Works matching DE "FERROELECTRIC thin films"
1
- Surfaces (2571-9637), 2025, v. 8, n. 2, p. 37, doi. 10.3390/surfaces8020037
- Zhemerov, Evgeny;
- Buryakov, Arseniy;
- Seregin, Dmitry;
- Ivanov, Maxim
- Article
2
- Nanomaterials (2079-4991), 2025, v. 15, n. 12, p. 920, doi. 10.3390/nano15120920
- Lv, Fuyu;
- Liu, Chao;
- Cheng, Hongbo;
- Ouyang, Jun
- Article
3
- International Journal of Nanoscience, 2023, v. 22, n. 6, p. 1, doi. 10.1142/S0219581X23990016
- Article
4
- Advanced Functional Materials, 2016, v. 26, n. 28, p. 5166, doi. 10.1002/adfm.201600468
- Beekman, C.;
- Siemons, W.;
- Chi, M.;
- Balke, N.;
- Howe, J. Y.;
- Ward, T. Z.;
- Maksymovych, P.;
- Budai, J. D.;
- Tischler, J. Z.;
- Xu, R.;
- Liu, W.;
- Christen, H. M.
- Article
5
- Advanced Functional Materials, 2016, v. 26, n. 17, p. 2882, doi. 10.1002/adfm.201505065
- Solmaz, Alim;
- Huijben, Mark;
- Koster, Gertjan;
- Egoavil, Ricardo;
- Gauquelin, Nicolas;
- Van Tendeloo, Gustaaf;
- Verbeeck, Jo;
- Noheda, Beatriz;
- Rijnders, Guus
- Article
6
- Advanced Functional Materials, 2014, v. 24, n. 19, p. 2844, doi. 10.1002/adfm.201302946
- Deepak, Nitin;
- Caro, Miguel A.;
- Keeney, Lynette;
- Pemble, Martyn E.;
- Whatmore, Roger W.
- Article
7
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 7, p. 614, doi. 10.1007/s10854-008-9774-2
- Wang, Bo;
- Yang, Chuan-ren;
- Chen, Hong-wei;
- Zhang, Ji-hua;
- Yu, An;
- Zhang, Rui-ting
- Article
8
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 2, p. 113, doi. 10.1007/s10854-008-9636-y
- Ying Zhou;
- Guangda Hu;
- Suhua Fan;
- Weibing Wu;
- Jing Yan;
- Changhong Yang;
- Xi Wang
- Article
9
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 11, p. 1031, doi. 10.1007/s10854-007-9444-9
- Xi Wang;
- Pilong Wang;
- Guangda Hu;
- Jing Yan;
- Xuemei Chen;
- Yanxia Ding;
- Weibing Wu;
- Suhua Fan
- Article
10
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 749, doi. 10.1007/s10854-007-9402-6
- Kim, Y. Y.;
- Ahn, C. H.;
- Kang, S. W.;
- Kong, B. H.;
- Mohanta, S. K.;
- Cho, H. K.;
- Lee, J. Y.;
- Kim, H. S.
- Article
11
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 1, p. 61, doi. 10.1007/s10854-007-9151-6
- Wencheng Hu;
- Chuanren Yang;
- Xiaobo Liu;
- Wei He;
- Xianzhong Tang
- Article
12
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 1, p. 85, doi. 10.1007/s10854-007-9353-y
- Ki-Deuk Min;
- Jongwon Lee;
- Taek Lee;
- Jong Chun;
- Hong-Kee Lee;
- Dae Kim;
- Yong Choi;
- Bong Cho
- Article
13
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 8, p. 887, doi. 10.1007/s10854-006-9062-y
- Wenjian Leng;
- Chuanren Yang;
- Hong Ji;
- Jihua Zhang;
- Jinlong Tang;
- Hongwei Chen;
- Lifeng Gao
- Article
14
- Journal of Materials Science Letters, 2003, v. 22, n. 23, p. 1677, doi. 10.1023/B:JMSL.0000004646.73243.16
- Lee, Won Gyu;
- Woo, Seong Ihl
- Article
15
- Journal of Materials Science Letters, 2003, v. 22, n. 10, p. 743, doi. 10.1023/A:1023704026723
- Zheng, X. J.;
- Zhou, Y. C.;
- Liu, J. M.;
- Li, A. D.
- Article
16
- Journal of Materials Science Letters, 2003, v. 22, n. 8, p. 591, doi. 10.1023/A:1023346428821
- Surthi, S.;
- Kotru, S.;
- Pandey, R. K.
