Works about GALLIUM nitride
1
- Frequenz, 2025, v. 79, n. 7/8, p. 433, doi. 10.1515/freq-2024-0298
- Article
2
- Advanced Electronic Materials, 2025, v. 11, n. 7, p. 1, doi. 10.1002/aelm.202400690
- Ganguly, Swapnodoot;
- Nama Manjunatha, Krishna;
- Paul, Shashi
- Article
3
- International Journal of Circuit Theory & Applications, 2025, v. 53, n. 7, p. 3949, doi. 10.1002/cta.4330
- Wang, Kun;
- Cheng, Zhiqun;
- Jia, Minshi;
- Zhu, Zheming;
- Zhong, Baoquan;
- Yang, Zhenghao;
- Li, Bingxin
- Article
4
- Metrology, 2025, v. 4, n. 2, p. 21, doi. 10.3390/metrology5020021
- Orr, Gilad;
- Azoulay, Moshe;
- Golan, Gady;
- Burger, Arnold
- Article
5
- University of Thi-Qar Journal of Science, 2021, v. 8, n. 2, p. 104, doi. 10.32792/utq/utjsci.v8i2.871
- Saad, Yasmeen;
- AL-Khursan, Amin Habbeb;
- .
- Article
6
- Journal of Low Power Electronics & Applications, 2025, v. 15, n. 2, p. 25, doi. 10.3390/jlpea15020025
- Wang, Xin;
- Zhao, Qingsong;
- Zhao, Zenglong;
- Meng, Fanyi
- Article
7
- Micromachines, 2025, v. 16, n. 6, p. 687, doi. 10.3390/mi16060687
- Li, Yuan;
- Huang, Yong;
- Li, Jing;
- Sun, Huiqing;
- Guo, Zhiyou
- Article
9
- Materials (1996-1944), 2025, v. 18, n. 12, p. 2849, doi. 10.3390/ma18122849
- Janonis, Vytautas;
- Cernescu, Adrian;
- Prystawko, Pawel;
- Januškevičius, Regimantas;
- Indrišiūnas, Simonas;
- Kašalynas, Irmantas
- Article
10
- Journal of Microwave Power & Electromagnetic Energy, 2004, v. 39, n. 1, p. 31, doi. 10.1080/08327823.2004.11688506
- Isom, Wendell W.;
- Holmer, Art;
- Natwora Jr, James;
- Apte, Prasad
- Article
11
- International Journal of Nanoscience, 2011, v. 10, n. 6, p. 1209, doi. 10.1142/S0219581X11008290
- ZHUANG, HUIZHAO;
- WANG, JIE;
- ZHANG, XIAOKAI;
- LI, JUNLIN
- Article
12
- International Journal of Nanoscience, 2011, v. 10, n. 4/5, p. 823, doi. 10.1142/S0219581X11009246
- SURESH, S.;
- GANESH, V.;
- BALAJI, M.;
- BASKAR, K.;
- ASOKAN, K.;
- KANJILAL, D.
- Article
13
- International Journal of Nanoscience, 2011, v. 10, n. 4/5, p. 555, doi. 10.1142/S0219581X11009386
- MISHRA, J. K.;
- DHAR, S.;
- KHADERABAD, M. A.
- Article
14
- International Journal of Nanoscience, 2011, v. 10, n. 1/2, p. 117, doi. 10.1142/S0219581X11007491
- KUMAR, PRAVEEN;
- KUMAR, MAHESH;
- GOVIND;
- MEHTA, B. R.;
- SHIVAPRASAD, S. M.
- Article
15
- International Journal of Nanoscience, 2011, v. 10, n. 1/2, p. 141, doi. 10.1142/S0219581X11007612
- MEHER, S. R.;
- BIJU, KUYYADI P.;
- JAIN, MAHAVEER K.
- Article
16
- International Journal of Nanoscience, 2007, v. 6, n. 5, p. 327, doi. 10.1142/S0219581X07004882
- SIZOV, D. S.;
- SIZOV, V. S.;
- LUNDIN, V. V.;
- ZAVARIN, E. E.;
- TSATSUL'NIKOV, A. F.;
- MUSIKHIN, YU. G.;
- VLASOV, A. S.;
- LEDENTSOV, N. N.;
- MINTAIROV, A. M.;
- SUN, K.;
- MERZ, J.
