Works about DIELECTRIC loss
1
- Chemistry - An Asian Journal, 2025, v. 20, n. 12, p. 1, doi. 10.1002/asia.202500500
- Sasmal, Shreya;
- Natarajan, Srinivasan
- Article
2
- International Journal of Nanoscience, 2025, v. 24, n. 2/3, p. 1, doi. 10.1142/S0219581X24500315
- Article
3
- International Journal of Nanoscience, 2023, v. 22, n. 5, p. 1, doi. 10.1142/S0219581X23500436
- Hamood, Farah J.;
- Mohmed, Baidaa Yehia;
- Kadim, Ashraq Mohammed;
- Abass, Khalid Haneen;
- Agarwal, Manoj Kumar;
- Mohammed, Kahtan A.
- Article
4
- International Journal of Nanoscience, 2019, v. 18, n. 6, p. N.PAG, doi. 10.1142/S0219581X18500357
- Mishra, Punyapriya;
- Deep, Narasingh;
- Pradhan, Sagarika;
- Kamble, Vikram G.
- Article
5
- Advanced Functional Materials, 2014, v. 23, n. 45, p. 5638, doi. 10.1002/adfm.201300736
- Qiao, Yali;
- Islam, Mohammed Sayful;
- Han, Kuo;
- Leonhardt, Eric;
- Zhang, Jiuyang;
- Wang, Qing;
- Ploehn, Harry J.;
- Tang, Chuanbing
- Article
6
- Advanced Functional Materials, 2014, v. 24, n. 18, p. 2638, doi. 10.1002/adfm.201303290
- Datta, Anuja;
- Mukherjee, Devajyoti;
- Witanachchi, Sarath;
- Mukherjee, Pritish
- Article
7
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 902, doi. 10.1007/s10854-009-0015-0
- Vikram, Satyendra V.;
- Phase, D. M.;
- Chandel, Vishal S.
- Article
8
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 882, doi. 10.1007/s10854-009-0011-4
- Dehua Xiong;
- Hong Li;
- Jinshu Cheng
- Article
9
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 796, doi. 10.1007/s10854-009-9995-z
- Wei Cai;
- Chunlin Fu;
- Jiacheng Gao;
- Xiaoling Deng
- Article
10
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 3, p. 298, doi. 10.1007/s10854-009-9909-0
- Lingxia Li;
- Yu Liang;
- Ping Zhang
- Article
11
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 7, p. 619, doi. 10.1007/s10854-008-9775-1
- Maie, Hiroki;
- Lee, Burtrand I.
- Article
12
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 7, p. 632, doi. 10.1007/s10854-008-9777-z
- Kanamadi, C. M.;
- Kulkarni, S. R.;
- Chougule, B. K.;
- Jeong, Jung Hyun;
- Choi, Byung Chun;
- Kang, Young Soo
- Article
13
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 6, p. 560, doi. 10.1007/s10854-008-9765-3
- Article
14
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 2, p. 132, doi. 10.1007/s10854-008-9655-8
- Chandramouli, K.;
- Reddy, G. Srinivas;
- Ramam, Koduri
- Article
15
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 44, doi. 10.1007/s10854-008-9601-9
- Jun Wang;
- Tianjin Zhang;
- Junhuai Xiang;
- Wenkui Li;
- Shuwang Duo;
- Mingshen Li
- Article
16
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 6, p. 505, doi. 10.1007/s10854-007-9371-9
- Shunhua Wu;
- Shuang Wang;
- Liying Chen;
- Xiaoyong Wang
- Article
17
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 5, p. 429, doi. 10.1007/s10854-007-9360-z
- Qin, W. F.;
- Xiong, J.;
- Zhu, J.;
- Tang, J. L.;
- Jie, W. J.;
- Wei, X. H.;
- Zhang, Y.;
- Li, Y. R.
- Article
18
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 1, p. 61, doi. 10.1007/s10854-007-9151-6
- Wencheng Hu;
- Chuanren Yang;
- Xiaobo Liu;
- Wei He;
- Xianzhong Tang
- Article
19
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 1, p. 5, doi. 10.1007/s10854-007-9288-3
- Gomaa, Mohamed M.;
- Darwish, Hussein;
- Salman, Saad M.
