Surface Analysis by MeV Ion Beams and Microscopy.Published in:Microscopy & Microanalysis, 2009, v. 15, n. S3, p. 87, doi. 10.1017/S1431927609990894By:de Carvalho, José A. R. Pacheco;Pacheco, Cláudia F. F. P. R.;Reis, António D.Publication type:Article