Works about CAPACITANCE-voltage characteristics
1
- International Journal of Nanoscience, 2016, v. 15, n. 3, p. 1, doi. 10.1142/S0219581X16400019
- Fahim-Al-Fattah, Md.;
- Rahman, Md. Tawabur;
- Islam, Md. Sherajul;
- Bhuiyan, Ashraful G.
- Article
2
- Journal of Computational Neuroscience, 2012, v. 32, n. 1, p. 167, doi. 10.1007/s10827-011-0346-8
- Article
3
- Food & Bioproducts Processing: Transactions of the Institution of Chemical Engineers Part C, 2012, v. 90, n. 3, p. 377, doi. 10.1016/j.fbp.2011.12.007
- Maskooki, Abdolmajid;
- Eshtiaghi, Mohammad Naghi
- Article
4
- Measurement Techniques, 2023, v. 66, n. 7, p. 508, doi. 10.1007/s11018-023-02252-3
- Pecherskaya, E. A.;
- Karpanin, O. V.;
- Tuzova, D. E.;
- Nelyutskov, M. A.;
- Antipenko, V. V.
- Article
5
- Electronics (2079-9292), 2023, v. 12, n. 6, p. 1473, doi. 10.3390/electronics12061473
- Ji, Qizheng;
- Liu, Jun;
- Yang, Ming;
- Hu, Xiaofeng;
- Wang, Guangfu;
- Qiu, Menglin;
- Liu, Shanghe
- Article
6
- Electronics (2079-9292), 2020, v. 9, n. 5, p. 715, doi. 10.3390/electronics9050715
- Qi, Luwei;
- Meng, Jin;
- Liu, Xiaoyu;
- Yang, Chengyue;
- Zhou, Jingtao;
- Zhang, Dehai;
- Jin, Zhi
- Article
7
- Journal of Nano- & Electronic Physics, 2024, v. 16, n. 2, p. 1, doi. 10.21272/jnep.16(2).02001
- Article
8
- Journal of Nano- & Electronic Physics, 2015, v. 7, n. 2, p. 02029-1
- Article
9
- Journal of Nano- & Electronic Physics, 2015, v. 7, n. 2, p. 02001-1
- Benhaliliba, M.;
- Ocak, Y. S.;
- Mokhtari, H.;
- Kiliçoglu, T.
- Article
10
- Journal of Nano- & Electronic Physics, 2013, v. 5, n. 2, p. 02015-1
- Parihar, Usha;
- Padha, N.;
- Panchal, C. J.
- Article
11
- Journal of Nano- & Electronic Physics, 2013, v. 5, n. 1, p. 01021-1
- Shubham, Kumar;
- Khan, R. U.
- Article
12
- Physica Status Solidi. A: Applications & Materials Science, 2022, v. 219, n. 13, p. 1, doi. 10.1002/pssa.202200194
- Li, Ang;
- Wang, Chong;
- Zheng, Xuefeng;
- Ma, Xiaohua;
- He, Yunlong;
- Liu, Kai;
- Zhao, Yaopeng;
- Hao, Yue
- Article
13
- European Physical Journal B: Condensed Matter, 2018, v. 91, n. 4, p. 1, doi. 10.1140/epjb/e2018-80489-x
- Dugan, Christina L.;
- Peterson, George Glenn;
- Mock, Alyssa;
- Young, Christopher;
- Mann, J. Matthew;
- Nastasi, Michael;
- Schubert, Mathias;
- Wang, Lu;
- Mei, Wai-Ning;
- Tanabe, Iori;
- Dowben, Peter A.;
- Petrosky, James
- Article
14
- Journal of Nanotechnology, 2013, p. 1, doi. 10.1155/2013/302647
- Nowozin, T.;
- Wiengarten, A.;
- Bonato, L.;
- Bimberg, D.;
- Lin, Wei-Hsun;
- Shih-Yen Lin;
- Ajour, M. N.;
- Daqrouq, K.;
- Balamesh, A. S.
- Article
15
- Modern Physics Letters B, 2020, v. 34, n. 10, p. N.PAG, doi. 10.1142/S0217984920500955
- Article
16
- Gazi University Journal of Science, 2013, v. 26, n. 3, p. 501
- Article
17
- Journal of Electronic Materials, 2024, v. 53, n. 5, p. 2591, doi. 10.1007/s11664-024-11004-0
- Algarni, Sabah E.;
- Qasrawi, A. F.;
- Khusayfan, Najla M.;
- Alharbi, Seham R.;
- Alfhaid, Latifah Hamad Khalid
- Article
18
- Journal of Electronic Materials, 2022, v. 51, n. 5, p. 2510, doi. 10.1007/s11664-022-09514-w
- Qasrawi, A. F.;
- Daragme, Rana B.
