Works matching Metrology

Results: 5000

National Measurement System and National Metrology Infrastructure: Analysis of Documents D1 of the International Organization of Legal Metrology.

Published in:

Measurement Techniques, 2023, v. 65, n. 12, p. 876, doi. 10.1007/s11018-023-02163-3

By:

Chirkov, A. P.

Publication type:

Article

PECULIARITIES OF ADMINISTRATIVE LEGAL REGULATION OF METROLOGY.

Published in:

Jurisprudence / Jurisprudencija, 2012, v. 19, n. 4, p. 1515

By:

Novikovas, Andrejus

Publication type:

Article

Solved and Unsolved Problems of the Metrology of Chemical Analysis.

Published in:

Journal of Analytical Chemistry, 2019, v. 74, n. 9, p. 839, doi. 10.1134/S1061934819090053

By:

Karpov, Yu. A.;
Filippov, M. N.;
Baranovskaya, V. B.

Publication type:

Article

Research and development of metrological standards for thermophysical properties of solids in the National Metrology Institute of Japan.

Published in:

High Temperatures - High Pressures, 2010, v. 39, n. 4, p. 279

By:

BABA, TETSUYA;
YAMADA, NAOFUMI;
TAKETOSHI, NAOYUKI;
WATANABE, HIROMICHI;
AKOSHIMA, MEGUMI;
YAGI, TAKASHI;
ABE, HARUKA;
YAMASHITA, YUICHIRO

Publication type:

Article

The Digitalisation of a National Metrology System.

Published in:

Quality Innovation Prosperity / Kvalita Inovácia Prosperita, 2023, v. 27, n. 3, p. 75, doi. 10.12776/QIP.V27I3.1922

By:

Slezák, Michal;
Halaj, Martin

Publication type:

Article

AN INNOVATIVE APPROACH OF METROLOGY FOR HIGH PRECISION AND QUALITY MACHINING TOOL ASSESSMENT IN THE INTEGRATED PRODUCTION ENGINEERING.

Published in:

Annals of DAAAM & Proceedings, 2015, v. 26, n. 1, p. 0787, doi. 10.2507/26th.daaam.proceedings.110

By:

Bas, Gokcen;
Durakbasa, Numan M.;
Mankova, Ildiko;
Vrabel, Marek

Publication type:

Article

A digital metrology process model (MPM) for measuring planning and data analysis and its application with a computer-aided system.

Published in:

International Journal of Advanced Manufacturing Technology, 2017, v. 92, n. 5-8, p. 1967, doi. 10.1007/s00170-017-0294-1

By:

Chen, Zhehan

Publication type:

Article

Application of the time-invariant linear filter approximation to parametrization of surface metrology with high-quality x-ray optics.

Published in:

Optical Engineering, 2014, v. 53, n. 8, p. 1, doi. 10.1117/1.OE.53.8.084102

By:

Yashchuk, Valeriy V.;
Tyurin, Yury N.;
Tyurina, Anastasia Y.

Publication type:

Article

Nondestructive metrology by optical coherence tomography empowering manufacturing iterations of layered polymeric optical materials.

Published in:

Optical Engineering, 2013, v. 52, n. 11, p. 1, doi. 10.1117/1.OE.52.11.112111

By:

Jianing Yao;
Panomsak Meemon;
Kye-Sung Lee;
Rolland, Jannick P.

Publication type:

Article

Identifying and visualizing part-to-part variation with spatially dense optical dimensional metrology data.

Published in:

Journal of Quality Technology, 2019, v. 51, n. 1, p. 3, doi. 10.1080/00224065.2018.1541380

By:

Shi, Zhenyu;
Apley, Daniel W.;
Runger, George C.

Publication type:

Article

Neue Wege der metrologischen Rückführbarkeit in der Längen- und Koordinatenmesstechnik.

Published in:

Technisches Messen, 2019, v. 86, n. 9, p. 487, doi. 10.1515/teme-2019-0092

By:

Kniel, Karin;
Flügge, Jens;
Bosse, Harald

Publication type:

Article

Harmonization of Law in the Application of Legal Metrology.

Published in:

Pertanika Journal of Social Sciences & Humanities, 2020, v. 28, n. 2, p. 1199

By:

Pasaribu, Muldri Pudamo James;
Sirait, Ningrum Natasya

Publication type:

Article

ORGANIZAŢIA INTERNAŢIONALĂ DE METROLOGIE LEGALĂ - Consolidând calea spre un Sistem Metrologic Global.

