Works about ELECTROMAGNETS
1
- Technical Electrodynamics / Tekhnichna Elektrodynamika, 2025, n. 4, p. 62, doi. 10.15407/techned2025.04.062
- Теряєв, В. І.;
- Желінський, М. М.;
- Приймак, Б. І.;
- Зайченко, О. А.
- Article
2
- Science Activities, 2021, v. 58, n. 4, p. 183, doi. 10.1080/00368121.2021.2025026
- Akarsu, Murat;
- Kizilaslan, Aydin;
- Simsek, Onder
- Article
3
- Journal of Materials Science Letters, 2003, v. 22, n. 18, p. 1241, doi. 10.1023/A:1025493715478
- Chen, F.;
- Gao, Z. Y.;
- Cai, W.;
- Zhao, L. C.;
- Wu, G. H.;
- Chen, J. L.;
- Zhan, W. S.
- Article
4
- Wind Energy, 2025, v. 28, n. 4, p. 1, doi. 10.1002/we.70009
- Pincelli, Isabella Pimentel;
- Hinkley, Jim;
- Brent, Alan
- Article
5
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.172
- Article
6
- Russian Journal of Nondestructive Testing, 2019, v. 55, n. 12, p. 942, doi. 10.1134/S1061830919120118
- Shleenkov, A. S.;
- Bulychev, O. A.;
- Pastukhov, A. B.;
- Shleenkov, S. A.
- Article
7
- Russian Journal of Nondestructive Testing, 2019, v. 55, n. 12, p. 935, doi. 10.1134/S1061830919120039
- Gobov, Yu. L.;
- Zhakov, S. V.;
- Mikhailov, A. V.;
- Reutov, Yu. Ya.
- Article
8
- Russian Journal of Nondestructive Testing, 2015, v. 51, n. 10, p. 616, doi. 10.1134/S1061830915100058
- Article
9
- Russian Journal of Nondestructive Testing, 2013, v. 49, n. 9, p. 510, doi. 10.1134/S1061830913090106
- Vasilenko, O. N.;
- Kostin, V. N.
- Article
10
- Russian Journal of Nondestructive Testing, 2010, v. 46, n. 11, p. 836, doi. 10.1134/S1061830910110070
- Article
11
- Russian Journal of Nondestructive Testing, 2010, v. 46, n. 6, p. 403, doi. 10.1134/S1061830910060021
- Kostin, V. N.;
- Lukinykh, O. N.;
- Smorodinskii, Ya. G.;
- Kostin, K. V.
- Article
12
- Russian Journal of Nondestructive Testing, 2006, v. 42, n. 5, p. 296, doi. 10.1134/S1061830906050020
- Article
13
- Russian Journal of Nondestructive Testing, 2006, v. 42, n. 5, p. 315, doi. 10.1134/S1061830906050044
- Article
14
- Russian Journal of Nondestructive Testing, 2005, v. 41, n. 3, p. 182, doi. 10.1007/s11181-005-0147-0
- Gorkunov, E.;
- Povolotskaya, A.;
- Mitropol’skaya, S.
- Article
15
- Russian Journal of Nondestructive Testing, 2004, v. 40, n. 3, p. 170, doi. 10.1023/B:RUNT.0000040175.81610.a3
- Sebko, V.P.;
- Suchkov, G.M.;
- Kamardin, V.M.
- Article
16
- Russian Journal of Nondestructive Testing, 2003, v. 39, n. 1, p. 1, doi. 10.1023/A:1024543702362
- Nichipuruk, A. P.;
- Bida, G. V.;
- Shanaurin, A. M.;
- Stashkov, A. N.
- Article
17
- Measurement Techniques, 2017, v. 60, n. 8, p. 818, doi. 10.1007/s11018-017-1276-2
- Article
18
- Measurement Techniques, 2017, v. 59, n. 12, p. 1274, doi. 10.1007/s11018-017-1128-0
- Article
19
- Measurement Techniques, 2013, v. 55, n. 11, p. 1287, doi. 10.1007/s11018-013-0123-3
- Article
20
- Fluid Dynamics, 2013, v. 48, n. 1, p. 4, doi. 10.1134/S001546281301002X
- Kalmykov, S.;
- Naletova, V.;
- Turkov, V.