- Article
17
- Journal of Materials Science Letters, 2003, v. 22, n. 7, p. 535, doi. 10.1023/A:1022994521453
- Kim, J. W.;
- Park, J. D.;
- Choi, J. H.;
- Oh, T. S.
- Article
18
- Journal of Materials Science Letters, 2003, v. 22, n. 5, p. 345, doi. 10.1023/A:1022684807977
- Zhang, Y.;
- Wang, H.;
- Hou, Y.;
- Shang, S. X.;
- Xu, X. H.;
- Wang, M.;
- Qi, S.K.
- Article
19
- Journal of Materials Science Letters, 2003, v. 22, n. 1, p. 5, doi. 10.1023/A:1021705619321
- Yang, P.;
- Carroll, D. L.;
- Ballato, J.
- Article
20
- Microscopy & Microanalysis, 2025, v. 31, n. 2, p. 1, doi. 10.1093/mam/ozaf019
- Diebold, Alain C;
- Ophus, Colin;
- Kordijazi, Amir;
- Consiglio, Steven;
- Lombardo, Sarah;
- Triyoso, Dina;
- Tapily, Kandabara;
- Mian, Anna;
- Shankar, Nithin B V I;
- Morávek, Tomáš;
- Chandran, Narendraraj;
- Stroud, Robert;
- Leusink, Gert
- Article
21
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.888
- Bhalla-Levine, Aviram;
- Park, Kunwoo;
- Park, Jungwon;
- Ercius, Peter;
- Miao, Jianwei
- Article
22
- 2024
- Ngo, Ann;
- Jagadish, Koushik;
- Avishai, Amir;
- Chae, Hyun Uk;
- Ramesh, Maya;
- Kumarasubramanian, Harish;
- Kapadia, Rehan;
- Schlom, Darrell G;
- Ravichandran, Jayakanth;
- Shao, Yu-Tsun
- Editorial
23
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.021
- Topore, Geri;
- Douglas, James;
- Keeney, Lynette;
- Gault, Baptiste;
- Conroy, Michele
- Article
24
- 2023
- Calderon V, S;
- Dickey, Elizabeth C
- Abstract
25
- Microscopy & Microanalysis, 2019, p. f1, doi. 10.1017/S1431927618012357
- Article
26
- Microscopy & Microanalysis, 2019, p. 2236, doi. 10.1017/S1431927618011662
- Olivas-Ortega, D. E.;
- Ramos-Cano, J.;
- Talamantes-Soto, R. P.;
- Lopez-Melendez, C.;
- Hurtado-Macias, A.
- Article
27
- Microscopy & Microanalysis, 2019, p. 104, doi. 10.1017/S1431927618001010
- Li, Lin-Ze;
- Jokisaari, Jacob;
- Zhang, Yi;
- Cheng, Xiao-Xing;
- Chen, Long-Qing;
- Heikes, Colin;
- Schlom, Darrell;
- Pan, Xiao-Qing
- Article
28
- 2011
- Mabuchi, Y;
- Chaudhuri, K;
- Evans, J;
- Browning, N;
- Okamura, S
- Abstract
29
- 2011
- Jokisaari, J;
- Nelson, C;
- Kim, S;
- Gao, P;
- Baek, S;
- Eom, C;
- Pan, X
- Abstract
30
- Microscopy & Microanalysis, 2011, v. 17, n. S2, p. 1400, doi. 10.1017/S1431927611007872
- Su, D;
- Vaz, C;
- Segal, Y;
- Walker, F;
- Ahn, C;
- Han, M-G;
- Sawicki, M;
- Broadbridge, C
- Article
31
- Microscopy & Microanalysis, 2008, v. 14, n. S3, p. 53, doi. 10.1017/S143192760808937X
- Rodrigues, S.A.S.;
- Khodorov, A.;
- Pereira, M.;
- Gomes, M.J.M.
- Article
32
- Russian Journal of Nondestructive Testing, 2003, v. 39, n. 3, p. 223, doi. 10.1023/B:RUNT.0000009076.80881.f8
- Gobov, Yu. L.;
- Lavrent'ev, A. G.;
- Ivashova, K. A.
- Article
33
- Measurement Techniques, 2016, v. 59, n. 4, p. 423, doi. 10.1007/s11018-016-0983-4
- Esipov, Yu.;
- Biryukov, S.;
- Masychev, S.;
- Mukhortov, V.