Published in:

Revista Metrologie, 2012, v. 59, n. 3/4, p. 6

By:

IACOBESCU, Fănel

Publication type:

Article

LOOKING TO THE FUTURE OF EUROPEAN METROLOGY.

Published in:

Revista Metrologie, 2011, v. 58, n. 3, p. 4

By:

Pendrill, Leslie R.

Publication type:

Article

Quantum Dots Microstructural Metrology: From Time‐Resolved Spectroscopy to Spatially Resolved Electron Microscopy.

Published in:

Particle & Particle Systems Characterization, 2020, v. 37, n. 12, p. 1, doi. 10.1002/ppsc.202000192

By:

Kudilatt, Hasna;
Hou, Bo;
Welland, Mark E.

Publication type:

Article

Quantum Optics Parity Effect on Generalized NOON States and Its Implications for Quantum Metrology.

Published in:

Annalen der Physik, 2022, v. 534, n. 12, p. 1, doi. 10.1002/andp.202200304

By:

Migliore, Agostino;
Messina, Antonino

Publication type:

Article

Improving Quantum Metrology via Purifying and Distilling Noisy Probe States.

Published in:

Annalen der Physik, 2019, v. 531, n. 9, p. N.PAG, doi. 10.1002/andp.201900050

By:

Zhao, Jun‐Long;
Kong, Fan‐Zhen;
Chu, Wen‐Jing;
Yang, Ming;
Cao, Zhuo‐Liang

Publication type:

Article

Single‐Electron Pumps and Quantum Current Metrology in the Revised SI.

Published in:

Annalen der Physik, 2019, v. 531, n. 5, p. N.PAG, doi. 10.1002/andp.201800371

By:

Scherer, Hansjörg;
Schumacher, Hans Werner

Publication type:

Article

Assessment of the Impact of Metrology on the Economy: New Methodology.

Published in:

Measurement Techniques, 2020, v. 63, n. 8, p. 660, doi. 10.1007/s11018-020-01836-7

By:

Chirkov, A. P.

Publication type:

Article

Are the Metrology Vocabulary (JCGM VIM) and the ISO and CLSI Vocabulary for Medical Laboratories Divergent?

Published in:

Metrology, 2025, v. 4, n. 1, p. 18, doi. 10.3390/metrology5010018

By:

Pradella, Marco

Publication type:

Article

3D Model-Based Large-Volume Metrology Supporting Smart Manufacturing and Digital Twin Concepts.

Published in:

Metrology, 2023, v. 3, n. 1, p. 29, doi. 10.3390/metrology3010002

By:

Lindqvist, Richard P.;
Strand, Daniel;
Nilsson, Mikael;
Collins, Victor;
Torstensson, Johan;
Kressin, Jonas;
Spensieri, Domenico;
Archenti, Andreas

Publication type:

Article

Simulation of an Aeronautical Product Assembly Process Driven by a Metrology Aided Virtual Approach.

Published in:

Metrology, 2022, v. 2, n. 4, p. 427, doi. 10.3390/metrology2040026

By:

Kortaberria, Gorka;
Mutilba, Unai;
Eguskiza, Jon;
Martins, Joel

Publication type:

Article

Methodology to Evaluate the Performance of Portable Photogrammetry for Large-Volume Metrology.

Published in:

Metrology, 2022, v. 2, n. 3, p. 320, doi. 10.3390/metrology2030020

By:

Puerto, Pablo;
Heißelmann, Daniel;
Müller, Simon;
Mendikute, Alberto

Publication type:

Article

Design and Implementation of Time Metrology Vocabulary Ontology.

Published in:

Electronics (2079-9292), 2024, v. 13, n. 14, p. 2828, doi. 10.3390/electronics13142828

By:

Du, Mingxin;
Gao, Boyong;
Wang, Shuaizhe;
Liu, Zilong;
Xiong, Xingchuang;
Luo, Yuqi

Publication type:

Article

Time Domain Simulated Characterization of the Coplanar Waveguide in an On-Chip System for Millimeter Waveform Metrology.

Published in:

Electronics (2079-9292), 2024, v. 13, n. 1, p. 145, doi. 10.3390/electronics13010145

By:

Zhao, Kejia;
Chen, He;
Li, Xiangjun;
Sun, Jie;
Li, Bo;
Yan, Dexian;
Li, Lanlan

Publication type:

Article

Manipulation of Vehicle Scales in Legal Metrology.

Published in:

Akademika, 2025, v. 95, n. 1, p. 459, doi. 10.17576/akad-2025-9501-26

By:

RAMLEY, ASMAZATUL ADAWIYAH;
BIN ABD RAHMAN, MOHAMAD RIZAL;
SHUKUR, ZARINA;
IBRAHIM, MUHAMMAD AZWAN

Publication type:

Article

Metrology in chemistry – a rocky road.

