Works about FAILURE analysis


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    Issue Information - TOC.

    Published in:
    Wind Energy, 2016, v. 19, n. 4, p. 569, doi. 10.1002/we.1909
    Publication type:
    Article
    35

    Rapid Chip Reverse Engineering Using Laser, FIB, and SEM.

    Published in:
    Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.314
    By:
    • Maniscalco, Matthew;
    • Choi, Hongbin;
    • May, Nicholas;
    • Phoulady, Adrian;
    • Blagojevic, Alex;
    • Moore, Toni;
    • Shahbazmohamadi, Sina;
    • Tavousi, Pouya
    Publication type:
    Article
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