Works about DIELECTRIC measurements
1
- Nanomaterials (2079-4991), 2025, v. 15, n. 12, p. 918, doi. 10.3390/nano15120918
- Baghdedi, Dhouha;
- Dahri, Asma;
- Tabellout, Mohamed;
- Abdelmoula, Najmeddine;
- Benzarti, Zohra
- Article
2
- Advanced Functional Materials, 2015, v. 25, n. 13, p. 2004, doi. 10.1002/adfm.201402405
- Vanzo, Davide;
- Topham, Benjamin J.;
- Soos, Zoltán G.
- Article
3
- Journal of Thermal Analysis & Calorimetry, 2006, v. 86, n. 1, p. 235, doi. 10.1007/s10973-005-7190-x
- Núñez-Regueira, Lisardo;
- Villanueva, M.;
- Fraga, I.;
- Gracia-Fernández, C. A.;
- Gómez-Barreiro, S.
- Article
4
- Journal of Thermal Analysis & Calorimetry, 2006, v. 84, n. 2, p. 409, doi. 10.1007/s10973-005-7154-1
- Binner, J. G. P.;
- Dimitrakis, G.;
- Price, D. M.;
- Reading, M.;
- Vaidhyanathan, B.
- Article
5
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 939, doi. 10.1007/s10854-009-0021-2
- Huanfu Zhou;
- Xiuli Chen;
- Liang Fang;
- Changzheng Hu;
- Hong Wang
- Article
6
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 902, doi. 10.1007/s10854-009-0015-0
- Vikram, Satyendra V.;
- Phase, D. M.;
- Chandel, Vishal S.
- Article
7
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 882, doi. 10.1007/s10854-009-0011-4
- Dehua Xiong;
- Hong Li;
- Jinshu Cheng
- Article
8
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 405, doi. 10.1007/s10854-009-9933-0
- Article
9
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 6, p. 560, doi. 10.1007/s10854-008-9765-3
- Article
10
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 2, p. 149, doi. 10.1007/s10854-008-9673-6
- Freire, F. N. A.;
- Santos, M. R. P.;
- Pereira, F. M. M.;
- Sohn, R. S. T. M.;
- Almeida, J. S.;
- Medeiros, A. M. L.;
- Sancho, E. O.;
- Costa, M. M.;
- Sombra, A. S. B.
- Article
11
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 74, doi. 10.1007/s10854-008-9610-8
- Sekhar, V. N.;
- Chai, T. C.;
- Balakumar, S.;
- Lu Shen;
- Sinha, S. K.;
- Tay, A. A. O.;
- Seung Wook Yoon
- Article
12
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 44, doi. 10.1007/s10854-008-9601-9
- Jun Wang;
- Tianjin Zhang;
- Junhuai Xiang;
- Wenkui Li;
- Shuwang Duo;
- Mingshen Li
- Article
13
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 7, p. 627, doi. 10.1007/s10854-007-9411-5
- Pereira, F.;
- Junior, C.;
- Santos, M.;
- Sohn, R.;
- Freire, F.;
- Sasaki, J.;
- Paiva, J.;
- Sombra, A.
- Article
14
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 6, p. 543, doi. 10.1007/s10854-007-9383-5
- Dongyun Gui;
- Hui Zhang;
- Liang Fang;
- Lihui Xue
- Article
15
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 6, p. 505, doi. 10.1007/s10854-007-9371-9
- Shunhua Wu;
- Shuang Wang;
- Liying Chen;
- Xiaoyong Wang
- Article
16
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 1, p. 29, doi. 10.1007/s10854-007-9223-7
- Article
17
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 1, p. 39, doi. 10.1007/s10854-007-9224-6
- Priya Rani, B. R.;
- Sebastian, M. T.
- Article
18
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 9, p. 985, doi. 10.1007/s10854-006-9094-3
- Chunxia Yang;
- Hongqing Zhou;
- Min Liu;
- Tai Qiu
- Article
19
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 8, p. 877, doi. 10.1007/s10854-006-9081-8
- Zhang, Tianjin;
- Wang, Jinzhao;
- Zhang, Baishun;
- Jiang, Juan;
- Pan, Runkun;
- He, Jun
- Article
20
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 6, p. 671, doi. 10.1007/s10854-006-9055-x
- Sulepetkar, S.;
- Raibagkar, R.
- Article
21
- Russian Journal of Nondestructive Testing, 2007, v. 43, n. 6, p. 410, doi. 10.1134/S1061830907060101
- Rogov, I. I.;
- Pletnev, P. M.;
- Rogov, V. I.
- Article
22
- Russian Journal of Nondestructive Testing, 2005, v. 41, n. 8, p. 544, doi. 10.1007/s11181-005-0204-8
- Article
23
- Russian Journal of Nondestructive Testing, 2003, v. 39, n. 10, p. 748, doi. 10.1023/B:RUNT.0000020245.94666.d2
- Article
24
- Russian Journal of Nondestructive Testing, 2003, v. 39, n. 10, p. 753, doi. 10.1023/B:RUNT.0000020246.10326.70
- Fursa, T. V.;
- Osipov, K. Yu.
- Article
25
- Measurement Techniques, 2023, v. 66, n. 8, p. 553, doi. 10.1007/s11018-023-02267-w
- Egorov, V. N.;
- Tokareva, E. Yu.;
- Prokop'eva, E. K.;
- Malay, I. M.;
- Tuyen, L. Q.
- Article
26
- Measurement Techniques, 2023, v. 65, n. 12, p. 899, doi. 10.1007/s11018-023-02178-w
- Matveev, E. V.;
- Berestov, V. V.
