Works matching DE "CAPACITORS"
1
- International Journal of Circuit Theory & Applications, 2025, v. 53, n. 7, p. 4278, doi. 10.1002/cta.4469
- Article
2
- International Journal of Circuit Theory & Applications, 2025, v. 53, n. 7, p. 3922, doi. 10.1002/cta.4355
- Xia, Hui;
- Shi, Yong;
- Hou, Xinyu
- Article
3
- International Journal of Circuit Theory & Applications, 2025, v. 53, n. 7, p. 4110, doi. 10.1002/cta.4352
- Jeelani, Naira;
- Hamid Bhat, Abdul
- Article
4
- International Journal of Circuit Theory & Applications, 2025, v. 53, n. 7, p. 4008, doi. 10.1002/cta.4347
- Khan, Saniya;
- Sarwar, Adil;
- Zaid, Mohammad;
- Ahmad, Shafiq
- Article
5
- International Journal of Circuit Theory & Applications, 2025, v. 53, n. 7, p. 3881, doi. 10.1002/cta.4336
- Lai, Xinquan;
- Wang, Bingyuan;
- Niu, Zhiwen
- Article
6
- International Journal of Circuit Theory & Applications, 2025, v. 53, n. 7, p. 4331, doi. 10.1002/cta.4334
- Gaurav;
- Jayaram, Nakka;
- Halder, Sukanta;
- Kumar, Uppalapati Sudheer;
- Patel, Mitesh Kumar Bharat bhai
- Article
7
- International Journal of Circuit Theory & Applications, 2025, v. 53, n. 7, p. 4078, doi. 10.1002/cta.4282
- Shen, Yucheng;
- Cheng, Hong;
- Wang, Cong;
- Yuan, Wei;
- Liu, Ziru;
- Meng, Tianshuai
- Article
8
- Nature Communications, 2025, v. 16, n. 1, p. 1, doi. 10.1038/s41467-025-61406-9
- Dong, Xiaoyan;
- Fu, Zhengqian;
- Wang, Zhipeng;
- Lv, Xiang;
- Wu, Jiagang
- Article
9
- Electrical Engineering & Electromechanics, 2025, n. 4, p. 26, doi. 10.20998/2074-272X.2025.4.04
- Benboukous, M.;
- Bahri, H.;
- Talea, M.;
- Bour, M.;
- Abdouni, K.
- Article
10
- Scientific Reports, 2025, v. 15, n. 1, p. 1, doi. 10.1038/s41598-025-09513-x
- G. M, Oorappan;
- S. A, Lakshmanan;
- M, Jagabar Sathik
- Article
11
- Engineering Letters, 2025, v. 33, n. 7, p. 2841
- Jingmei Guo;
- Chao Sheng;
- Pandian Luo;
- Jian Zhang;
- Zhengjun Shi
- Article
12
- Metrology, 2025, v. 4, n. 2, p. 29, doi. 10.3390/metrology5020029
- Ouameur, Mohamed;
- Patois, Emmanuel
- Article
13
- Technical Electrodynamics / Tekhnichna Elektrodynamika, 2025, n. 4, p. 42, doi. 10.15407/techned2025.04.042
- Article
14
- Journal of Circuits, Systems & Computers, 2025, v. 34, n. 15, p. 1, doi. 10.1142/S0218126625503414
- Zeng, Yejuan;
- Dai, Yuehua;
- Zhu, Wu;
- Geng, Jinxia;
- Meng, Xu;
- Yin, Yongsheng;
- Xie, Yumeng;
- Zou, Jiaxuan;
- Wang, Zhanfeng
- Article
15
- Journal of Circuits, Systems & Computers, 2025, v. 34, n. 15, p. 1, doi. 10.1142/S0218126625503293
- Kumar, Navnit;
- Kumar, Manjeet;
- Pandey, Neeta
- Article
16
- Global Energy Interconnection, 2025, v. 8, n. 3, p. 420, doi. 10.1016/j.gloei.2025.03.002
- Xinlan Deng;
- Youhan Deng;
- Liang Qin;
- Weiwei Yao;
- Min He;
- Kaipei Liu
- Article
17
- Journal of Solid State Electrochemistry, 2025, v. 29, n. 7, p. 2719, doi. 10.1007/s10008-024-06183-z
- Bhowmik, Subhajit;
- Bhar, Madhushri;
- Bhattacharjee, Udita;
- Martha, Surendra K.
