Works about ELECTRON diffraction


Results: 2631
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    Microstructure studies of ZnO nanoneedles.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 4, p. 328, doi. 10.1007/s10854-008-9729-7
    By:
    • Yuxi Chen;
    • Bing Qu;
    • Barnakov, Yuri A.;
    • Qunli Tang;
    • Jianghua Chen
    Publication type:
    Article
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    A Correlative Look at Battery Cathodes.

    Published in:
    Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.248
    By:
    • Haspel, Dan;
    • Sagar, James;
    • Lea, Josh;
    • Moffat, Jonathan;
    • Machado, Pedro
    Publication type:
    Article
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    Automatic Texture Alignment by Optimization Method.

    Published in:
    Microscopy & Microanalysis, 2024, v. 30, n. 2, p. 253, doi. 10.1093/mam/ozae013
    By:
    • Ott, Alois C.;
    • Weißensteiner, Irmgard;
    • Arnoldt, Aurel R.;
    • Österreicher, Johannes A.;
    • Papenberg, Nikolaus P.
    Publication type:
    Article
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    Diffraction-Based Multiscale Residual Strain Measurements.

    Published in:
    Microscopy & Microanalysis, 2024, v. 30, n. 2, p. 236, doi. 10.1093/mam/ozae011
    By:
    • Pai, Namit;
    • Manda, Sanjay;
    • Sudhalkar, Bhargav;
    • Syphus, Bethany;
    • Fullwood, David;
    • de Kloe, René;
    • Wright, Stuart;
    • Patra, Anirban;
    • Samajdar, Indradev
    Publication type:
    Article
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    Imaging Threading Dislocations and Surface Steps in Nitride Thin Films Using Electron Backscatter Diffraction.

    Published in:
    Microscopy & Microanalysis, 2023, v. 29, n. 6, p. 1879, doi. 10.1093/micmic/ozad118
    By:
    • Hiller, Kieran P;
    • Winkelmann, Aimo;
    • Hourahine, Ben;
    • Starosta, Bohdan;
    • Alasmari, Aeshah;
    • Feng, Peng;
    • Wang, Tao;
    • Parbrook, Peter J;
    • Zubialevich, Vitaly Z;
    • Hagedorn, Sylvia;
    • Walde, Sebastian;
    • Weyers, Markus;
    • Coulon, Pierre-Marie;
    • Shields, Philip A;
    • Bruckbauer, Jochen;
    • Trager-Cowan, Carol
    Publication type:
    Article
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