Works about MICROELECTRONICS
1
- Micromachines, 2025, v. 16, n. 6, p. 658, doi. 10.3390/mi16060658
- Bukshish, Efraim-Lavi;
- Bar-Lev, Sharon;
- Blank, Tanya;
- Nemirovsky, Yael
- Article
2
- International Journal of Nanoscience, 2012, v. 11, n. 2, p. 1250021-1, doi. 10.1142/S0219581X12500214
- KUMARI, RITI;
- GOSWAMI, MANISH;
- SINGH, B. R.
- Article
3
- International Journal of Nanoscience, 2011, v. 10, n. 4/5, p. 793, doi. 10.1142/S0219581X11008915
- ACHAR, H. V. BALACHANDRA;
- BHATTACHARYA, ENAKSHI
- Article
4
- International Journal of Nanoscience, 2010, v. 9, n. 4, p. 283, doi. 10.1142/S0219581X10006818
- HAN, Y. D.;
- JING, H. Y.;
- NAI, S. M. L.;
- XU, L. Y.;
- TAN, C. M.;
- WEI, J.
- Article
5
- International Journal of Nanoscience, 2005, v. 4, n. 4, p. 575, doi. 10.1142/S0219581X05003644
- Article
6
- International Journal of Nanoscience, 2003, v. 2, n. 6, p. 419, doi. 10.1142/S0219581X03001516
- Radantsev, V.F.;
- Kulaev, G.I.;
- Kruzhaev, V.V.
- Article
7
- International Journal of Nanoscience, 2003, v. 2, n. 4/5, p. 349, doi. 10.1142/S0219581X03001383
- Chang, M.N.;
- Chen, C.Y.;
- Pan, F.M.;
- Chang, T.Y.;
- Lei, T.F.
- Article
8
- Innovation, 2006, v. 6, n. 1, p. 74
- Valiyaveettil, Suresh;
- Mhaisalkar, Subodh
- Article
9
- Innovation, 2005, v. 5, n. 2, p. 51
- Article
10
- Journal of Separation Science, 2013, v. 36, n. 14, p. 2339, doi. 10.1002/jssc.201300102
- Su, Yi‐Song;
- Yan, Cheing‐Tong;
- Ponnusamy, Vinoth Kumar;
- Jen, Jen‐Fon
- Article
11
- Annalen der Physik, 2018, v. 530, n. 3, p. 1, doi. 10.1002/andp.201700418
- Sun, Shang;
- Zhou, Zhenxing;
- Zhang, Chen;
- Yang, Wenhong;
- Song, Qinghai;
- Xiao, Shumin
- Article
12
- Advanced Functional Materials, 2016, v. 26, n. 26, p. 4704, doi. 10.1002/adfm.201505138
- Vemulkar, T.;
- Mansell, R.;
- Fernández‐Pacheco, A.;
- Cowburn, R. P.
- Article
13
- Advanced Functional Materials, 2016, v. 26, n. 12, p. 1986, doi. 10.1002/adfm.201504662
- Lourenço, Manon A.;
- Hughes, Mark A.;
- Lai, Khue T.;
- Sofi, Imran M.;
- Ludurczak, Willy;
- Wong, Lewis;
- Gwilliam, Russell M.;
- Homewood, Kevin P.
- Article
14
- Advanced Functional Materials, 2016, v. 26, n. 5, p. 753, doi. 10.1002/adfm.201504036
- Cui, Bin;
- Song, Cheng;
- Mao, Haijun;
- Yan, Yinuo;
- Li, Fan;
- Gao, Shuang;
- Peng, Jingjing;
- Zeng, Fei;
- Pan, Feng
- Article
15
- Advanced Functional Materials, 2015, v. 25, n. 28, p. 4430, doi. 10.1002/adfm.201500990
- Zhang, Yong;
- Han, Haoxue;
- Wang, Nan;
- Zhang, Pengtu;
- Fu, Yifeng;
- Murugesan, Murali;
- Edwards, Michael;
- Jeppson, Kjell;
- Volz, Sebastian;
- Liu, Johan
- Article
16
- Advanced Functional Materials, 2015, v. 25, n. 9, p. 1338, doi. 10.1002/adfm.201403573
- Lee, Chi Hwan;
- Jeong, Jae‐Woong;
- Liu, Yuhao;
- Zhang, Yihui;
- Shi, Yan;
- Kang, Seung‐Kyun;
- Kim, Jeonghyun;
- Kim, Jae Soon;
- Lee, Na Yeon;
- Kim, Bong Hoon;
- Jang, Kyung‐In;
- Yin, Lan;
- Kim, Min Ku;
- Banks, Anthony;
- Paik, Ungyu;
- Huang, Yonggang;
- Rogers, John A.