- Article
27
- Measurement Techniques, 2019, v. 62, n. 5, p. 449, doi. 10.1007/s11018-019-01644-8
- Article
28
- Measurement Techniques, 2014, v. 57, n. 8, p. 941, doi. 10.1007/s11018-014-0563-4
- Article
29
- Measurement Techniques, 2014, v. 57, n. 7, p. 826, doi. 10.1007/s11018-014-0543-8
- Podkin, Yu.;
- Rozental', O.
- Article
30
- Measurement Techniques, 2014, v. 57, n. 1, p. 103, doi. 10.1007/s11018-014-0415-2
- Article
31
- Measurement Techniques, 2014, v. 56, n. 12, p. 1439, doi. 10.1007/s11018-014-0397-0
- Article
32
- Measurement Techniques, 2007, v. 50, n. 4, p. 425, doi. 10.1007/s11018-007-0087-2
- A. Mekhannikov;
- A. Mylânikov;
- L. Maslennikova
- Article
33
- Humanidades, Ciencia, Tecnología e Innovación en Puebla, 2022, v. 4, n. 1, p. 1
- Martínez Juárez, Jesús Alejandro
- Article
34
- Gels (2310-2861), 2025, v. 11, n. 6, p. 450, doi. 10.3390/gels11060450
- Tayari, Faouzia;
- Nassar, Kais Iben;
- Carvalho, João Pedro;
- Teixeira, Sílvia Soreto;
- Hammami, Imen;
- Gavinho, Sílvia Rodrigues;
- Graça, Manuel P. F.;
- Valente, Manuel Almeida
- Article
35
- Material Design & Processing Communications, 2024, v. 2024, p. 1, doi. 10.1155/2024/7777701
- Eric, Ndanga Adamou;
- Samuel, Eke;
- Jacques, Matanga;
- Serge, Doka Yamigno;
- Vuong, Tan Phu;
- Tridello, Andrea
- Article
36
- Journal of Henan Agricultural Sciences, 2021, v. 50, n. 5, p. 173, doi. 10.15933/j.cnki.1004-3268.2021.05.024
- Article
37
- Journal of Clinical Medicine, 2020, v. 9, n. 3, p. 684, doi. 10.3390/jcm9030684
- Neckebroek, Martine;
- Ghita, Mihaela;
- Ghita, Maria;
- Copot, Dana;
- Ionescu, Clara M.
- Article
38
- Journal of the National Science Foundation of Sri Lanka, 2018, v. 46, n. 1, p. 103, doi. 10.4038/jnsfsr.v46i1.8270
- Article
39
- Ferroelectrics, 2008, v. 367, n. 1, p. 229, doi. 10.1080/00150190802377603
- Ivanov, M.;
- Banys, J.;
- Rudys, S.;
- Grigalaitis, R.
- Article
40
- Ferroelectrics, 2008, v. 365, n. 1, p. 130, doi. 10.1080/00150190802064318
- Article
41
- Ferroelectrics, 2008, v. 364, n. 1, p. 13, doi. 10.1080/00150190802046703
- Yang-Ho Na;
- Naruse, Yoichi;
- Fukuda, Naofumi;
- Orihara, Hiroshi;
- Fajar, Andika;
- Hamplova, Vera;
- Kaspar, Miroslav;
- Glogarova, Milada
- Article
42
- Ferroelectrics, 2007, v. 359, n. 1, p. 21, doi. 10.1080/00150190701512276
- Zhandun, V. S.;
- Zinenko, V. I.
- Article
43
- Ferroelectrics, 2007, v. 359, n. 1, p. 94, doi. 10.1080/00150190701514959
- Gagou, Y.;
- Dellis, J. -L.;
- Marssi, M. El;
- Lukyanchuk, I.;
- Mezzane, D.;
- Elaatmani, M.
- Article
44
- Ferroelectrics, 2007, v. 357, n. 1, p. 138, doi. 10.1080/00150190701542505
- Peng Shi;
- Wei Ren;
- Xiaoqing Wu;
- Ruifeng Huang;
- Lei Zhang;
- Xi Yao
- Article
45
- Ferroelectrics, 2007, v. 347, n. 1, p. 37, doi. 10.1080/00150190601186981
- Uesu, Y.;
- Yokota, H.;
- Kiat, J. M.;
- Malibert, C.
- Article
46
- Ferroelectrics, 2006, v. 345, n. 1, p. 115, doi. 10.1080/00150190600732405
- Article
47
- Ferroelectrics, 2006, v. 345, n. 1, p. 27, doi. 10.1080/00150190601020909
- Suchanicz, J.;
- Dambekalne, M.;
- Shebanovs, L.;
- Stenberg, A.;
- Garbarz-Glos, B.;
- Stopa, G.;
- Smiga, W.;
- Konieczny, K.;
- Kus, C. Z.
- Article
48
- Ferroelectrics, 2006, v. 345, n. 1, p. 39, doi. 10.1080/00150190601020925
- Śmiga, W.;
- Garbarz-Glos, B.;
- Suchanicz, J.;
- Dambekalne, M.;
- Stenberg, A.;
- Stopa, G.;
- Kuś, C.
- Article
49
- Ferroelectrics, 2006, v. 344, n. 1, p. 163, doi. 10.1080/00150190600968033
- Article
50
- Ferroelectrics, 2006, v. 344, n. 1, p. 41, doi. 10.1080/00150190600966813
- Jangkun Song;
- Chandani, A. D. L.;
- Panarina, O. E.;
- Fukuda, Atsuo;
- Vij, Jagdish K.;
- Goertz, V.;
- Goodby, J. W.
- Article