- Article
21
- Noise & Vibration Worldwide, 2023, v. 54, n. 1, p. 44, doi. 10.1177/09574565221150195
- Gawande, Atul S;
- Mukka Ramachanra, Shreyas;
- Kamyab, Hesam;
- Trung, Nguyen-Thoi;
- Kattimani, Subhaschandra
- Article
22
- Machine Tool & Hydraulics, 2024, v. 52, n. 23, p. 155, doi. 10.3969/j.issn.1001-3881.2024.23.025
- Article
23
- Machine Tool & Hydraulics, 2024, v. 52, n. 19, p. 159, doi. 10.3969/j.issn.1001-3881.2024.19.026
- Article
24
- Machine Tool & Hydraulics, 2023, v. 51, n. 18, p. 122, doi. 10.3969/j.issn.1001-3881.2023.18.019
- Article
25
- IET Control Theory & Applications (Wiley-Blackwell), 2013, v. 7, n. 5, p. 757, doi. 10.1049/iet-cta.2012.0897
- Article
26
- Inventions (2411-5134), 2023, v. 8, n. 1, p. 15, doi. 10.3390/inventions8010015
- Nguyen, Danh Huy;
- Ta, The Tai;
- Vu, Le Minh;
- Dang, Van Trong;
- Nguyen, Danh Giang;
- Le, Duc Thinh;
- Nguyen, Duy Dinh;
- Nguyen, Tung Lam
- Article
27
- Instruments (2410-390X), 2021, v. 5, n. 3, p. 1, doi. 10.3390/instruments5030027
- Article
28
- Journal Européen des Systèmes Automatisés, 2023, v. 56, n. 2, p. 237, doi. 10.18280/jesa.560208
- Rusianto, Toto;
- Huda, Saiful;
- Sudarsono;
- Suyanto, Muhammad
- Article
29
- Journal Européen des Systèmes Automatisés, 2022, v. 65, n. 4, p. 511, doi. 10.18280/jesa.550410
- Hua Li;
- Lixin Tian;
- Lei Zhao;
- Bo Wang
- Article
30
- Open Physics, 2018, v. 16, n. 1, p. 168, doi. 10.1515/phys-2018-0024
- Song Xiao;
- Kunlun Zhang;
- Guoqing Liu;
- Yongzhi Jing;
- Sykulski, Jan K.
- Article
31
- Plasma Physics Reports, 2021, v. 47, n. 12, p. 1285, doi. 10.1134/S1063780X21110234
- Portnov, D. V.;
- Vysokikh, Yu. G.;
- Kashchuk, Yu. A.;
- Rodionov, R. N.
- Article
32
- Plasma Physics Reports, 2019, v. 45, n. 1, p. 21, doi. 10.1134/S1063780X19010094
- Kozintseva, M. V.;
- Bishaev, A. M.;
- Bush, A. A.;
- Gavrikov, M. B.;
- Desyatskov, A. V.;
- Kamentsev, K. E.;
- Savelyev, V. V.;
- Sigov, A. S.;
- Tusnov, Yu. I.
- Article
33
- Plasma Physics Reports, 2005, v. 31, n. 3, p. 229, doi. 10.1134/1.1884688
- Kryachko, A. Yu.;
- Tokman, M. D.
- Article
34
- Mathematics (2227-7390), 2022, v. 10, n. 9, p. 1437, doi. 10.3390/math10091437
- Pang, Jihong;
- Dai, Jinkun;
- Li, Yong
- Article
35
- Mathematics (2227-7390), 2019, v. 7, n. 10, p. 904, doi. 10.3390/math7100904
- Słota, Damian;
- Hetmaniok, Edyta;
- Wituła, Roman;
- Gromysz, Krzysztof;
- Trawiński, Tomasz
- Article
36
- Electronics (2079-9292), 2024, v. 13, n. 17, p. 3371, doi. 10.3390/electronics13173371
- Yu, Le;
- Xu, Shujia;
- Wang, Jiabin;
- Yang, Lin;
- Zhou, Xuebin
- Article
37
- Electronics (2079-9292), 2024, v. 13, n. 14, p. 2720, doi. 10.3390/electronics13142720
- Article
38
- Electronics (2079-9292), 2023, v. 12, n. 5, p. 1068, doi. 10.3390/electronics12051068
- Skowron, Maciej;
- Orlowska-Kowalska, Teresa;
- Kowalski, Czeslaw T.