Published in:

Microchimica Acta, 2008, v. 162, n. 1/2, p. 35, doi. 10.1007/s00604-007-0909-6

By:

Kipphardt, Heinrich;
Matschat, Ralf;
Panne, Ulrich

Publication type:

Article

The evolution of large-scale dimensional metrology from the perspective of scientific articles and patents.

Published in:

International Journal of Advanced Manufacturing Technology, 2014, v. 70, n. 5-8, p. 887, doi. 10.1007/s00170-013-5317-y

By:

Franceschini, Fiorenzo;
Maisano, Domenico

Publication type:

Article

Data Analytics for Noise Reduction in Optical Metrology of Reflective Planar Surfaces.

Published in:

Machines, 2022, v. 10, n. 1, p. 25, doi. 10.3390/machines10010025

By:

Berry, Cody;
Tsuzuki, Marcos S. G.;
Barari, Ahmad

Publication type:

Article

The coherence function and its information content for optical metrology.

Published in:

Technisches Messen, 2022, v. 89, n. 6, p. 397, doi. 10.1515/teme-2022-0048

By:

Bergmann, Ralf B.;
Fischer, Andreas;
Bockelmann, Carsten;
Dekorsy, Armin;
Garcia-Ortiz, Alberto;
Falldorf, Claas

Publication type:

Article

Legal Metrology in Electrotechnical Expertise Practices at Courts on Electrical Energy Bills Forgery Cases.

Published in:

Measurements, 2009, v. 44, n. 2, p. 9

By:

Radzevičius, L.;
Radzevičius, E.

Publication type:

Article

Harmonization of the EU and Lithuanian Normative Documents in Legal Metrology.

Published in:

Measurements, 2009, v. 43, n. 1, p. 5

By:

Meškuotiene, A.;
Žilinskas, R. P.

Publication type:

Article

Advances and Prospects of Digital Metrology.

Published in:

Computer-Aided Design & Applications, 2012, v. 9, n. 6, p. 825, doi. 10.3722/cadaps.2012.825-835

By:

Jie Shen;
David Yoon

Publication type:

Article

Wool metrology research and development to date.

Published in:

Textile Progress, 2015, v. 47, n. 3, p. 163, doi. 10.1080/00405167.2015.1108543

By:

Cottle, D.J.;
Baxter, B.P.

Publication type:

Article

Aleatoric and Epistemic Uncertainty in Soft Metrology: A Perspective Based on Ensuring the Validity of Results.

Published in:

Ingeniería (0121-750X), 2023, v. 28, n. 2, p. 1, doi. 10.14483/23448393.18883

By:

Agudelo-Cardona, Valentina;
Natalia Barbosa, Íngrid;
Vallejo, Marcela;
Bahamón-Cortés, Nelson;
Delgado-Trejos, Edilson

Publication type:

Article

Legal Metrology and System for Calibration and Verification of the Radar Level Sensors.

Published in:

Quality Innovation Prosperity / Kvalita Inovácia Prosperita, 2016, v. 20, n. 1, p. 95, doi. 10.12776/QIP.V20I1.694

By:

Markovič, Jaromír;
Mihok, Jozef;
Ďuriš, Stanislav;
Schreier, Zbynĕk

Publication type:

Article

Extending the notion of quality from physical metrology to information and sustainability.

Published in:

Journal of Intelligent Manufacturing, 2011, v. 22, n. 5, p. 737, doi. 10.1007/s10845-009-0333-3

By:

Ameta, Gaurav;
Rachuri, Sudarsan;
Fiorentini, Xenia;
Mani, Mahesh;
Fenves, Steven;
Lyons, Kevin;
Sriram, Ram

Publication type:

Article

An improved virtual metrology method in chemical vapor deposition systems via multitask gaussian processes and adaptive active learning.

Published in:

International Journal of Advanced Manufacturing Technology, 2022, v. 122, n. 7/8, p. 3149, doi. 10.1007/s00170-022-10115-4

By:

Ji, Shanling;
Dai, Min;
Wen, Haiying;
Zhang, Hui;
Zhang, Zhisheng;
Xia, Zhijie;
Zhu, Jianxiong

Publication type:

Article

Optical metrology for digital manufacturing: a review.

