Works matching DE "INTERFEROMETRY"
1
- Metrology, 2025, v. 4, n. 2, p. 35, doi. 10.3390/metrology5020035
- Piazzetta, Gabriela R.;
- Zeller, Thomas M.;
- Hernandez-Otalvaro, Juan M.;
- Pintaude, Giuseppe
- Article
2
- Remote Sensing, 2025, v. 17, n. 12, p. 2003, doi. 10.3390/rs17122003
- Poggi, Francesco;
- Nardini, Olga;
- Fiaschi, Simone;
- Montalti, Roberto;
- Intrieri, Emanuele;
- Raspini, Federico
- Article
3
- Technology Teacher, 1999, v. 58, n. 6, p. 35
- Shope, Richard;
- Fisher, Diane
- Article
4
- Sampling Theory in Signal & Image Processing, 2012, v. 11, n. 1, p. 81, doi. 10.1007/bf03549550
- Hidemitsu Ogawa;
- Akira Hirabayashi
- Article
5
- Journal of Energetic Materials, 2006, v. 24, n. 1, p. 35, doi. 10.1080/07370650500374342
- Article
6
- Journal of Energetic Materials, 2006, v. 24, n. 1, p. 1, doi. 10.1080/07370650500374318
- Bhattacharya, Shantanu;
- Gao, Yuanfang;
- Apperson, Steven;
- Subramaniam, Senthil;
- Shende, Rajesh;
- Gangopadhyay, Shubhra;
- Talantsev, Evgueni
- Article
7
- Journal of Energetic Materials, 2006, v. 24, n. 1, p. 17, doi. 10.1080/07370650500374326
- Badders, N. R.;
- Wei, C.;
- Aldeeb, A. A.;
- Rogers, W. J.;
- Mannan, M. S.
- Article
8
- Liver International, 2013, v. 33, n. 6, p. 871, doi. 10.1111/liv.12127
- Alfaleh, Faleh Z.;
- Alswat, Khalid;
- Helmy, Ahmed;
- Al‐hamoudi, Waleed;
- El‐sharkawy, Mohamed;
- Omar, Mohanned;
- Shalaby, Ahmed;
- Bedewi, Mohaned A.;
- Hadad, Qais;
- Ali, Safiyya M.;
- Alfaleh, Ahmad;
- Abdo, Ayman A.
- Article
9
- International Journal of Wavelets, Multiresolution & Information Processing, 2010, v. 8, n. 1, p. 89, doi. 10.1142/S0219691310003407
- Article
10
- Innovation, 2010, v. 9, n. 2, p. 25
- Article
11
- Annalen der Physik, 2024, v. 536, n. 2, p. 1, doi. 10.1002/andp.202200447
- Baghi, Quentin;
- Baker, John G.;
- Slutsky, Jacob;
- Thorpe, James Ira
- Article
12
- Annalen der Physik, 2023, v. 535, n. 8, p. 1, doi. 10.1002/andp.202300117
- Kumar, Chandan;
- Rishabh;
- Arora, Shikhar
- Article
13
- Annalen der Physik, 2023, v. 535, n. 7, p. 1, doi. 10.1002/andp.202200386
- Article
14
- Annalen der Physik, 2022, v. 534, n. 1, p. 1, doi. 10.1002/andp.202100434
- Article
15
- Annalen der Physik, 2019, v. 531, n. 7, p. N.PAG, doi. 10.1002/andp.201900033
- Geints, Yuri E.;
- Minin, Oleg V.;
- Minin, Igor V.
- Article
16
- Annalen der Physik, 2018, v. 530, n. 5, p. 1, doi. 10.1002/andp.201700431
- Wang, Mingqing;
- Li, Fang;
- Zheng, Ming;
- Lu, Wei;
- Zhao, Sufen;
- Yu, Qingnan;
- Jia, Yan;
- Wu, Jian
- Article
17
- Annalen der Physik, 2017, v. 529, n. 8, p. n/a, doi. 10.1002/andp.201600335
- Ni, Jiating;
- Dadras, Siamak;
- Lam, Wa Kun;
- Shrestha, Rajendra K.;
- Sadgrove, Mark;
- Wimberger, Sandro;
- Summy, Gil S.