- Article
39
- Electronics (2079-9292), 2023, v. 12, n. 3, p. 653, doi. 10.3390/electronics12030653
- Yang, Xu;
- Yang, Junfeng;
- Fan, Jing;
- Wang, Bao;
- Li, Dingzhen
- Article
40
- Electronics (2079-9292), 2022, v. 11, n. 13, p. N.PAG, doi. 10.3390/electronics11131974
- Giovannetti, Giulio;
- Frijia, Francesca;
- Flori, Alessandra;
- Galante, Angelo;
- Rizza, Carlo;
- Alecci, Marcello
- Article
41
- Electronics (2079-9292), 2022, v. 11, n. 10, p. N.PAG, doi. 10.3390/electronics11101639
- Bijak, Joanna;
- Trawiński, Tomasz;
- Szczygieł, Marcin
- Article
42
- Electronics (2079-9292), 2022, v. 11, n. 5, p. 771, doi. 10.3390/electronics11050771
- Zhang, Li;
- Ruan, Jiangjun;
- Cai, Wei;
- Li, Jian;
- Huang, Daochun;
- Feng, Zhihui
- Article
43
- Electronics (2079-9292), 2021, v. 10, n. 17, p. 2140, doi. 10.3390/electronics10172140
- Vella Wallbank, Joseph;
- Amodeo, Maria;
- Beaumont, Anthony;
- Buzio, Marco;
- Di Capua, Vincenzo;
- Grech, Christian;
- Sammut, Nicholas;
- Giloteaux, David
- Article
44
- Electronics (2079-9292), 2021, v. 10, n. 16, p. 1980, doi. 10.3390/electronics10161980
- Lu, Li;
- Wu, Wei;
- Yu, Xin;
- Jin, Zhijian
- Article
45
- Electronics (2079-9292), 2021, v. 10, n. 15, p. 1788, doi. 10.3390/electronics10151788
- Giovannetti, Giulio;
- Flori, Alessandra;
- Martini, Nicola;
- Francischello, Roberto;
- Aquaro, Giovanni Donato;
- Pingitore, Alessandro;
- Frijia, Francesca
- Article
46
- Electrotehnica, Electronica, Automatica, 2021, v. 69, n. 1, p. 63, doi. 10.46904/eea.21.69.1.1108008
- CHIRIȚĂ, Ionel;
- TĂNASE, Nicolae;
- ILIE, Cristinel;
- POPA, Marius
- Article
47
- Tribology in Industry, 2019, v. 41, n. 1, p. 115, doi. 10.24874/ti.2019.41.01.13
- Yunusbaev, N.;
- Gabitov, I.;
- Farhatov, M.;
- Nafikov, M.;
- Saifullin, R.;
- Zagirov, I.;
- Insafuddinov, S.
- Article
48
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep04919
- Kaori Kamata;
- Zhenzi Piao;
- Soichiro Suzuki;
- Takahiro Fujimori;
- Wataru Tajiri;
- Keiji Nagai;
- Tomokazu Iyoda;
- Atsushi Yamada;
- Toshiaki Hayakawa;
- Mitsuteru Ishiwara;
- Satoshi Horaguchi;
- Amha Belay;
- Takuo Tanaka;
- Keisuke Takano;
- Masanori Hangyo
- Article
49
- Fatigue & Fracture of Engineering Materials & Structures, 2016, v. 39, n. 12, p. 1488, doi. 10.1111/ffe.12466
- Citarella, R.;
- Lepore, M.;
- Perrella, M.;
- Fellinger, J.
- Article
50
- International Journal for Numerical Methods in Engineering, 2019, v. 119, n. 12, p. 1185, doi. 10.1002/nme.6088
- Seoane, M.;
- Ledger, P.D.;
- Gil, A.J.;
- Mallett, M.
- Article