Works matching DE "FERROELECTRIC thin films"

Results: 1305

Microstructural Evolution and Domain Engineering in Porous PZT Thin Films.

Published in:

Surfaces (2571-9637), 2025, v. 8, n. 2, p. 37, doi. 10.3390/surfaces8020037

By:

Zhemerov, Evgeny;
Buryakov, Arseniy;
Seregin, Dmitry;
Ivanov, Maxim

Publication type:

Article

Achieving a High Energy Storage Performance in Grain Engineered (Ba,Sr)(Zr,Ti)O 3 Ferroelectric Films Integrated on Si.

Published in:

Nanomaterials (2079-4991), 2025, v. 15, n. 12, p. 920, doi. 10.3390/nano15120920

By:

Lv, Fuyu;
Liu, Chao;
Cheng, Hongbo;
Ouyang, Jun

Publication type:

Article

Author Index Volume 22.

Published in:: International Journal of Nanoscience, 2023, v. 22, n. 6, p. 1, doi. 10.1142/S0219581X23990016
Publication type:: Article

Ferroelectric Self-Poling, Switching, and Monoclinic Domain Configuration in BiFeO3 Thin Films.

Published in:

Advanced Functional Materials, 2016, v. 26, n. 28, p. 5166, doi. 10.1002/adfm.201600468

By:

Beekman, C.;
Siemons, W.;
Chi, M.;
Balke, N.;
Howe, J. Y.;
Ward, T. Z.;
Maksymovych, P.;
Budai, J. D.;
Tischler, J. Z.;
Xu, R.;
Liu, W.;
Christen, H. M.

Publication type:

Article

Domain Selectivity in BiFeO3 Thin Films by Modified Substrate Termination.

Published in:

Advanced Functional Materials, 2016, v. 26, n. 17, p. 2882, doi. 10.1002/adfm.201505065

By:

Solmaz, Alim;
Huijben, Mark;
Koster, Gertjan;
Egoavil, Ricardo;
Gauquelin, Nicolas;
Van Tendeloo, Gustaaf;
Verbeeck, Jo;
Noheda, Beatriz;
Rijnders, Guus

Publication type:

Article

Interesting Evidence for Template-Induced Ferroelectric Behavior in Ultra-Thin Titanium Dioxide Films Grown on (110) Neodymium Gallium Oxide Substrates.

Published in:

Advanced Functional Materials, 2014, v. 24, n. 19, p. 2844, doi. 10.1002/adfm.201302946

By:

Deepak, Nitin;
Caro, Miguel A.;
Keeney, Lynette;
Pemble, Martyn E.;
Whatmore, Roger W.

Publication type:

Article

Effects of oxygen to argon ratio on Ba(Zr0.2Ti0.8)O3 thin films prepared by RF magnetron sputtering.

Published in:

Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 7, p. 614, doi. 10.1007/s10854-008-9774-2

By:

Wang, Bo;
Yang, Chuan-ren;
Chen, Hong-wei;
Zhang, Ji-hua;
Yu, An;
Zhang, Rui-ting

Publication type:

Article

Preparation and ferroelectric properties of predominantly (100)-oriented SrBi4Ti4O15 ferroelectric thin film on Pt(111)/TiO2/SiO2/Si(100) substrate.

Published in:

Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 2, p. 113, doi. 10.1007/s10854-008-9636-y

By:

Ying Zhou;
Guangda Hu;
Suhua Fan;
Weibing Wu;
Jing Yan;
Changhong Yang;
Xi Wang

Publication type:

Article

Preparation and ferroelectric properties of (124)-oriented SrBi4Ti4O15 ferroelectric thin film on (110)-oriented LaNiO3 electrode.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 11, p. 1031, doi. 10.1007/s10854-007-9444-9

By:

Xi Wang;
Pilong Wang;
Guangda Hu;
Jing Yan;
Xuemei Chen;
Yanxia Ding;
Weibing Wu;
Suhua Fan

Publication type:

Article

Temperature dependence of ZnO thin films grown on Si substrate.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 749, doi. 10.1007/s10854-007-9402-6

By:

Kim, Y. Y.;
Ahn, C. H.;
Kang, S. W.;
Kong, B. H.;
Mohanta, S. K.;
Cho, H. K.;
Lee, J. Y.;
Kim, H. S.