- Article
17
- Advanced Functional Materials, 2014, v. 24, n. 39, p. 6195, doi. 10.1002/adfm.201401527
- Li, Ruya;
- Nie, Baoqing;
- Digiglio, Philip;
- Pan, Tingrui
- Article
18
- Advanced Functional Materials, 2014, v. 23, n. 47, p. 5846, doi. 10.1002/adfm.201301077
- Jiang, Xue;
- Zhao, Jijun;
- Li, Yan‐Ling;
- Ahuja, Rajeev
- Article
19
- Advanced Functional Materials, 2014, v. 23, n. 35, p. 4306, doi. 10.1002/adfm.201300226
- Yang, Fan;
- Mei, Zhong Lei;
- Yang, Xin Yu;
- Jin, Tian Yu;
- Cui, Tie Jun
- Article
20
- Journal of Technology Transfer, 2006, v. 31, n. 6, p. 647, doi. 10.1007/s10961-006-0020-x
- Albors, José;
- Hervas, José;
- Hidalgo, Antonio
- Article
21
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 503, doi. 10.1007/s10854-009-9946-8
- Jadhav, Rupali;
- Kulkarni, Deepti;
- Puri, Vijaya
- Article
22
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 326, doi. 10.1007/s10854-009-9914-3
- Shenghuang Lin;
- Zhiming Chen;
- Bo Liu;
- Lianbi Li;
- Xianfeng Feng
- Article
23
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 5, p. 455, doi. 10.1007/s10854-008-9750-x
- Bangali, Jayashri;
- Rane, Sunit;
- Phatak, Girish;
- Gangal, Shashikala
- Article
24
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 3, p. 242, doi. 10.1007/s10854-008-9710-5
- Savić, S.;
- Stojanović, G.;
- Nikolić, M.;
- Aleksić, O.;
- Luković Golić, D.;
- Nikolić, P.
- Article
25
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 235, doi. 10.1007/s10854-007-9552-6
- Article
26
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 303, doi. 10.1007/s10854-008-9684-3
- Frigeri, C.;
- Attolini, G.;
- Bosi, M.;
- Watts, B. E.
- Article
27
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 41, doi. 10.1007/s10854-008-9640-2
- Haarahiltunen, A.;
- Talvitie, H.;
- Savin, H.;
- Anttila, O.;
- Yli-Koski, M.;
- Asghar, M.;
- Sinkkonen, J.
- Article
28
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 189, doi. 10.1007/s10854-008-9641-1
- Shimura, Takayoshi;
- Kawamura, Kohta;
- Asakawa, Masahiro;
- Watanabe, Heiji;
- Yasutake, Kiyoshi;
- Ogura, Atsushi;
- Fukuda, Kazunori;
- Sakata, Osami;
- Kimura, Shigeru;
- Edo, Hiroki;
- Iida, Satoshi;
- Umeno, Masataka
- Article
29
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 24, doi. 10.1007/s10854-008-9579-3
- Vanhellemont, J.;
- Steenbergen, J. Van;
- Holsteyns, F.;
- Roussel, P.;
- Meuris, M.;
- Młynarczyk, K.;
- Śpiewak, P.;
- Geens, W.;
- Romandic, I..
- Article
30
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 285, doi. 10.1007/s10854-007-9513-0
- Claudio, Gianfranco;
- Calnan, Sonya;
- Bass, Kevin;
- Boreland, Matt
- Article
31
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 841, doi. 10.1007/s10854-007-9488-x
- Bedi, R. K.;
- Bhatia, Sonik;
- Kaur, Navneet;
- Kumar, Subodh
- Article
32
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 898, doi. 10.1007/s10854-008-9658-5
- Chin Shuang Lee;
- Chia Chan Chen;
- Chin Shun Hsu;
- Shyong Lee;
- Ron-Kai Hsu
- Article
33
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 6, p. 563, doi. 10.1007/s10854-007-9387-1
- Jing, X. M.;
- Engelmann, G.;
- Chen, D.;
- Wolf, J.;
- Ehrmann, O.;
- Reichl, H.
- Article
34
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 6, p. 522, doi. 10.1007/s10854-007-9373-7
- Jagtap, Shweta;
- Deshpande, Varsha;
- Rane, Vivek;
- Rane, Sunit;
- Phatak, Girish;
- Amalnerkar, Dinesh
- Article
35
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 6, p. 547, doi. 10.1007/s10854-007-9384-4
- Garje, Anil D.;
- Aiyer, Rohini C.