- Article
18
- Electrical Engineering, 2025, v. 107, n. 6, p. 7855, doi. 10.1007/s00202-025-02951-w
- Sahoo, Rajanikanta;
- Tiwari, Anurag;
- Roy, Molay
- Article
19
- Electrical Engineering, 2025, v. 107, n. 6, p. 7507, doi. 10.1007/s00202-024-02914-7
- Nascimento, Emanoel;
- Oliveira, Denisson;
- Marujo, Diogo;
- Saavedra, Osvaldo R.;
- Freitas, Ramon
- Article
20
- Sensors (14248220), 2025, v. 25, n. 12, p. 3589, doi. 10.3390/s25123589
- Chen, Chen;
- Wang, Liang;
- Wang, Wanyang;
- Min, Run;
- Tong, Qiaoling
- Article
21
- Journal of Low Power Electronics & Applications, 2025, v. 15, n. 2, p. 29, doi. 10.3390/jlpea15020029
- Wang, Xin;
- Li, Zishuo;
- Lin, Zhen;
- Meng, Fanyi
- Article
22
- Micromachines, 2025, v. 16, n. 6, p. 615, doi. 10.3390/mi16060615
- Choi, Tae-Min;
- Jung, Eun-Su;
- Yoo, Jin-Uk;
- Lee, Hwa-Rim;
- Yoon, Songhun;
- Pyo, Sung-Gyu
- Article
23
- International Journal of Nanoscience, 2019, v. 18, n. 3/4, p. N.PAG, doi. 10.1142/S0219581X19400088
- Poklonski, N. A.;
- Ratkevich, S. V.;
- Vyrko, S. A.;
- Vlassov, A. T.;
- Hieu, Nguyen Ngoc
- Article
24
- International Journal of Nanoscience, 2006, v. 5, n. 4/5, p. 395, doi. 10.1142/S0219581X0600453X
- LI, CHANG MING;
- PAN, LIKUN;
- GAN, YE;
- SUN, CHAN QING;
- ZHANG, JIE;
- GAMOTA, DAN
- Article
25
- International Journal of Nanoscience, 2005, v. 4, n. 4, p. 451, doi. 10.1142/S0219581X05003668
- LI, C. M.;
- PAN, L. K.;
- SUN, C. Q.;
- ZHANG, J.;
- GAMOTA, DAN
- Article
26
- International Journal of Nanoscience, 2005, v. 4, n. 2, p. 171, doi. 10.1142/S0219581X05003036
- Chee Ching Chong;
- Kat Hong Zhou;
- Ping Bai;
- Er Ping Li;
- Samudra, Ganesh S.
- Article
27
- Electroanalysis, 2014, v. 26, n. 8, p. 1858, doi. 10.1002/elan.201400195
- Kushida, Yuki;
- Shirai, Osamu;
- Kitazumi, Yuki;
- Kano, Kenji
- Article
28
- Advanced Functional Materials, 2015, v. 25, n. 40, p. 6326, doi. 10.1002/adfm.201500827
- Article
29
- Advanced Functional Materials, 2014, v. 24, n. 29, p. 4706, doi. 10.1002/adfm.201304151
- Nathan‐Walleser, Teressa;
- Lazar, Ion‐Matei;
- Fabritius, Martin;
- Tölle, Folke Johannes;
- Xia, Qi;
- Bruchmann, Bernd;
- Venkataraman, Shyam S.;
- Schwab, Matthias Georg;
- Mülhaupt, Rolf
- Article
30
- Advanced Functional Materials, 2013, v. 23, n. 32, p. 3971, doi. 10.1002/adfm.201300079
- Kim, Yunseok;
- Lu, Xiaoli;
- Jesse, Stephen;
- Hesse, Dietrich;
- Alexe, Marin;
- Kalinin, Sergei V.
- Article
31
- Advanced Functional Materials, 2013, v. 23, n. 21, p. 2758, doi. 10.1002/adfm.201202786
- Wang, Lei;
- Dong, Zhi Hui;
- Wang, Zheng Gong;
- Zhang, Feng Xing;
- Jin, Jian
- Article
32
- Journal of Thermal Analysis & Calorimetry, 2007, v. 89, n. 1, p. 37, doi. 10.1007/s10973-006-8263-1
- Alouani, K.;
- Siniti, M.;
- Schiets, F.;
- Claudy, P.