- Article
18
- Annalen der Physik, 2017, v. 529, n. 3, p. n/a, doi. 10.1002/andp.201600216
- Article
19
- Advanced Functional Materials, 2014, v. 24, n. 24, p. 3751, doi. 10.1002/adfm.201304274
- Yu, Qian;
- Johnson, Leah M.;
- López, Gabriel P.
- Article
20
- Advanced Functional Materials, 2013, v. 23, n. 21, p. 2701, doi. 10.1002/adfm.201201889
- Araoka, Fumito;
- Sugiyama, Go;
- Ishikawa, Ken;
- Takezoe, Hideo
- Article
21
- Natural Computing, 2015, v. 14, n. 3, p. 433, doi. 10.1007/s11047-014-9442-9
- Dolev, Shlomi;
- Fandina, Nova;
- Rosen, Joseph
- Article
22
- Journal of Thermal Analysis & Calorimetry, 2004, v. 75, n. 2, p. 623, doi. 10.1023/B:JTAN.0000027154.27766.2c
- Melo, Dulce M.A.;
- Vicentini, G.;
- Zinner, L.B.;
- Zinner, K.;
- De Souza, H.K.S.;
- Batista, M.K.S.;
- Pedrosa, A.M. Garrido;
- Bezerra, R.F.
- Article
23
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 130, doi. 10.1007/s10854-007-9465-4
- Adachi, Daisuke;
- Hama, Takeshi;
- Toyama, Toshihiko;
- Okamoto, Hiroaki
- Article
24
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 125, doi. 10.1007/s10854-007-9464-5
- Aoki, Takeshi;
- Ohrui, Nobuaki;
- Fujihashi, Chugo;
- Shimakawa, Koichi
- Article
25
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 194, doi. 10.1007/s10854-007-9491-2
- Montgomery, Paul;
- Anstotz, Freddy;
- Johnson, Gyasi;
- Kiefer, Renaud
- Article
26
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 797, doi. 10.1007/s10854-007-9451-x
- Dobbert, J.;
- Kunets, Vas. P.;
- Morgan, T. Al.;
- Guzun, D. I;
- Mazur, Yu. I.;
- Masselink, W. T.;
- Salamo, G. J.
- Article
27
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 875, doi. 10.1007/s10854-007-9548-2
- Sugiyama, Jun;
- Mukai, Kazuhiko;
- Ikedo, Yutaka;
- Russo, Peter L.;
- Suzuki, Takao;
- Watanabe, Isao;
- Brewer, Jess H.;
- Ansaldo, Eduardo J.;
- Chow, Kim H.;
- Ariyoshi, Kingo;
- Ohzuku, Tsutomu
- Article
28
- Journal of Materials Science Letters, 2003, v. 22, n. 22, p. 1569, doi. 10.1023/A:1026372105427
- Sorescu, M.;
- Pourarian, F.;
- Brand, R. A.
- Article
29
- Wind Energy, 2017, v. 20, n. 11, p. 1841, doi. 10.1002/we.2124
- Westwood, Rachel F.;
- Styles, Peter
- Article
30
- 2023
- Van Winkle, Madeline;
- Craig, Isaac M;
- Kazmierczak, Nathanael P;
- Carr, Stephen;
- Dandu, Medha;
- Ophus, Colin;
- Bustillo, Karen C;
- Ciston, Jim;
- Brown, Hamish G;
- Raja, Archana;
- Griffin, Sinéad M;
- Bediako, D Kwabena
- Abstract
31
- Microscopy & Microanalysis, 2019, p. 406, doi. 10.1017/S1431927618002520
- Article
32
- Microscopy & Microanalysis, 2012, v. 18, n. 3, p. 638, doi. 10.1017/S1431927612000128
- Carvalho, Daniel;
- Morales, Francisco M.