- Article
34
- Journal of South China Normal University (Natural Science Edition) / Huanan Shifan Daxue Xuebao (Ziran Kexue Ban), 2024, v. 56, n. 4, p. 54, doi. 10.6054/j.jscnun.2024050
- 冀思雨;
- 樊晓雨;
- 曹以琳;
- 高珺怡;
- 杨帆;
- 宋建民;
- 张宪贵1.
- Article
35
- Journal of South China Normal University (Natural Science Edition) / Huanan Shifan Daxue Xuebao (Ziran Kexue Ban), 2022, v. 54, n. 4, p. 1, doi. 10.6054/j.jscnun.2022051
- Article
36
- Journal of Jilin University (Science Edition) / Jilin Daxue Xuebao (Lixue Ban), 2021, v. 59, n. 2, p. 421, doi. 10.13413/j.cnki.jdxblxb.2020256
- Article
37
- Ferroelectrics, 2009, v. 387, n. 1, p. 154, doi. 10.1080/00150190902966693
- JIANG, S. W.;
- LI, Y. R.;
- LI, R. G.;
- TAN, L. F.;
- XIONG, N. D.
- Article
38
- Ferroelectrics, 2009, v. 385, n. 1, p. 15, doi. 10.1080/00150190902881702
- DING SHIHUA;
- YANG XIAOJING;
- YAO XI
- Article
39
- Ferroelectrics, 2009, v. 385, n. 1, p. 27, doi. 10.1080/00150190902886776
- SUN, J. B.;
- QU, J.;
- WANG, W.;
- LU, H. X.;
- CHEN, X. B.
- Article
40
- Ferroelectrics, 2009, v. 385, n. 1, p. 46, doi. 10.1080/00150190902888632
- KAI-HUANG CHEN;
- CHIEN-CHEN DIAO;
- CHENG-FU YANG;
- BING-XUN WANG
- Article
41
- Ferroelectrics, 2009, v. 385, n. 1, p. 54, doi. 10.1080/00150190902888699
- WEN-CHENG TZOU;
- KAI-HUANG CHEN;
- CHENG-FU YANG;
- TZUNG-LUEN TSAI
- Article
42
- Ferroelectrics, 2009, v. 385, n. 1, p. 62, doi. 10.1080/00150190902888731
- KAI-HUANG CHEN;
- WEN-CHENG TZOU;
- CHENG-FU YANG;
- CHIEH-JEN CHENG
- Article
43
- Ferroelectrics, 2009, v. 380, n. 1, p. 30, doi. 10.1080/00150190902870101
- Meng-Han Lin;
- Ming-Chi Wu;
- Chun-Chieh Lin;
- Tseung-Yuen Tseng
- Article
44
- Ferroelectrics, 2009, v. 380, n. 1, p. 89, doi. 10.1080/00150190902873261
- Cherng, J. S.;
- Chen, T. Y.;
- Lin, C. M.
- Article
45
- Ferroelectrics, 2009, v. 380, n. 1, p. 97, doi. 10.1080/00150190902873295
- Tsung-Her Yeh;
- Suresh, M. B.;
- Jun-Nan Shen;
- Jyh-Cheng Yu;
- Chen-Chia Chou
- Article
46
- Ferroelectrics, 2009, v. 380, n. 1, p. 106, doi. 10.1080/00150190902873345
- Yamaguchi, Masaki;
- Oba, Tomohiro;
- Masuda, Yoichiro
- Article
47
- Ferroelectrics, 2008, v. 371, n. 1, p. 3, doi. 10.1080/00150190802384500
- Scott, J. F.;
- Morrison, F. D.
- Article
48
- Ferroelectrics, 2008, v. 362, n. 1, p. 41, doi. 10.1080/00150190801998128
- Gensbittel, A.;
- Dégardin, A. F.;
- Guilloux-Viry, M.;
- Kreisler, A. J.
- Article
49
- Ferroelectrics, 2008, v. 362, n. 1, p. 48, doi. 10.1080/00150190801998151
- Gensbittel, A.;
- Dégardin, A. F.;
- Weiss, F.;
- Kreisler, A. J.
- Article
50
- Ferroelectrics, 2008, v. 362, n. 1, p. 128, doi. 10.1080/00150190802007051
- Detalle, M.;
- Wang, G. S.;
- Fribourg-Blanc, E.;
- Rémiens, D.
- Article