan, Cheing‐Tong;
Ponnusamy, Vinoth Kumar;
Jen, Jen‐Fon

Publication type:

Article

All‐Dielectric Meta‐Reflectarray for Efficient Control of Visible Light.

Published in:

Annalen der Physik, 2018, v. 530, n. 3, p. 1, doi. 10.1002/andp.201700418

By:

Sun, Shang;
Zhou, Zhenxing;
Zhang, Chen;
Yang, Wenhong;
Song, Qinghai;
Xiao, Shumin

Publication type:

Article

Toward Flexible Spintronics: Perpendicularly Magnetized Synthetic Antiferromagnetic Thin Films and Nanowires on Polyimide Substrates.

Published in:

Advanced Functional Materials, 2016, v. 26, n. 26, p. 4704, doi. 10.1002/adfm.201505138

By:

Vemulkar, T.;
Mansell, R.;
Fernández‐Pacheco, A.;
Cowburn, R. P.

Publication type:

Article

Silicon-Modified Rare-Earth Transitions-A New Route to Near- and Mid-IR Photonics.

Published in:

Advanced Functional Materials, 2016, v. 26, n. 12, p. 1986, doi. 10.1002/adfm.201504662

By:

Lourenço, Manon A.;
Hughes, Mark A.;
Lai, Khue T.;
Sofi, Imran M.;
Ludurczak, Willy;
Wong, Lewis;
Gwilliam, Russell M.;
Homewood, Kevin P.

Publication type:

Article

Manipulation of Electric Field Effect by Orbital Switch.

Published in:

Advanced Functional Materials, 2016, v. 26, n. 5, p. 753, doi. 10.1002/adfm.201504036

By:

Cui, Bin;
Song, Cheng;
Mao, Haijun;
Yan, Yinuo;
Li, Fan;
Gao, Shuang;
Peng, Jingjing;
Zeng, Fei;
Pan, Feng

Publication type:

Article

Improved Heat Spreading Performance of Functionalized Graphene in Microelectronic Device Application.

Published in:

Advanced Functional Materials, 2015, v. 25, n. 28, p. 4430, doi. 10.1002/adfm.201500990

By:

Zhang, Yong;
Han, Haoxue;
Wang, Nan;
Zhang, Pengtu;
Fu, Yifeng;
Murugesan, Murali;
Edwards, Michael;
Jeppson, Kjell;
Volz, Sebastian;
Liu, Johan

Publication type:

Article

Materials and Wireless Microfluidic Systems for Electronics Capable of Chemical Dissolution on Demand.

Published in:

Advanced Functional Materials, 2015, v. 25, n. 9, p. 1338, doi. 10.1002/adfm.201403573

By:

Lee, Chi Hwan;
Jeong, Jae‐Woong;
Liu, Yuhao;
Zhang, Yihui;
Shi, Yan;
Kang, Seung‐Kyun;
Kim, Jeonghyun;
Kim, Jae Soon;
Lee, Na Yeon;
Kim, Bong Hoon;
Jang, Kyung‐In;
Yin, Lan;
Kim, Min Ku;
Banks, Anthony;
Paik, Ungyu;
Huang, Yonggang;
Rogers, John A.

Publication type:

Article

Microflotronics: A Flexible, Transparent, Pressure-Sensitive Microfluidic Film.

Published in:

Advanced Functional Materials, 2014, v. 24, n. 39, p. 6195, doi. 10.1002/adfm.201401527

By:

Li, Ruya;
Nie, Baoqing;
Digiglio, Philip;
Pan, Tingrui

Publication type:

Article

Tunable Assembly of sp3 Cross-Linked 3D Graphene Monoliths: A First-Principles Prediction.

Published in:

Advanced Functional Materials, 2014, v. 23, n. 47, p. 5846, doi. 10.1002/adfm.201301077

By:

Jiang, Xue;
Zhao, Jijun;
Li, Yan‐Ling;
Ahuja, Rajeev

Publication type:

Article

A Negative Conductivity Material Makes a dc Invisibility Cloak Hide an Object at a Distance.

Published in:

Advanced Functional Materials, 2014, v. 23, n. 35, p. 4306, doi. 10.1002/adfm.201300226

By:

Yang, Fan;
Mei, Zhong Lei;
Yang, Xin Yu;
Jin, Tian Yu;
Cui, Tie Jun

Publication type:

Article

Analysing High Technology Diffusion and Public Transference Programs: The Case of the European Game Program.

Published in:

Journal of Technology Transfer, 2006, v. 31, n. 6, p. 647, doi. 10.1007/s10961-006-0020-x

By:

Albors, José;
Hervas, José;
Hidalgo, Antonio

Publication type:

Article

Structural and electrical properties of fritless Ni(1− x)Cu xMn2O4 (0 ≤ x ≤ 1) thick film NTC ceramic.

Published in:

Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 503, doi. 10.1007/s10854-009-9946-8

By:

Jadhav, Rupali;
Kulkarni, Deepti;
Puri, Vijaya

Publication type:

Article

Identification and control of SiC polytypes in PVT method.