- Article
33
- Microscopy & Microanalysis, 2011, v. 17, n. 3, p. 461, doi. 10.1017/S1431927611000407
- Kim, Ki Woo;
- Cho, Do-Hyun;
- Kim, Pan-Gi
- Article
34
- Microscopy & Microanalysis, 2011, v. 17, n. 1, p. 118, doi. 10.1017/S1431927610093967
- Ki Woo Kim;
- In Jung Lee;
- Chang Soo Kim;
- Don Koo Lee;
- Eun Woo Park
- Article
35
- Microscopy & Microanalysis, 2010, v. 16, n. 3, p. 306, doi. 10.1017/S1431927610000152
- Article
36
- Microscopy & Microanalysis, 2007, v. 13, n. 5, p. 329, doi. 10.1017/S1431927607070687
- Suk Chung;
- David J. Smith;
- Martha R. McCartney
- Article
37
- 2020
- Arboleda, Carolina;
- Wang, Zhentian;
- Jefimovs, Konstantins;
- Koehler, Thomas;
- Van Stevendaal, Udo;
- Kuhn, Norbert;
- David, Bernd;
- Prevrhal, Sven;
- Lång, Kristina;
- Forte, Serafino;
- Kubik-Huch, Rahel Antonia;
- Leo, Cornelia;
- Singer, Gad;
- Marcon, Magda;
- Boss, Andreas;
- Roessl, Ewald;
- Stampanoni, Marco
- Journal Article
38
- Communications in Mathematical Physics, 2006, v. 262, n. 2, p. 489, doi. 10.1007/s00220-005-1460-0
- Hundertmark, Dirk;
- Killip, Rowan;
- Nakamura, Shu;
- Stollmann, Peter;
- Veselić, Ivan
- Article
39
- Communications in Mathematical Physics, 2005, v. 258, n. 1, p. 75, doi. 10.1007/s00220-005-1303-z
- Article
40
- Cells Tissues Organs, 2011, v. 194, n. 2-4, p. 291, doi. 10.1159/000324230
- Groppe, Jay C.;
- Wu, Jingfeng;
- Shore, Eileen M.;
- Kaplan, Frederick S.
- Article
41
- Russian Journal of Nondestructive Testing, 2019, v. 55, n. 8, p. 622, doi. 10.1134/S1061830919080072
- Makhov, V. E.;
- Potapov, A. I.;
- Smorodinskii, Ya. G.;
- Manevich, E. Ya.
- Article
42
- Russian Journal of Nondestructive Testing, 2017, v. 53, n. 3, p. 236, doi. 10.1134/S1061830917030081
- Retheesh, R.;
- Samuel, Boni;
- Radhakrishnan, P.;
- Mujeeb, A.
- Article
43
- Russian Journal of Nondestructive Testing, 2011, v. 47, n. 3, p. 153, doi. 10.1134/S1061830911030107
- Vladimirov, A.;
- Gorkunov, E.;
- Goruleva, L.;
- Zadvorkin, S.;
- Shadrin, M.
- Article
44
- Russian Journal of Nondestructive Testing, 2010, v. 46, n. 1, p. 5, doi. 10.1134/S106183091001002X
- Fursa, T.;
- Surzhikov, A.;
- Dann, D.
- Article
45
- Russian Journal of Nondestructive Testing, 2008, v. 44, n. 5, p. 318, doi. 10.1134/S1061830908050033
- Miroshnichenko, I. P.;
- Serkin, A. G.
- Article
46
- Russian Journal of Nondestructive Testing, 2006, v. 42, n. 9, p. 582, doi. 10.1134/S1061830906090038
- Vladimirov, A.;
- Gorkunov, E.;
- Eremin, P.;
- Zadvorkin, S.
- Article
47
- Russian Journal of Nondestructive Testing, 2005, v. 41, n. 7, p. 430, doi. 10.1007/s11181-005-0187-5
- Sukatskas, V.;
- Volkovas, V.
- Article
48
- Russian Journal of Nondestructive Testing, 2004, v. 40, n. 10, p. 708, doi. 10.1007/s11181-004-0020-6
- Article
49
- Russian Journal of Nondestructive Testing, 2003, v. 39, n. 6, p. 445, doi. 10.1023/B:RUNT.0000011625.59305.31
- Sukatskas, V.;
- Volkovas, V.
- Article
50
- Russian Journal of Nondestructive Testing, 2003, v. 39, n. 1, p. 67, doi. 10.1023/A:1024597221926
- Shanin, V. I.;
- Shanin, O. V.
- Article