- Article
36
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 383, doi. 10.1007/s10854-007-9349-7
- Zimprich, P.;
- Betzwar-Kotas, A.;
- Khatibi, G.;
- Weiss, B.;
- Ipser, H.
- Article
37
- Journal of Materials Science Letters, 2003, v. 22, n. 19, p. 1323, doi. 10.1023/A:1025722908520
- Kumar, S.;
- Chakarvarti, S. K.
- Article
38
- Journal of Materials Science Letters, 2003, v. 22, n. 19, p. 1325, doi. 10.1023/A:1025775025358
- Park, Young-Bae;
- Ahn, K. H.;
- Park, Dong-Wha
- Article
39
- Journal of Materials Science Letters, 2003, v. 22, n. 18, p. 1269, doi. 10.1023/A:1025410219112
- Chu, J. P.;
- Chang, C. W.;
- Mahalingam, T.;
- Lin, C. C.;
- Wang, S. F.
- Article
40
- Journal of Materials Science Letters, 2003, v. 22, n. 9, p. 687, doi. 10.1023/A:1023623228830
- Segawa, H.;
- Fukuyoshi, J.;
- Tateishi, K.;
- Tanaka, K.;
- Yoshida, K.
- Article
41
- Configurations, 2002, v. 10, n. 1, p. 111, doi. 10.1353/con.2003.0008
- Article
42
- Microscopy & Microanalysis, 2023, v. 29, n. 2, p. 490, doi. 10.1093/micmic/ozad013
- Ruggles, Timothy;
- Grutzik, Scott;
- Stephens, Kelly;
- Michael, Joseph
- Article
43
- Microscopy & Microanalysis, 2013, v. 19, n. 3, p. 726, doi. 10.1017/S1431927613000330
- Bleuet, P.;
- Audoit, G.;
- Barnes, J.-P.;
- Bertheau, J.;
- Dabin, Y.;
- Dansas, H.;
- Fabbri, J.-M.;
- Florin, B.;
- Gergaud, P.;
- Grenier, A.;
- Haberfehlner, G.;
- Lay, E.;
- Laurencin, J.;
- Serra, R.;
- Villanova, J.
- Article
44
- Microscopy & Microanalysis, 2012, v. 18, n. S5, p. 107, doi. 10.1017/S1431927612013190
- Mahajan, Amit;
- Haque, Rubaiyet Iftekharul;
- Vilarinho, Paula M.;
- Kingon, Angus
- Article
45
- Microscopy & Microanalysis, 2012, v. 18, n. S5, p. 115, doi. 10.1017/S1431927612013232
- Ferreira, P.;
- Castro, A.;
- Vilarinho, P. M.;
- Willinger, M. -G.;
- Mosa, J.;
- Laberty, C.;
- Sanchez, C.
- Article
46
- 2012
- Larson, D.J.;
- Reinhard, D.A.;
- Prosa, T.J.;
- Olson, D.;
- Lawrence, D.;
- Clifton, P.H.;
- Ulfig, R.M.;
- Martin, I.;
- Kelly, T.F.;
- Smentkowski, V.S.;
- Gordon, L.M.;
- Joester, D.;
- Inoue, K.
- Abstract
47
- 2010
- Susan, D. F.;
- Michael, J. R.;
- Grant, R. P.;
- Yelton, W. G.
- Abstract
48
- Microscopy & Microanalysis, 2010, v. 16, n. 1, p. 1, doi. 10.1017/S1431927609991231
- Marinenko, Ryna B.;
- Turner, Shirley;
- Simons, David S.;
- Rabb, Savelas A.;
- Zeisler, Rolf L.;
- Yu, Lee L.;
- Newbury, Dale E.;
- Paul, Rick L.;
- Ritchie, Nicholas W. M.;
- Leigh, Stefan D.;
- Winchester, Michael R.;
- Richter, Lee J.;
- Meier, Douglas C.;
- Scott, Keana C. K.;
- Klinedinst, Donna;
- Small, John A.
- Article
49
- Microscopy & Microanalysis, 2008, v. 14, n. S3, p. 73, doi. 10.1017/S1431927608089435
- Article
50
- Microscopy & Microanalysis, 2008, v. 14, n. S3, p. 47, doi. 10.1017/S1431927608089356
- Ortiz, M.I.;
- Sousa, P.M.;
- Ballesteros, C.;
- Silvestre, A.J.;
- Cohen, L.F.;
- Conde, O.
- Article