Published in:

Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 326, doi. 10.1007/s10854-009-9914-3

By:

Shenghuang Lin;
Zhiming Chen;
Bo Liu;
Lianbi Li;
Xianfeng Feng

Publication type:

Article

Effect of ink organics on cambering of an Ag-metallized low temperature co-fired ceramics (LTCC).

Published in:

Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 5, p. 455, doi. 10.1007/s10854-008-9750-x

By:

Bangali, Jayashri;
Rane, Sunit;
Phatak, Girish;
Gangal, Shashikala

Publication type:

Article

Electrical and transport properties of nickel manganite obtained by Hall effect measurements.

Published in:

Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 3, p. 242, doi. 10.1007/s10854-008-9710-5

By:

Savić, S.;
Stojanović, G.;
Nikolić, M.;
Aleksić, O.;
Luković Golić, D.;
Nikolić, P.

Publication type:

Article

Light emission in silicon nanostructures.

Published in:

Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 235, doi. 10.1007/s10854-007-9552-6

By:

Lockwood, David J.

Publication type:

Article

Characterisation of cubic SiC layers VPE grown on Si substrates of different conductivity.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 303, doi. 10.1007/s10854-008-9684-3

By:

Frigeri, C.;
Attolini, G.;
Bosi, M.;
Watts, B. E.

Publication type:

Article

Gettering of iron in silicon by boron implantation.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 41, doi. 10.1007/s10854-008-9640-2

By:

Haarahiltunen, A.;
Talvitie, H.;
Savin, H.;
Anttila, O.;
Yli-Koski, M.;
Asghar, M.;
Sinkkonen, J.

Publication type:

Article

Characterization of strained Si wafers by X-ray diffraction techniques.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 189, doi. 10.1007/s10854-008-9641-1

By:

Shimura, Takayoshi;
Kawamura, Kohta;
Asakawa, Masahiro;
Watanabe, Heiji;
Yasutake, Kiyoshi;
Ogura, Atsushi;
Fukuda, Kazunori;
Sakata, Osami;
Kimura, Shigeru;
Edo, Hiroki;
Iida, Satoshi;
Umeno, Masataka

Publication type:

Article

On the characterisation of grown-in defects in Czochralski-grown Si and Ge.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 24, doi. 10.1007/s10854-008-9579-3

By:

Vanhellemont, J.;
Steenbergen, J. Van;
Holsteyns, F.;
Roussel, P.;
Meuris, M.;
Młynarczyk, K.;
Śpiewak, P.;
Geens, W.;
Romandic, I..

Publication type:

Article

Optical characterisation of silicon nitride thin films grown by novel remote plasma sputter deposition.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 285, doi. 10.1007/s10854-007-9513-0

By:

Claudio, Gianfranco;
Calnan, Sonya;
Bass, Kevin;
Boreland, Matt

Publication type:

Article

Structural and electrical properties of thermally evaporated 1,4-Bis-(2-hydroxyethylamino)-9,10-anthraquinone films.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 841, doi. 10.1007/s10854-007-9488-x

By:

Bedi, R. K.;
Bhatia, Sonik;
Kaur, Navneet;
Kumar, Subodh

Publication type:

Article

Depth profiles and concentration percentages of SiO2 and SiO x induced by ion bombardment of a silicon (100) target.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 898, doi. 10.1007/s10854-008-9658-5

By:

Chin Shuang Lee;
Chia Chan Chen;
Chin Shun Hsu;
Shyong Lee;
Ron-Kai Hsu

Publication type:

Article

Profile of the wafer level ECD gold bumps under variable parameters.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 6, p. 563, doi. 10.1007/s10854-007-9387-1

By:

Jing, X. M.;
Engelmann, G.;
Chen, D.;
Wolf, J.;
Ehrmann, O.;
Reichl, H.

Publication type:

Article

In-house development of co-fireable thick film silver conductor for LTCC applications.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 6, p. 522, doi. 10.1007/s10854-007-9373-7

By:

Jagtap, Shweta;
Deshpande, Varsha;
Rane, Vivek;
Rane, Sunit;
Phatak, Girish;
Amalnerkar, Dinesh

Publication type:

Article

Gas sensing properties of nano SnO2 based thick films prepared by dip coating method with effect of molarity of PtCl2 solution.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 6, p. 547, doi. 10.1007/s10854-007-9384-4

By:

Garje, Anil D.;
Aiyer, Rohini C.

Publication type:

Article

Size effects in small scaled lead-free solder joints.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 383, doi. 10.1007/s10854-007-9349-7

By:

Zimprich, P.;
Betzwar-Kotas, A.;
Khatibi, G.;
Weiss, B.;
Ipser, H.

Publication type:

Article

Large scale copper microstructures generation using electro-deposition through nuclear track filters.

Published in:

Journal of Materials Science Letters, 2003, v. 22, n. 19, p. 1323, doi. 10.1023/A:1025722908520

By:

Kumar, S.;
Chakarvarti, S. K.

Publication type:

Article

Surface characteristics of MOCVD grown TiO2 films by atomic force microscopy.