- Article
17
- Particle & Particle Systems Characterization, 2025, v. 42, n. 1, p. 1, doi. 10.1002/ppsc.202400114
- Pandit, Bhishma;
- Cho, Jaehee
- Article
18
- Particle & Particle Systems Characterization, 2022, v. 39, n. 3, p. 1, doi. 10.1002/ppsc.202100150
- Lu, Feifei;
- Liu, Lei;
- Tian, Jian
- Article
20
- Annalen der Physik, 2015, v. 527, n. 5/6, p. 327, doi. 10.1002/andp.201500802
- Article
21
- Annalen der Physik, 2015, v. 527, n. 5/6, p. 350, doi. 10.1002/andp.201500804
- Article
22
- Advanced Functional Materials, 2016, v. 26, n. 29, p. 5307, doi. 10.1002/adfm.201600962
- Liu, Haitao;
- Hua, Qilin;
- Yu, Ruomeng;
- Yang, Yuchao;
- Zhang, Taiping;
- Zhang, Yingjiu;
- Pan, Caofeng
- Article
23
- Advanced Functional Materials, 2014, v. 24, n. 41, p. 6503, doi. 10.1002/adfm.201401438
- Xiong, Kanglin;
- Park, Sung Hyun;
- Song, Jie;
- Yuan, Ge;
- Chen, Danti;
- Leung, Benjamin;
- Han, Jung
- Article
24
- Advanced Functional Materials, 2014, v. 24, n. 28, p. 4491, doi. 10.1002/adfm.201470185
- Bayram, Can;
- Ott, John A.;
- Shiu, Kuen‐Ting;
- Cheng, Cheng‐Wei;
- Zhu, Yu;
- Kim, Jeehwan;
- Razeghi, Manijeh;
- Sadana, Devendra K.
- Article
25
- Advanced Functional Materials, 2014, v. 24, n. 21, p. 3162, doi. 10.1002/adfm.201303671
- Lin, Yen‐Ting;
- Yeh, Ting‐Wei;
- Nakajima, Yoshitake;
- Dapkus, P. Daniel
- Article
26
- Advanced Functional Materials, 2014, v. 24, n. 16, p. 2412, doi. 10.1002/adfm.201470104
- ElAfandy, Rami T.;
- Majid, Mohammed A.;
- Ng, Tien Khee;
- Zhao, Lan;
- Cha, Dongkyu;
- Ooi, Boon S.
- Article
27
- Journal of Thermal Analysis & Calorimetry, 2008, v. 91, n. 1, p. 329, doi. 10.1007/s10973-006-8317-4
- Zięborak-Tomaszkiewicz, Iwona;
- Utzig, Ewa;
- Gierycz, P.
- Article
28
- Journal of Thermal Analysis & Calorimetry, 2006, v. 83, n. 3, p. 611, doi. 10.1007/s10973-005-7421-1
- Zięborak-Tomaszkiewicz, Iwona
- Article
29
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 76, doi. 10.1007/s10854-007-9448-5
- Danieluk, Dominik;
- Bradley, Ann L.;
- Mitra, Anirban;
- O'Reilly, Lisa;
- Lucas, Olibanji F.;
- Cowley, Aidan;
- McNally, Patrick J.;
- Foy, Barry;
- McGlynn, Enda
- Article
30
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 9, doi. 10.1007/s10854-008-9586-4
- Reddy, V. Rajagopal;
- Sang-Ho Kim;
- Hyun-Gi Hong;
- Sang-Won Yoon;
- Jae-Pyoung Ahn;
- Tae-Yeon Seong
- Article
31
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 14, doi. 10.1007/s10854-008-9587-3
- Majid, Abdul;
- Israr, M.;
- Jianjun Zhu;
- Ali, Akbar
- Article
32
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1156, doi. 10.1007/s10854-007-9504-1
- Bergaoui, M. S.;
- Boufaden, T.;
- Guermazi, S.;
- Agnel, S.;
- Toureille, A.;
- El Jani, B.
- Article
33
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 208, doi. 10.1007/s10854-008-9648-7
- Oliver, R. A.;
- Kappers, M. J.;
- McAleese, C.;
- Datta, R.;
- Sumner, J.;
- Humphreys, C. J.