Publication type:

Article

Characterization of Sn-doped BST thin films on LaNiO3–coated Si substrate.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 1, p. 61, doi. 10.1007/s10854-007-9151-6

By:

Wencheng Hu;
Chuanren Yang;
Xiaobo Liu;
Wei He;
Xianzhong Tang

Publication type:

Article

Influences of particle size upon room temperature structure of BaTiO3 thin films on p-Si substrates.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 1, p. 85, doi. 10.1007/s10854-007-9353-y

By:

Ki-Deuk Min;
Jongwon Lee;
Taek Lee;
Jong Chun;
Hong-Kee Lee;
Dae Kim;
Yong Choi;
Bong Cho

Publication type:

Article

Linear and nonlinear optical properties of RF sputtered (Pb,La)(Zr,Ti)O3 ferroelectric thin films.

Published in:

Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 8, p. 887, doi. 10.1007/s10854-006-9062-y

By:

Wenjian Leng;
Chuanren Yang;
Hong Ji;
Jihua Zhang;
Jinlong Tang;
Hongwei Chen;
Lifeng Gao

Publication type:

Article

Preparation of PbZrO3 thin films by plasma enhanced metalorganic chemical vapor deposition.

Published in:

Journal of Materials Science Letters, 2003, v. 22, n. 23, p. 1677, doi. 10.1023/B:JMSL.0000004646.73243.16

By:

Lee, Won Gyu;
Woo, Seong Ihl

Publication type:

Article

Determination of interfacial fracture energy of PZT ferroelectric thin films by nano-scratch technique.

Published in:

Journal of Materials Science Letters, 2003, v. 22, n. 10, p. 743, doi. 10.1023/A:1023704026723

By:

Zheng, X. J.;
Zhou, Y. C.;
Liu, J. M.;
Li, A. D.

Publication type:

Article

Preparation and electrical properties of ferroelectric SbSI films by pulsed laser deposition.

Published in:

Journal of Materials Science Letters, 2003, v. 22, n. 8, p. 591, doi. 10.1023/A:1023346428821

By:

Surthi, S.;
Kotru, S.;
Pandey, R. K.

Publication type:

Article

Electrical properties of the Pt/Sr0.85Bi2.4Ta2O9/TiO2/Si structure with variation of the Sr0.85Bi2.4Ta2O9 film thickness.

Published in:

Journal of Materials Science Letters, 2003, v. 22, n. 7, p. 535, doi. 10.1023/A:1022994521453

By:

Kim, J. W.;
Park, J. D.;
Choi, J. H.;
Oh, T. S.

Publication type:

Article

X-ray photoelectron spectroscopy study of lanthanum-substituted bismuth titanate thin film.

Published in:

Journal of Materials Science Letters, 2003, v. 22, n. 5, p. 345, doi. 10.1023/A:1022684807977

By:

Zhang, Y.;
Wang, H.;
Hou, Y.;
Shang, S. X.;
Xu, X. H.;
Wang, M.;
Qi, S.K.

Publication type:

Article

AC conduction mechanism of SrBi2Ta2O9 thin films below room temperature.

Published in:

Journal of Materials Science Letters, 2003, v. 22, n. 1, p. 5, doi. 10.1023/A:1021705619321

By:

Yang, P.;
Carroll, D. L.;
Ballato, J.

Publication type:

Article

Template Matching Approach for Automated Determination of Crystal Phase and Orientation of Grains in 4D-STEM Precession Electron Diffraction Data for Hafnium Zirconium Oxide Ferroelectric Thin Films.