- Article
19
- Journal of Electronic Materials, 2022, v. 51, n. 4, p. 1731, doi. 10.1007/s11664-022-09431-y
- Akazawa, Masamichi;
- Murai, Shunta;
- Kachi, Tetsu
- Article
20
- Journal of Electronic Materials, 2021, v. 50, n. 6, p. 2956, doi. 10.1007/s11664-020-08716-4
- Gonzalez-Serrano, Karla Adriana;
- Seabaugh, Alan C.
- Article
21
- International Journal of Advanced Manufacturing Technology, 2012, v. 60, n. 9-12, p. 985, doi. 10.1007/s00170-011-3674-y
- Mahardika, Muslim;
- Prihandana, Gunawan;
- Endo, Takashi;
- Tsujimoto, Takayuki;
- Matsumoto, Nozomu;
- Arifvianto, Budi;
- Mitsui, Kimiyuki
- Article
22
- Turkish Journal of Physics, 2020, v. 44, n. 4, p. 302, doi. 10.3906/fiz-2007-11
- Article
23
- Journal of Polytechnic, 2017, v. 20, n. 2, p. 313, doi. 10.2339/2017.20.2.313-318
- Article
24
- Cogent Engineering, 2020, v. 7, n. 1, p. 1, doi. 10.1080/23311916.2020.1810880
- Khaniyev, B.A.;
- Sagidolda, Y.;
- Dikhanbayev, K.K.;
- Tileu, A.O.;
- Ibraimov, M.K.;
- Rashad, Mohamed M.
- Article
25
- Technical Physics Letters, 2022, v. 48, n. 2, p. 23, doi. 10.1134/S106378502202002X
- Baranov, A. I.;
- Kudryashov, D. A.;
- Uvarov, A. V.;
- Morozov, I. A.;
- Shugurov, K. Yu.;
- Maksimova, A. A.;
- Vyacheslavova, E. A.;
- Gudovskikh, A. S.
- Article
26
- Technical Physics Letters, 2020, v. 46, n. 3, p. 287, doi. 10.1134/S1063785020030244
- Kozlovski, V. V.;
- Korol'kov, O.;
- Davidovskaya, K. S.;
- Lebedev, A. A.;
- Levinshtein, M. E.;
- Slepchuk, N.;
- Strel'chuk, A. M.;
- Toompuu, J.
- Article
27
- Technical Physics Letters, 2019, v. 45, n. 10, p. 1063, doi. 10.1134/S1063785019100250
- Maleev, N. A.;
- Bobrov, M. A.;
- Kuzmenkov, A. G.;
- Vasil'ev, A. P.;
- Kulagina, M. M.;
- Guseva, Yu. A.;
- Blokhin, S. A.;
- Ustinov, V. M.
- Article
28
- Crystals (2073-4352), 2025, v. 15, n. 4, p. 372, doi. 10.3390/cryst15040372
- Redkin, Ruslan A.;
- Onishchenko, Nikolay I.;
- Kosobutsky, Alexey V.;
- Brudnyi, Valentin N.;
- Su, Xinyang;
- Sarkisov, Sergey Yu.
- Article
29
- Crystals (2073-4352), 2020, v. 10, n. 1, p. 34, doi. 10.3390/cryst10010034
- Chen, Chun-An;
- Hsu, Yu-Ting;
- Lan, Wen-How;
- Huang, Kai-Feng;
- Chang, Kuo-Jen;
- Wang, Mu-Chun;
- Huang, Chien-Jung
- Article
30
- Coatings (2079-6412), 2022, v. 12, n. 9, p. N.PAG, doi. 10.3390/coatings12091369
- Palade, Catalin;
- Slav, Adrian;
- Stavarache, Ionel;
- Maraloiu, Valentin Adrian;
- Negrila, Catalin;
- Ciurea, Magdalena Lidia
- Article
31
- Coatings (2079-6412), 2021, v. 11, n. 9, p. 1135, doi. 10.3390/coatings11091135
- Lee, Dong-Ho;
- Kim, Dae-Hwan;
- Jeong, Hwan-Seok;
- Hwang, Seong-Hyun;
- Lee, Sunhee;
- Kim, Myeong-Ho;
- Lim, Jun Hyung;
- Kwon, Hyuck-In
- Article
32
- Contributions to Plasma Physics, 2013, v. 53, n. 6, p. 469, doi. 10.1002/ctpp.201200126
- Pipa, A. V.;
- Hoder, T.;
- Brandenburg, R.
