Works matching AU Bennewitz, R.
1
- Applied Physics A: Materials Science & Processing, 2004, v. 78, n. 6, p. 837, doi. 10.1007/s00339-003-2439-3
- Bennewitz, R.;
- Schär, S.;
- Gnecco, E.;
- Pfeiffer, O.;
- Bammerlin, M.;
- Meyer, F.
- Article
2
- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 7, p. S19, doi. 10.1007/s003390100629
- Guggisberg, M.;
- Pfeiffer, O.;
- Schär, S.;
- Barwich, V.;
- Bammerlin, M.;
- Loppacher, C.;
- Bennewitz, R.;
- Baratoff, A.;
- Meyer, E.
- Article
3
- Applied Physics A: Materials Science & Processing, 2001, v. 72, p. S19, doi. 10.1007/s003390100629
- Guggisberg, M.;
- Pfeiffer, O.;
- Schär, S.;
- Barwich, V.;
- Bammerlin, M.;
- Loppacher, C.;
- Bennewitz, R.;
- Baratoff, A.;
- Meyer, E.
- Article
4
- Friction (2223-7704), 2017, v. 5, n. 1, p. 115, doi. 10.1007/s40544-017-0149-7
- Kang, S.;
- Rittgen, K.;
- Kwan, S.;
- Park, H.;
- Bennewitz, R.;
- Caron, A.
- Article
5
- Surface & Interface Analysis: SIA, 1999, v. 27, n. 5/6, p. 368, doi. 10.1002/(SICI)1096-9918(199905/06)27:5/6<368::AID-SIA530>3.0.CO;2-W
- Lü, J.;
- Eng, L.;
- Bennewitz, R.;
- Meyer, E.;
- Güntherodt, H.-J;
- Delamarche, E.;
- Scandella, L.
- Article
6
- Surface & Interface Analysis: SIA, 1999, v. 27, n. 5/6, p. 422, doi. 10.1002/(SICI)1096-9918(199905/06)27:5/6<422::AID-SIA534>3.0.CO;2-2
- Eng, L. M.;
- Bammerlin, M.;
- Loppacher, Ch.;
- Guggisberg, M.;
- Bennewitz, R.;
- Meyer, E.;
- Güntherodt, H.-J.
- Article
7
- Surface & Interface Analysis: SIA, 1999, v. 27, n. 5/6, p. 285, doi. 10.1002/(SICI)1096-9918(199905/06)27:5/6<285::AID-SIA577>3.0.CO;2-H
- Article
8
- Surface & Interface Analysis: SIA, 1999, v. 27, n. 5/6, p. 462, doi. 10.1002/(SICI)1096-9918(199905/06)27:5/6<462::AID-SIA543>3.0.CO;2-0
- Bennewitz, R.;
- Bammerlin, M.;
- Guggisberg, M.;
- Loppacher, C.;
- Baratoff, A.;
- Meyer, E.;
- Güntherodt, H.-J.
- Article
9
- Ferroelectrics, 1999, v. 222, n. 1, p. 153, doi. 10.1080/00150199908014811
- Eng, L. M.;
- Loppacher, M. Bammerlin. Ch.;
- Bennewitz, M. Guggisberg. R.;
- Lüthi, R.;
- Huser, E. Meyer. Th.;
- Heinzelmann, H.;
- Güntherodt, H.-J.
- Article
10
- Journal of Materials Science, 2019, v. 54, n. 12, p. 9168, doi. 10.1007/s10853-019-03533-5
- Kwon, S. K.;
- Kim, H. D.;
- Pei, X. Q.;
- Ko, H. E.;
- Park, H. W.;
- Bennewitz, R.;
- Caron, A.
- Article
11
- Journal of Microscopy, 2015, v. 258, n. 2, p. 113, doi. 10.1111/jmi.12221
- MIRÓ, M. MARTINEZ;
- VEITH, M.;
- LEE, J.;
- SOLDERA, F.;
- MÜCKLICH, F.;
- BENNEWITZ, R.;
- AKTAS, C.
- Article