Published in:

Microscopy & Microanalysis, 2025, v. 31, n. 2, p. 1, doi. 10.1093/mam/ozaf019

By:

Diebold, Alain C;
Ophus, Colin;
Kordijazi, Amir;
Consiglio, Steven;
Lombardo, Sarah;
Triyoso, Dina;
Tapily, Kandabara;
Mian, Anna;
Shankar, Nithin B V I;
Morávek, Tomáš;
Chandran, Narendraraj;
Stroud, Robert;
Leusink, Gert

Publication type:

Article

Atomic Electron Tomography of Thin Films.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.888

By:

Bhalla-Levine, Aviram;
Park, Kunwoo;
Park, Jungwon;
Ercius, Peter;
Miao, Jianwei

Publication type:

Article

Non-destructive Imaging of Polar Domains and Crystallographic Symmetry in The Scanning Electron Microscope.

Published in:

2024

By:

Ngo, Ann;
Jagadish, Koushik;
Avishai, Amir;
Chae, Hyun Uk;
Ramesh, Maya;
Kumarasubramanian, Harish;
Kapadia, Rehan;
Schlom, Darrell G;
Ravichandran, Jayakanth;
Shao, Yu-Tsun

Publication type:

Editorial

How Can 4D-STEM Inform Atom Probe Experiments? Relating Structure and Composition of Multiferroic Oxides at the Atomic Scale.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.021

By:

Topore, Geri;
Douglas, James;
Keeney, Lynette;
Gault, Baptiste;
Conroy, Michele

Publication type:

Article

Structural Modification in B-doped AlN Ferroelectric Films by STEM-DPC.

Published in:

2023

By:

Calderon V, S;
Dickey, Elizabeth C

Publication type:

Abstract

MAM volume 24 issue s1 Cover and Front matter.

Published in:: Microscopy & Microanalysis, 2019, p. f1, doi. 10.1017/S1431927618012357
Publication type:: Article

Nano-Mechanical and Piezoelectric Properties on PZT Thin Films.

Published in:

Microscopy & Microanalysis, 2019, p. 2236, doi. 10.1017/S1431927618011662

By:

Olivas-Ortega, D. E.;
Ramos-Cano, J.;
Talamantes-Soto, R. P.;
Lopez-Melendez, C.;
Hurtado-Macias, A.

Publication type:

Article

Defect-assisted Reorganization of Ferroelectric Domain Walls Revealed by Aberration-corrected Electron Microscopy.

Published in:

Microscopy & Microanalysis, 2019, p. 104, doi. 10.1017/S1431927618001010

By:

Li, Lin-Ze;
Jokisaari, Jacob;
Zhang, Yi;
Cheng, Xiao-Xing;
Chen, Long-Qing;
Heikes, Colin;
Schlom, Darrell;
Pan, Xiao-Qing

Publication type:

Article

Microstructure Analysis of Thickness Effects in Thin Ferroelectric Polymer Film VDF/TrFE.

Published in:

2011

By:

Mabuchi, Y;
Chaudhuri, K;
Evans, J;
Browning, N;
Okamura, S

Publication type:

Abstract

Study of Thin-Film Ferroelectric Heterostructures by TEM and PFM.

Published in:

2011

By:

Jokisaari, J;
Nelson, C;
Kim, S;
Gao, P;
Baek, S;
Eom, C;
Pan, X

Publication type:

Abstract

Domain Pinning and Valence State Switching in Pb(Zr0.2Ti0.8)O3/La0.8Sr0.2MnO3 Heterostructures.

Published in:

Microscopy & Microanalysis, 2011, v. 17, n. S2, p. 1400, doi. 10.1017/S1431927611007872

By:

Su, D;
Vaz, C;
Segal, Y;
Walker, F;
Ahn, C;
Han, M-G;
Sawicki, M;
Broadbridge, C

Publication type:

Article

Microstructure of Compositionally Graded PZT films Grown by Pulsed Laser Deposition.

