Works by Alberton, Saulo G.

Single-Event Burnout in Semiconductor Devices: Efficient Classification of Ion Species.

Published in:

Journal of Integrated Circuits & Systems, 2024, v. 19, n. 3, p. 1, doi. 10.29292/jics.v19i3.933

By:

• Santos, Julia T.;
• Bianchi, Reinaldo A. C.;
• Guazzelli, Marcilei A.;
• de Oliveira, Juliano A.;
• Alberton, Saulo G.;
• Giacomini, Renato C.

Publication type:

Article