- Article
33
- Journal of Thermal Analysis & Calorimetry, 2007, v. 89, n. 1, p. 45, doi. 10.1007/s10973-006-8264-0
- Siniti, M.;
- Schiets, F.;
- Alouani, K.;
- Claudy, P.
- Article
34
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 535, doi. 10.1007/s10854-009-9953-9
- Article
35
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 368, doi. 10.1007/s10854-009-9925-0
- Haibo Yang;
- Ying Lin;
- Jianfeng Zhu;
- Fen Wang
- Article
36
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 373, doi. 10.1007/s10854-007-9346-x
- Koduri, Ramam;
- Orellana, Jose Rodrigo Anfossi
- Article
37
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 4, p. 453
- Fusheng Pan;
- Hongwei Chen;
- Wei Cai;
- Chuanren Yang
- Article
38
- Journal of Materials Science Letters, 2003, v. 22, n. 23, p. 1705, doi. 10.1023/B:JMSL.0000004654.78051.d3
- Fang, L.;
- Zhang, H.;
- Yang, J. F.;
- Meng, F. C.;
- Yuan, R. Z.
- Article
39
- Journal of Materials Science Letters, 2003, v. 22, n. 7, p. 557, doi. 10.1023/A:1022907024179
- Wang, X.;
- Lee, B. I.;
- Hu, M. Z.;
- Payzant, E. A.;
- Blom, D. A.
- Article
40
- Cellulose, 2020, v. 27, n. 17, p. 9991, doi. 10.1007/s10570-020-03468-0
- Park, Jong Chel;
- Park, Sangbaek;
- Kim, Dong-Wan
- Article
41
- Cellulose, 2019, v. 26, n. 1, p. 569, doi. 10.1007/s10570-018-2101-z
- Taira, Shogo;
- Kurihara, Makoto;
- Koda, Keiichi;
- Uraki, Yasumitsu;
- Sugimura, Kazuki;
- Nishio, Yoshiyuki
- Article
42
- Microscopy & Microanalysis, 2012, v. 18, n. S5, p. 99, doi. 10.1017/S1431927612013153
- Nico, C.;
- Soares, M.R.N.;
- Matos, M.;
- Monteiro, R.;
- Graça, M. P. F.;
- Monteiro, T.;
- Costa, F. M.;
- Valente, M. A.
- Article
43
- Russian Journal of Nondestructive Testing, 2015, v. 51, n. 2, p. 86, doi. 10.1134/S1061830915020047
- Goldshtein, A.;
- Vavilova, G.;
- Belyankov, V.
- Article
44
- Measurement Techniques, 2022, v. 65, n. 9, p. 674, doi. 10.1007/s11018-023-02138-4
- Tishchenko, V. A.;
- Lukyanov, V. I.;
- Smirnov, A. A.
- Article
45
- Measurement Techniques, 2019, v. 62, n. 7, p. 641, doi. 10.1007/s11018-019-01672-4
- Dobrovol'skii, V. I.;
- Kolerskii, S. V.;
- Zubkov, P. N.;
- Nechaev, N. V.
- Article
46
- Measurement Techniques, 2019, v. 61, n. 10, p. 1030, doi. 10.1007/s11018-019-01545-w
- Article
47
- Measurement Techniques, 2017, v. 59, n. 11, p. 1210, doi. 10.1007/s11018-017-1117-3
- Bityukov, V.;
- Ivanov, A.;
- Mikhnevich, N.;
- Petrov, V.
- Article
48
- Measurement Techniques, 2016, v. 59, n. 3, p. 256, doi. 10.1007/s11018-016-0954-9
- Article
49
- Measurement Techniques, 2012, v. 55, n. 9, p. 1005, doi. 10.1007/s11018-012-0090-0
- Grodetskii, Yu.;
- Dukarevich, Yu.;
- Ivanov, Yu.;
- Sinitsyn, A.
- Article
50
- Measurement Techniques, 2012, v. 55, n. 4, p. 459, doi. 10.1007/s11018-012-9982-2
- Tishchenko, V.;
- Tokatly, V.;
- Lukyanov, V.
- Article