Published in:

International Journal of Advanced Manufacturing Technology, 2022, v. 120, n. 7/8, p. 4271, doi. 10.1007/s00170-022-09084-5

By:

Catalucci, Sofia;
Thompson, Adam;
Piano, Samanta;
Branson III, David T.;
Leach, Richard

Publication type:

Article

Reference-based Virtual Metrology method with uncertainty evaluation for Material Removal Rate prediction based on Gaussian Process Regression.

Published in:

International Journal of Advanced Manufacturing Technology, 2021, v. 116, n. 3/4, p. 1199, doi. 10.1007/s00170-021-07427-2

By:

Cai, Haoshu;
Feng, Jianshe;
Yang, Qibo;
Li, Fei;
Li, Xiang;
Lee, Jay

Publication type:

Article

Verification of a laser tracker with an indexed metrology platform.

Published in:

International Journal of Advanced Manufacturing Technology, 2016, v. 84, n. 1-4, p. 595, doi. 10.1007/s00170-015-7648-3

By:

Acero, R.;
Santolaria, J.;
Pueo, M.;
Brau, A.

Publication type:

Article

Role of National Metrology Institutes for Comparable Measurements

Published in:

Communications in Soil Science & Plant Analysis, 2006, v. 37, n. 15-20, p. 2095, doi. 10.1080/00103620600812607

By:

Mitani, Yoshito

Publication type:

Article

Strategic Priorities of the Scientific Plan of the European Research Infrastructure METROFOOD-RI for Promoting Metrology in Food and Nutrition.

Published in:

Foods, 2022, v. 11, n. 4, p. 599, doi. 10.3390/foods11040599

By:

Tsimidou, Maria Z.;
Ordoudi, Stella A.;
Mantzouridou, Fani Th.;
Nenadis, Nikolaos;
Stelzl, Tamara;
Rychlik, Michael;
Belc, Nastasia;
Zoani, Claudia

Publication type:

Article

Advanced environmental control as a key component in the development of ultrahigh accuracy ex situ metrology for x-ray optics.

Published in:

Optical Engineering, 2015, v. 54, n. 10, p. 104104-1, doi. 10.1117/1.OE.54.10.104104

By:

Yashchuk, Valeriy V.;
Artemiev, Nikolay A.;
Lacey, Ian;
McKinney, Wayne R.;
Padmore, Howard A.

Publication type:

Article

Optical displacement metrology using alternating direction Moire.

Published in:

Optical Engineering, 2014, v. 53, n. 8, p. 1, doi. 10.1117/1.OE.53.8.084101

By:

Kyoichi Suwa;
Koji Kaise;
Hiroki Tateno;
Nobutaka Magome

Publication type:

Article

Real-time position and orientation measurement with occlusion handling for distributed optical large-scale metrology systems.

Published in:

Optical Engineering, 2013, v. 52, n. 11, p. 1, doi. 10.1117/1.OE.52.11.114101

By:

Zhexu Liu;
Jigui Zhu;
Linghui Yang;
Shenghua Ye;
Jun Wu;
Bin Xue

Publication type:

Article

Calibration and alignment of metrology system for the Nuclear Spectroscopic Telescope Array mission.

Published in:

Optical Engineering, 2012, v. 51, n. 4, p. 1, doi. 10.1117/1.OE.51.4.043605

By:

Liebe, Carl Christian;
Craig, William;
Yunjin Kim;
McLean, Ryan;
Meras Jr., Patrick;
Raffanti, Michael;
Scholz, Christopher

Publication type:

Article

Optical In-Process Measurement: Concepts for Precise, Fast and Robust Optical Metrology for Complex Measurement Situations.

Published in:

Applied Sciences (2076-3417), 2021, v. 11, n. 22, p. 10533, doi. 10.3390/app112210533

By:

Bergmann, Ralf B.;
Kalms, Michael;
Falldorf, Claas

Publication type:

Article

Parameters Adjustment Optimization for Prepreg of Copper Clad Laminate Based on Virtual Metrology.

Published in:

Applied Sciences (2076-3417), 2020, v. 10, n. 23, p. 8488, doi. 10.3390/app10238488

By:

Kuo, Yiyo;
Chen, Ssu-Han

Publication type:

Article

A Review of Lithium‐Ion Battery Electrode Drying: Mechanisms and Metrology.

Published in:

Advanced Energy Materials, 2022, v. 12, n. 2, p. 1, doi. 10.1002/aenm.202102233

By:

Zhang, Ye Shui;
Courtier, Nicola E.;
Zhang, Zhenyu;
Liu, Kailong;
Bailey, Josh J.;
Boyce, Adam M.;
Richardson, Giles;
Shearing, Paul R.;
Kendrick, Emma;
Brett, Dan J. L.

Publication type:

Article