Published in:

Microscopy & Microanalysis, 2008, v. 14, n. S3, p. 53, doi. 10.1017/S143192760808937X

By:

Rodrigues, S.A.S.;
Khodorov, A.;
Pereira, M.;
Gomes, M.J.M.

Publication type:

Article

Methods of Visualization of the Magnetic Field Using Single-Crystal Ferrite-Garnet Films.

Published in:

Russian Journal of Nondestructive Testing, 2003, v. 39, n. 3, p. 223, doi. 10.1023/B:RUNT.0000009076.80881.f8

By:

Gobov, Yu. L.;
Lavrent'ev, A. G.;
Ivashova, K. A.

Publication type:

Article

Development of Piezoelectric Dynamic Deformation Transducers Based on Hot Polarization of Lead Zirconate-Titanate Ferroelectric Films.

Published in:

Measurement Techniques, 2016, v. 59, n. 4, p. 423, doi. 10.1007/s11018-016-0983-4

By:

Esipov, Yu.;
Biryukov, S.;
Masychev, S.;
Mukhortov, V.

Publication type:

Article

外延 Ba0.6 Sr0.4TiO3 铁电薄膜的制备及介电储能性能.

Published in:

Journal of South China Normal University (Natural Science Edition) / Huanan Shifan Daxue Xuebao (Ziran Kexue Ban), 2024, v. 56, n. 4, p. 54, doi. 10.6054/j.jscnun.2024050

By:

冀思雨;
樊晓雨;
曹以琳;
高珺怡;
杨帆;
宋建民;
张宪贵1.

Publication type:

Article

应变诱导外延Ba0.6Sr0.4TiO3薄膜铁电介电性能的频率依赖特性.

Published in:

Journal of South China Normal University (Natural Science Edition) / Huanan Shifan Daxue Xuebao (Ziran Kexue Ban), 2022, v. 54, n. 4, p. 1, doi. 10.6054/j.jscnun.2022051

By:

张宪贵;
宋建民;
康艳霜;
史孟飞

Publication type:

Article

钛掺杂BiFeO3 光催化剂的制备及其催化性能.

Published in:

Journal of Jilin University (Science Edition) / Jilin Daxue Xuebao (Lixue Ban), 2021, v. 59, n. 2, p. 421, doi. 10.13413/j.cnki.jdxblxb.2020256

By:

孟帅;
孙鹏凯;
沈延群;
孙军;
王丽丽;
谭芳

Publication type:

Article

Structure and Dielectric Properties of Bi1.5MgNb1.5O7 Thin Films Sputtered on Pt-Coated Sapphire Substrates.

Published in:

Ferroelectrics, 2009, v. 387, n. 1, p. 154, doi. 10.1080/00150190902966693

By:

JIANG, S. W.;
LI, Y. R.;
LI, R. G.;
TAN, L. F.;
XIONG, N. D.

Publication type:

Article

The Influence of Ni Doping on The Properties of BST Ferroelectric Thin Film.

Published in:

Ferroelectrics, 2009, v. 385, n. 1, p. 15, doi. 10.1080/00150190902881702

By:

DING SHIHUA;
YANG XIAOJING;
YAO XI

Publication type:

Article

Structure and Ferroelectric Properties of Bi5Fe0.75Co0.25Ti3O15 Thin Films.

Published in:

Ferroelectrics, 2009, v. 385, n. 1, p. 27, doi. 10.1080/00150190902886776

By:

SUN, J. B.;
QU, J.;
WANG, W.;
LU, H. X.;
CHEN, X. B.

Publication type:

Article

Electrical Characteristics of Bi4Ti3O12 Ferroelectric Thin Films Annealed under Different Temperature for Applications in Nonvolatile Memory Devices.

