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Works matching AU Alberton, Saulo G.

Results: 3

1

Ion-Induced Charge and Single-Event Burnout in Silicon Power UMOSFETs.

Published in:

Electronics (2079-9292), 2025, v. 14, n. 11, p. 2288, doi. 10.3390/electronics14112288

By:

Alberton, Saulo G.;
Aguiar, Vitor A. P.;
Added, Nemitala;
Vilas-Bôas, Alexis C.;
Guazzelli, Marcilei A.;
Wyss, Jeffery;
Silvestrin, Luca;
Mattiazzo, Serena;
Pereira, Matheus S.;
Finco, Saulo;
Paccagnella, Alessandro;
Medina, Nilberto H.

Publication type:

Article

2

Radiation-Induced Effects on Semiconductor Devices: A Brief Review on Single-Event Effects, Their Dynamics, and Reliability Impacts.

Published in:

Chips, 2025, v. 4, n. 1, p. 12, doi. 10.3390/chips4010012

By:

Aguiar, Vitor A. P.;
Alberton, Saulo G.;
Pereira, Matheus S.

Publication type:

Article

3

Single-Event Burnout in Semiconductor Devices: Efficient Classification of Ion Species.

Published in:

Journal of Integrated Circuits & Systems, 2024, v. 19, n. 3, p. 1, doi. 10.29292/jics.v19i3.933

By:

Santos, Julia T.;
Bianchi, Reinaldo A. C.;
Guazzelli, Marcilei A.;
de Oliveira, Juliano A.;
Alberton, Saulo G.;
Giacomini, Renato C.

Publication type:

Article