- Article
20
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 9, p. 985, doi. 10.1007/s10854-006-9094-3
- Chunxia Yang;
- Hongqing Zhou;
- Min Liu;
- Tai Qiu
- Article
21
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 8, p. 877, doi. 10.1007/s10854-006-9081-8
- Zhang, Tianjin;
- Wang, Jinzhao;
- Zhang, Baishun;
- Jiang, Juan;
- Pan, Runkun;
- He, Jun
- Article
22
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 6, p. 635, doi. 10.1007/s10854-006-9077-4
- Renukappa, N.;
- Siddaramaiah;
- Sudhakar Samuel, R. D.
- Article
23
- Cellulose, 2022, v. 29, n. 15, p. 8177, doi. 10.1007/s10570-022-04785-2
- Gao, Meng-hang;
- Xie, Xu;
- Huang, Ting;
- Zhang, Nan;
- Wang, Yong
- Article
24
- Cellulose, 2022, v. 29, n. 1, p. 259, doi. 10.1007/s10570-021-04276-w
- Yin, Sha;
- Huang, Yang;
- Wang, Yu;
- Wang, Yuqing;
- Xiao, Huining
- Article
25
- Cellulose, 2020, v. 27, n. 7, p. 3821, doi. 10.1007/s10570-020-03067-z
- Rincón-Iglesias, Mikel;
- Lizundia, Erlantz;
- Correia, Daniela M.;
- Costa, Carlos M.;
- Lanceros-Méndez, Senentxu
- Article
26
- Cellulose, 2019, v. 26, n. 12, p. 7451, doi. 10.1007/s10570-019-02570-2
- Mo, Yang;
- Yang, Lijun;
- Hou, Wei;
- Zou, Tiantian;
- Huang, Youyu;
- Zheng, Xiaoling;
- Liao, Ruijin
- Article
27
- Food & Bioproducts Processing: Transactions of the Institution of Chemical Engineers Part C, 2023, v. 141, p. 116, doi. 10.1016/j.fbp.2023.08.001
- Article
28
- Russian Journal of Nondestructive Testing, 2013, v. 49, n. 2, p. 67, doi. 10.1134/S1061830913020046
- Konovalov, S.;
- Kuz'menko, A.
- Article
29
- Russian Journal of Nondestructive Testing, 2007, v. 43, n. 6, p. 410, doi. 10.1134/S1061830907060101
- Rogov, I. I.;
- Pletnev, P. M.;
- Rogov, V. I.
- Article
30
- Russian Journal of Nondestructive Testing, 2005, v. 41, n. 8, p. 544, doi. 10.1007/s11181-005-0204-8
- Article
31
- Measurement Techniques, 2023, v. 66, n. 9, p. 690, doi. 10.1007/s11018-024-02282-5
- Grishin, M. V.;
- Leonov, A. V;
- Kucobin, A. A.
- Article
32
- Measurement Techniques, 2023, v. 66, n. 8, p. 553, doi. 10.1007/s11018-023-02267-w
- Egorov, V. N.;
- Tokareva, E. Yu.;
- Prokop'eva, E. K.;
- Malay, I. M.;
- Tuyen, L. Q.
- Article
33
- Measurement Techniques, 2021, v. 64, n. 6, p. 463, doi. 10.1007/s11018-021-01955-9
- Gevorkyan, V. M.;
- Kazantsev, Yu. A.;
- Shutov, A. V.
- Article
34
- Measurement Techniques, 2020, v. 63, n. 9, p. 758, doi. 10.1007/s11018-021-01851-2
- Nasirov, T. Z.;
- Ismatullayev, P. R.;
- Jabborov, H. Sh.
- Article
35
- Measurement Techniques, 2020, v. 63, n. 7, p. 580, doi. 10.1007/s11018-020-01826-9
- Generalov, V. M.;
- Safatov, A. S.;
- Kruchinina, M. V.;
- Gromov, A. A.;
- Buryak, G. A.;
- Generalov, K. V.;
- Kruchinin, V. N.
- Article
36
- Measurement Techniques, 2017, v. 60, n. 1, p. 1, doi. 10.1007/s11018-017-1140-4
- Altaev, O.;
- Egorov, V.;
- Kashchenko, M.;
- Masalov, V.;
- Tokareva, E.