- Article
33
- Journal of Laser Micro / Nanoengineering, 2015, v. 10, n. 3, p. 269, doi. 10.2961/jlmn.2015.03.0006
- Polyakov, Dmitry;
- Skvortsov, Albert;
- Veiko, Vadim
- Article
34
- Symmetry (20738994), 2017, v. 9, n. 1, p. 18, doi. 10.3390/sym9010018
- Heungjun Jeon;
- Kyung Ki Kim;
- Yong-Bin Kim
- Article
35
- Surface Review & Letters, 2012, v. 19, n. 6, p. -1, doi. 10.1142/S0218625X12500643
- SU, WEITAO;
- ZHUANG, QIUHUI;
- HUO, DEXUAN;
- LI, BIN
- Article
36
- Electronics & Electrical Engineering, 2013, v. 19, n. 10, p. 95, doi. 10.5755/j01.eee.19.10.5903
- Korolkov, O.;
- Toompuu, J.;
- Rang, T.
- Article
37
- Electronics & Electrical Engineering, 2012, n. 121, p. 27
- Article
38
- Journal of Electronic Materials, 2020, v. 49, n. 10, p. 5816, doi. 10.1007/s11664-020-08307-3
- Sanjay;
- Prasad, B.;
- Vohra, Anil
- Article
39
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 881, doi. 10.1007/s11664-015-4239-x
- Voitsekhovskii, A.;
- Nesmelov, S.;
- Dzyadukh, S.
- Article
40
- Journal of Electronic Materials, 2015, v. 44, n. 9, p. 3108, doi. 10.1007/s11664-015-3827-0
- Jain, F.;
- Chan, P.-Y.;
- Lingalugari, M.;
- Kondo, J.;
- Suarez, E.;
- Gogna, P.;
- Chandy, J.;
- Heller, E.
- Article
41
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2835, doi. 10.1007/s11664-015-3692-x
- Nejm, Razan;
- Ayesh, Ahmad;
- Zeze, Dagou;
- Sleiman, Adam;
- Mabrook, Mohammed;
- Al-Ghaferi, Amal;
- Hussein, Mousa
- Article
42
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2725, doi. 10.1007/s11664-015-3758-9
- Article
43
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 1003, doi. 10.1007/s11664-014-3608-1
- Zhao, W.;
- Sun, B.;
- Shen, Z.;
- Liu, Y.;
- Chen, P.
- Article
44
- Journal of Electronic Materials, 2014, v. 43, n. 11, p. 4357, doi. 10.1007/s11664-014-3392-y
- Ghosh, Surajit;
- Srivastava, P.
- Article
45
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3263, doi. 10.1007/s11664-014-3267-2
- Selçuk, A.B.;
- Bilge Ocak, S.;
- Aras, F.G.;
- Oz Orhan, E.
- Article
46
- Journal of Electronic Materials, 2013, v. 42, n. 8, p. 2439, doi. 10.1007/s11664-013-2616-x
- Trinh, Hai-Dang;
- Lin, Yueh-Chin;
- Kuo, Chien-I;
- Chang, Edward;
- Nguyen, Hong-Quan;
- Wong, Yuen-Yee;
- Yu, Chih-Chieh;
- Chen, Chi-Ming;
- Chang, Chia-Yuan;
- Wu, Jyun-Yi;
- Chiu, Han-Chin;
- Yu, Terrence;
- Chang, Hui-Cheng;
- Tsai, Joseph;
- Hwang, David
- Article
47
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1184, doi. 10.1007/s11664-013-2553-8
- Article
48
- Journal of Electronic Materials, 2013, v. 42, n. 6, p. 1282, doi. 10.1007/s11664-013-2592-1
- Rajagopal Reddy, V.;
- Umapathi, A.;
- Sankar Naik, S.
- Article
49
- Journal of Electronic Materials, 2013, v. 42, n. 1, p. 33, doi. 10.1007/s11664-012-2246-8
- Liu, Xiang;
- Yeluri, Ramya;
- Lu, Jing;
- Mishra, Umesh
- Article
50
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 22, p. 26588, doi. 10.1007/s10854-021-07035-6
- Gaur, Muddsar L.;
- Bhuse, Vijaykumar M.;
- Sanadi, Kallappa R.;
- Rathod, Kishan C.;
- Barache, Umesh B.;
- Gaikwad, Shashikant H.
- Article