Works about METAL oxide semiconductor field-effect transistors


Results: 2596
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    Enhanced VDMOS design with reduced parasitic effect.

    Published in:
    International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2025, v. 39, n. 19, p. 1, doi. 10.1142/S021797922550167X
    By:
    • Prasad, Madhulika;
    • Sahu, Satish Kumar;
    • Parmar, Onika
    Publication type:
    Article
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    Optimized Gate Metal Variant Structure for Graded-Channel (GC) Gate-Stack (GS) Double-Gate (DG) MOSFET to Enhance Switching Speed, Analog and RF Performance: Optimized Gate Metal Variant Structure for Graded-Channel (GC) Gate-Stack (GS) Double Gate (DG) MOSFET to Enhance Switching Speed, Analog and RF Performance: D. Chowdhury et al

    Published in:
    Journal of Electronic Materials, 2025, v. 54, n. 5, p. 3480, doi. 10.1007/s11664-024-11548-1
    By:
    • Chowdhury, Dibyendu;
    • DasMahapatra, Suddhendu;
    • De, Bishnu Prasad;
    • Maiti, Madhusudan;
    • Kar, Rajib;
    • Mandal, Durbadal;
    • Samanta, Jagannath
    Publication type:
    Article
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    Spacer Engineered Halo-Doped Nanowire MOSFET for Digital Applications.

    Published in:
    Journal of Electronic Materials, 2025, v. 54, n. 1, p. 758, doi. 10.1007/s11664-024-11557-0
    By:
    • Kumar, P. Kiran;
    • Balaji, B.;
    • Vardhan, Ch. Sree;
    • Gowthami, Y.;
    • Agarwal, Vipul;
    • Shashidhar, M.;
    • Sagar, Kallepelli;
    • Jena, Biswajit;
    • Pedapudi, Michael Cholines;
    • Manikanta, Kurivella
    Publication type:
    Article
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    5,7,12,14‐Tetrafunctionalized 6,13‐Diazapentacenes.

    Published in:
    Chemistry - A European Journal, 2020, v. 26, n. 4, p. 799, doi. 10.1002/chem.201904516
    By:
    • Xie, Gaozhan;
    • Hauschild, Miriam;
    • Hoffmann, Hendrik;
    • Ahrens, Lukas;
    • Rominger, Frank;
    • Borkowski, Michal;
    • Marszalek, Tomasz;
    • Freudenberg, Jan;
    • Kivala, Milan;
    • Bunz, Uwe H. F.
    Publication type:
    Article
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    Palladium diffusion in germanium.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 6, p. 3787, doi. 10.1007/s10854-015-2903-9
    By:
    • Chroneos, A.;
    • Vovk, R.
    Publication type:
    Article
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