- Article
37
- Measurement Techniques, 2009, v. 52, n. 6, p. 673, doi. 10.1007/s11018-009-9326-z
- Loik, D.;
- Mamontov, A.;
- Nazarov, I.;
- Nefedov, V.;
- Potapova, T.
- Article
38
- Journal of Henan Agricultural Sciences, 2021, v. 50, n. 5, p. 173, doi. 10.15933/j.cnki.1004-3268.2021.05.024
- Article
39
- Advanced Sustainable Systems, 2023, v. 7, n. 12, p. 1, doi. 10.1002/adsu.202300272
- Cai, Yanzhi;
- Yu, Haiming;
- Cheng, Laifei;
- Guo, Siyu;
- Liu, Tingting;
- Chen, Dengpeng;
- Huang, Shaohua;
- Hu, Zhongyi;
- Wang, Yuhan;
- Zhou, Yuan
- Article
40
- Journal of Jilin University (Science Edition) / Jilin Daxue Xuebao (Lixue Ban), 2021, v. 59, n. 3, p. 649, doi. 10.13413/j.cnki.jdxblxb.2020373
- Article
41
- Journal of Clinical Medicine, 2022, v. 11, n. 3, p. 629, doi. 10.3390/jcm11030629
- Takeuchi, Takumi;
- Yamagishi, Kenichiro;
- Konishi, Kazumasa;
- Sano, Hideto;
- Takahashi, Masato;
- Ichimura, Shoichi;
- Kono, Hitoshi;
- Hasegawa, Masaichi;
- Hosogane, Naobumi
- Article
42
- Journal of Clinical Medicine, 2021, v. 10, n. 3, p. 510, doi. 10.3390/jcm10030510
- Marticorena Garcia, Stephan R.;
- Althoff, Christian E.;
- Dürr, Michael;
- Halleck, Fabian;
- Budde, Klemens;
- Grittner, Ulrike;
- Burkhardt, Christian;
- Jöhrens, Korinna;
- Braun, Jürgen;
- Fischer, Thomas;
- Hamm, Bernd;
- Sack, Ingolf;
- Guo, Jing;
- Yaqoob, Magdi
- Article
43
- Metallophysics & Advanced Technologies / Metallofizika i Novejsie Tehnologii, 2021, v. 43, n. 10, p. 1313, doi. 10.15407/mfint.43.10.1313
- Kovbasiuk, Т. М.;
- Duriagina, Z. А.;
- Mierzwinski, D.;
- Kulyk, V. V.
- Article
44
- Ferroelectrics, 2009, v. 392, n. 1, p. 81, doi. 10.1080/00150190903412556
- Vijayakumar, V. N.;
- Mohan, M. L. N. Madhu
- Article
45
- Ferroelectrics, 2009, v. 380, n. 1, p. 135, doi. 10.1080/00150190902876728
- Ding Shihua;
- Yang Xiaojing;
- Yao Xi
- Article
46
- Ferroelectrics, 2008, v. 369, n. 1, p. 22, doi. 10.1080/00150190802371424
- Ianculescu, A.;
- Berger, D.;
- Mitoşeriu, L.;
- Curecheriu, L. P.;
- Drăgan, N.;
- Crişan, D.;
- Vasile, E.
- Article
47
- Ferroelectrics, 2007, v. 357, n. 1, p. 138, doi. 10.1080/00150190701542505
- Peng Shi;
- Wei Ren;
- Xiaoqing Wu;
- Ruifeng Huang;
- Lei Zhang;
- Xi Yao
- Article
48
- Ferroelectrics, 2005, v. 328, n. 1, p. 27, doi. 10.1080/00150190500310872
- Singh, Ravindra;
- Sharma, Seema;
- Chandra, Sudhir;
- Goel, T.
- Article
49
- Ferroelectrics, 2005, v. 323, n. 1, p. 113, doi. 10.1080/00150190500308942
- Salvi, S.;
- Phirke, A.;
- Naidu, J.;
- Shingare, S.
- Article
50
- Ferroelectrics, 2004, v. 302, n. 1, p. 455, doi. 10.1080/00150190490455142
- Article