Published in:

Journal of Materials Science Letters, 2003, v. 22, n. 19, p. 1325, doi. 10.1023/A:1025775025358

By:

Park, Young-Bae;
Ahn, K. H.;
Park, Dong-Wha

Publication type:

Article

Effects of Nb doping on properties of barium titanate thin films.

Published in:

Journal of Materials Science Letters, 2003, v. 22, n. 18, p. 1269, doi. 10.1023/A:1025410219112

By:

Chu, J. P.;
Chang, C. W.;
Mahalingam, T.;
Lin, C. C.;
Wang, S. F.

Publication type:

Article

Anatase TiO2 film from sol-gel process added polyvinylpyrrolidone.

Published in:

Journal of Materials Science Letters, 2003, v. 22, n. 9, p. 687, doi. 10.1023/A:1023623228830

By:

Segawa, H.;
Fukuyoshi, J.;
Tateishi, K.;
Tanaka, K.;
Yoshida, K.

Publication type:

Article

The Dioskuroi: Masters of the Information Channel.

Published in:

Configurations, 2002, v. 10, n. 1, p. 111, doi. 10.1353/con.2003.0008

By:

Kittler, Wolf

Publication type:

Article

Determining Stress in Metallic Conducting Layers of Microelectronics Devices Using High Resolution Electron Backscatter Diffraction and Finite Element Analysis.

Published in:

Microscopy & Microanalysis, 2023, v. 29, n. 2, p. 490, doi. 10.1093/micmic/ozad013

By:

Ruggles, Timothy;
Grutzik, Scott;
Stephens, Kelly;
Michael, Joseph

Publication type:

Article

Specifications for Hard Condensed Matter Specimens for Three-Dimensional High-Resolution Tomographies.

Published in:

Microscopy & Microanalysis, 2013, v. 19, n. 3, p. 726, doi. 10.1017/S1431927613000330

By:

Bleuet, P.;
Audoit, G.;
Barnes, J.-P.;
Bertheau, J.;
Dabin, Y.;
Dansas, H.;
Fabbri, J.-M.;
Florin, B.;
Gergaud, P.;
Grenier, A.;
Haberfehlner, G.;
Lay, E.;
Laurencin, J.;
Serra, R.;
Villanova, J.

Publication type:

Article

Microscopy Studies of Carbon Nanotubes/Ferroelectric Composites for Microelectronics.

Published in:

Microscopy & Microanalysis, 2012, v. 18, n. S5, p. 107, doi. 10.1017/S1431927612013190

By:

Mahajan, Amit;
Haque, Rubaiyet Iftekharul;
Vilarinho, Paula M.;
Kingon, Angus

Publication type:

Article

Electron Microscopy Study of Porous and Co Functionalized BaTiO3 Thin Films.

Published in:

Microscopy & Microanalysis, 2012, v. 18, n. S5, p. 115, doi. 10.1017/S1431927612013232

By:

Ferreira, P.;
Castro, A.;
Vilarinho, P. M.;
Willinger, M. -G.;
Mosa, J.;
Laberty, C.;
Sanchez, C.

Publication type:

Article

New Applications in Atom Probe Tomography.

Published in:

2012

By:

Larson, D.J.;
Reinhard, D.A.;
Prosa, T.J.;
Olson, D.;
Lawrence, D.;
Clifton, P.H.;
Ulfig, R.M.;
Martin, I.;
Kelly, T.F.;
Smentkowski, V.S.;
Gordon, L.M.;
Joester, D.;
Inoue, K.

Publication type:

Abstract

Tin Whiskers: Electron Microscopy and EBSD Characterization.

Published in:

2010

By:

Susan, D. F.;
Michael, J. R.;
Grant, R. P.;
Yelton, W. G.

Publication type:

Abstract

Characterization of SiGe Films for Use as a National Institute of Standards and Technology Microanalysis Reference Material (RM 8905).

Published in:

Microscopy & Microanalysis, 2010, v. 16, n. 1, p. 1, doi. 10.1017/S1431927609991231

By:

Marinenko, Ryna B.;
Turner, Shirley;
Simons, David S.;
Rabb, Savelas A.;
Zeisler, Rolf L.;
Yu, Lee L.;
Newbury, Dale E.;
Paul, Rick L.;
Ritchie, Nicholas W. M.;
Leigh, Stefan D.;
Winchester, Michael R.;
Richter, Lee J.;
Meier, Douglas C.;
Scott, Keana C. K.;
Klinedinst, Donna;
Small, John A.

Publication type:

Article

Modification of Polyimide Wettability by KrF Pulsed Laser Ablation.

Published in:

Microscopy & Microanalysis, 2008, v. 14, n. S3, p. 73, doi. 10.1017/S1431927608089435

By:

Oliveira, V.;
Vilar, R.

Publication type:

Article

Structural and Microanalytical Studies of CrO2 Thin Films on c-Sapphire by High Resolution Electron Microscopy Methods.

Published in:

Microscopy & Microanalysis, 2008, v. 14, n. S3, p. 47, doi. 10.1017/S1431927608089356

By:

Ortiz, M.I.;
Sousa, P.M.;
Ballesteros, C.;
Silvestre, A.J.;
Cohen, L.F.;
Conde, O.

Publication type:

Article