- Article
34
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 863, doi. 10.1007/s10854-007-9526-8
- Zhiguo Wang;
- Xiaotao Zu;
- Li Yang;
- Fei Gao;
- Weber, William J.
- Article
35
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 5, p. 471, doi. 10.1007/s10854-007-9365-7
- Article
36
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 195, doi. 10.1007/s10854-007-9331-4
- Tilak, V.;
- Jiang, J.;
- Batoni, P.;
- Knobloch, A.
- Article
37
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 143, doi. 10.1007/s10854-007-9307-4
- Lankinen, A.;
- Lang, T.;
- Suihkonen, S.;
- Svensk, O.;
- Säynätjoki, A.;
- Tuomi, T. O.;
- McNally, P. J.;
- Odnoblyudov, M.;
- Bougrov, V.;
- Danilewsky, A. N.;
- Bergman, P.;
- Simon, R.
- Article
38
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 107, doi. 10.1007/s10854-007-9160-5
- Koo, A.;
- Budde, F.;
- Ruck, B. J.;
- Trodahl, H. J.;
- Bittar, A.;
- Preston, A. R. H.
- Article
39
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 267, doi. 10.1007/s10854-007-9209-5
- Article
40
- Journal of Materials Science Letters, 2003, v. 22, n. 11, p. 831, doi. 10.1023/A:1023968310697
- Z. J. Li;
- H. J. Li;
- K. Z. Li;
- Q. J. Gong;
- X. B. Xiong
- Article
41
- Microscopy & Microanalysis, 2025, v. 31, n. 1, p. 1, doi. 10.1093/mam/ozae124
- Mandal, Arka;
- Beausir, Benoît;
- Guyon, Julien;
- Taupin, Vincent;
- Guitton, Antoine
- Article
42
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.258
- Schmidt, Ute;
- Gonzales, Alfredo;
- Limpoco, Ted;
- Biere, Niklas;
- Englert, Jan;
- Meyer, Thomas
- Article
43
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.069
- Balog, Andrew R;
- Bisht, Anuj;
- Jesenovec, Jani;
- Dutton, Benjamin;
- McCloy, John;
- Alem, Nasim
- Article
44
- Microscopy & Microanalysis, 2024, v. 30, n. 2, p. 208, doi. 10.1093/mam/ozae028
- Sarkar, Maruf;
- Adams, Francesca;
- Dar, Sidra A.;
- Penn, Jordan;
- Yihong Ji;
- Gundimeda, Abhiram;
- Tongtong Zhu;
- Chaowang Liu;
- Hirshy, Hassan;
- Massabuau, Fabien C.-P.;
- O'Hanlon, Thomas;
- Kappers, Menno J.;
- Ghosh, Saptarsi;
- Kusch, Gunnar;
- Oliver, Rachel A.
- Article
45
- 2023
- Reyes-González, Joaquin E;
- Dellby, Niklas;
- Plotkin-Swing, Benjamin;
- Wang, Ping;
- Pandey, Ayush;
- Mi, Zetian;
- Lagos, Maureen J
- Abstract
46
- Microscopy & Microanalysis, 2019, p. 1554, doi. 10.1017/S1431927618008255
- Article
47
- Microscopy & Microanalysis, 2012, v. 18, n. 6, p. 1220, doi. 10.1017/S1431927612013414
- Demers, Hendrix;
- Poirier-Demers, Nicolas;
- Phillips, Matthew R.;
- de Jonge, Niels;
- Drouin, Dominique
- Article
48
- Microscopy & Microanalysis, 2012, v. 18, n. 4, p. 905, doi. 10.1017/S1431927612001134
- Carvajal, Joan J.;
- Bilousov, Oleksandr V.;
- Drouin, Dominique;
- Aguiló, Magdalena;
- Díaz, Francesc;
- Rojo, J. Carlos
- Article
49
- 2012
- Stevens-Kalceff, M.A.;
- Tiginyanu, I.M.
- Abstract
50
- 2012
- Lozano, J.G.;
- Nellist, P.;
- Guerrero-Lebrero, M.;
- Galindo, P.
- Abstract