Published in:

Ferroelectrics, 2009, v. 385, n. 1, p. 46, doi. 10.1080/00150190902888632

By:

KAI-HUANG CHEN;
CHIEN-CHEN DIAO;
CHENG-FU YANG;
BING-XUN WANG

Publication type:

Article

Memory Properties of SrBi2Ta2O9 Ferroelectric Thin Film Prepared on SiO2/Si Substrate.

Published in:

Ferroelectrics, 2009, v. 385, n. 1, p. 54, doi. 10.1080/00150190902888699

By:

WEN-CHENG TZOU;
KAI-HUANG CHEN;
CHENG-FU YANG;
TZUNG-LUEN TSAI

Publication type:

Article

Switching Properties of Ba(Zr0.1Ti0.9)O3 Ferroelectric Films Under Various Retention Cycles for Application in Nonvolatile Memory Devices.

Published in:

Ferroelectrics, 2009, v. 385, n. 1, p. 62, doi. 10.1080/00150190902888731

By:

KAI-HUANG CHEN;
WEN-CHENG TZOU;
CHENG-FU YANG;
CHIEH-JEN CHENG

Publication type:

Article

Nonpolar Bistable Resistive Switching Behaviors of Bismuth Titanate Oxide Thin Film.

Published in:

Ferroelectrics, 2009, v. 380, n. 1, p. 30, doi. 10.1080/00150190902870101

By:

Meng-Han Lin;
Ming-Chi Wu;
Chun-Chieh Lin;
Tseung-Yuen Tseng

Publication type:

Article

Two-Step Reactive Sputtering of Piezoelectric AIN Thin Films on Mo Electrodes for FBAR Applications.

Published in:

Ferroelectrics, 2009, v. 380, n. 1, p. 89, doi. 10.1080/00150190902873261

By:

Cherng, J. S.;
Chen, T. Y.;
Lin, C. M.

Publication type:

Article

Chemical Reactions During Wet-Etching Process of LSMO/PZT/LSMO-Structured Device Fabrication.

Published in:

Ferroelectrics, 2009, v. 380, n. 1, p. 97, doi. 10.1080/00150190902873295

By:

Tsung-Her Yeh;
Suresh, M. B.;
Jun-Nan Shen;
Jyh-Cheng Yu;
Chen-Chia Chou

Publication type:

Article

Fabrication of BIT Films by Alcohol-Related Ink and Its Properties.

Published in:

Ferroelectrics, 2009, v. 380, n. 1, p. 106, doi. 10.1080/00150190902873345

By:

Yamaguchi, Masaki;
Oba, Tomohiro;
Masuda, Yoichiro

Publication type:

Article

Ferroelectric Thin-Film Devices.

Published in:

Ferroelectrics, 2008, v. 371, n. 1, p. 3, doi. 10.1080/00150190802384500

By:

Scott, J. F.;
Morrison, F. D.

Publication type:

Article

In-Plane Tunability of Coplanar Microwave Devices by SrBi2Nb2O9 Ferroelectric Thin Films.

Published in:

Ferroelectrics, 2008, v. 362, n. 1, p. 41, doi. 10.1080/00150190801998128

By:

Gensbittel, A.;
Dégardin, A. F.;
Guilloux-Viry, M.;
Kreisler, A. J.

Publication type:

Article

Tunable Coplanar Waveguide Microwave Devices on MOCVD-SrTiO3 Thin Films.

Published in:

Ferroelectrics, 2008, v. 362, n. 1, p. 48, doi. 10.1080/00150190801998151

By:

Gensbittel, A.;
Dégardin, A. F.;
Weiss, F.;
Kreisler, A. J.

Publication type:

Article

Annealing Temperature Effects on PMN-PT Thin Film.

Published in:

Ferroelectrics, 2008, v. 362, n. 1, p. 128, doi. 10.1080/00150190802007051

By:

Detalle, M.;
Wang, G. S.;
Fribourg-Blanc, E.;
Rémiens, D.

Publication type:

Article