Works matching Ion beams

Results: 5000

Achievement of Long-Focus Ion Beams on the High Voltage Test Bench for Heavy Ion Beam Probe Diagnostics on the T-15MD Tokamak.

Published in:

Physics of Atomic Nuclei, 2024, v. 87, n. 9, p. 1373, doi. 10.1134/S1063778824090436

By:

Vadimov, N. A.;
Vinitsky, E. A.;
Eliseev, L. G.;
Kharchev, N. K.;
Melnikov, A. V.;
Sarancha, G. A.;
Drabinsky, M. A.

Publication type:

Article

Photonic crystals in lithium niobate by combining focussed ion beam writing and ion-beam enhanced etching.

Published in:

Physica Status Solidi. A: Applications & Materials Science, 2014, v. 211, n. 10, p. 2421, doi. 10.1002/pssa.201431328

By:

Geiss, Reinhard;
Diziain, Séverine;
Steinert, Michael;
Schrempel, Frank;
Kley, Ernst‐Bernhard;
Tünnermann, Andreas;
Pertsch, Thomas

Publication type:

Article

3-D SRIM Simulation of Focused Ion Beam Sputtering with an Application-Oriented Incident Beam Model.

Published in:

Applied Sciences (2076-3417), 2019, v. 9, n. 23, p. 5133, doi. 10.3390/app9235133

By:

Zhao, Lirong;
Cui, Yimin;
Li, Wenping;
Khan, Wajid Ali;
Ma, Yutian

Publication type:

Article

Nano‐Kirigami Structures and Branched Nanowires Fabricated by Focused Ion Beam‐Induced Milling, Bending, and Deposition.

Published in:

Advanced Materials Interfaces, 2022, v. 9, n. 28, p. 1, doi. 10.1002/admi.202200696

By:

Xia, Deying;
Notte, John

Publication type:

Article

Application the Ion Beam Sputtering Deposition Technique for the Development of Spin-Wave Structures on Ferroelectric Substrates.

Published in:

Ceramics (2571-6131), 2023, v. 6, n. 3, p. 1415, doi. 10.3390/ceramics6030087

By:

Sharko, Sergei A.;
Serokurova, Aleksandra I.;
Novitskii, Nikolay N.;
Ketsko, Valerii A.;
Stognij, Alexandre I.

Publication type:

Article

Quantifying Patterned Features on Material Surfaces Created using Ga Ion Beam in FIB-SEM.

Published in:

Microscopy & Microanalysis, 2025, v. 31, n. 2, p. 1, doi. 10.1093/mam/ozaf001

By:

Ghosh, Supriya;
Mkhoyan, K Andre

Publication type:

Article

In Situ Focused Ion Beam Redeposition Surface Coatings for Site-Specific, Near-Surface Characterization by Atom Probe Tomography.

Published in:

Microscopy & Microanalysis, 2025, v. 31, n. 1, p. 1, doi. 10.1093/mam/ozae126

By:

Guerguis, Bavley;
Cuduvally, Ramya;
Arcuri, Gabriel;
Pourbahari, Bita;
McDermid, Joseph R;
Pawlowicz, Chris;
Langelier, Brian;
Bassim, Nabil

Publication type:

Article

Direct Insights on Flax Fiber Structure by Focused Ion Beam Microscopy.

Published in:

Microscopy & Microanalysis, 2010, v. 16, n. 2, p. 175, doi. 10.1017/S1431927609991292

By:

Domenges, Bernadette;
Charlet, Karine

Publication type:

Article

Transport of a Low-Energy Ion Beam with Ballistic Focusing.

Published in:

Plasma Physics Reports, 2021, v. 47, n. 8, p. 840, doi. 10.1134/S1063780X21080079

By:

Koval', T. V.;
Tarakanov, V. P.

Publication type:

Article

Depth Profile Analysis on the Nanometer Scale by a Combination of Electron Probe Microanalysis (EPMA) and Focused Ion Beam Specimen Preparation (FIB).

Published in:

Microchimica Acta, 2004, v. 145, n. 1-4, p. 187, doi. 10.1007/s00604-003-0151-9

By:

Richter, Silvia;
Bückins, Matthias;
Aretz, Anke;
Kyrsta, Stepan;
Spähn, Michael;
Mayer, Joachim

Publication type:

Article

Designing a Solenoid for a Light Ion Beam Focusing.

Published in:

Physics of Atomic Nuclei, 2022, v. 85, n. 9, p. 1551, doi. 10.1134/S1063778822090174

By:

Kilmetova, I. V.;
Kozlov, A. V.;
Kulevoy, T. V.;
Stasevich, Yu. B.;
Ziiatdinova, A. V.;
Fedin, P. A.;
Pryanishnikov, K. E.

Publication type:

Article

Mutant induction in gametophytes of Undaria pinnatifida (Phaeophyceae) by heavy ion beam irradiation.

Published in:

Phycological Research, 2020, v. 68, n. 1, p. 63, doi. 10.1111/pre.12397

By:

Hirano, Tomonari;
Sato, Yoichi;
Ichinose, Katsunori;
Yamada, Mieko;
Hayashi, Yoriko;
Fukunishi, Nobuhisa;
Abe, Tomoko

Publication type:

Article

The change of the domain wall shape under the ion beam irradiation in lithium niobate.

Published in:

Journal of Advanced Dielectrics, 2025, v. 15, n. 2, p. 1, doi. 10.1142/S2010135X24500152

By:

Pashnina, Elena;
Slautina, Alla;
Akhmatkhanov, Andrey;
Chuvakova, Maria;
Shur, Vladimir

Publication type:

Article

Effect of Focused Ion Beam Irradiation on Superconducting Nanowires.

Published in:

Journal of Superconductivity & Novel Magnetism, 2022, v. 35, n. 3, p. 657, doi. 10.1007/s10948-021-06098-0

By:

Shani, Lior;
Fried, Avital;
Fleger, Yafit;
Girshevitz, Olga;
Sharoni, Amos;
Yeshurun, Yosef

Publication type:

Article

Direct‐Writing of 2D Diodes by Focused Ion Beams (Adv. Funct. Mater. 34/2021).

Published in:

Advanced Functional Materials, 2021, v. 31, n. 34, p. 1, doi. 10.1002/adfm.202170248

By:

Liu, Yanran;
Qu, Yuanyuan;
Liu, Yue;
Yin, Hang;
Liu, Jinglun;
Tan, Yang;
Chen, Feng

Publication type:

Article

Direct‐Writing of 2D Diodes by Focused Ion Beams.

Published in:

Advanced Functional Materials, 2021, v. 31, n. 34, p. 1, doi. 10.1002/adfm.202102708

By:

Liu, Yanran;
Qu, Yuanyuan;
Liu, Yue;
Yin, Hang;
Liu, Jinglun;
Tan, Yang;
Chen, Feng

Publication type:

Article

Combined figuring technology for high-precision optical surfaces using a deterministic ion beam material adding and removal method.

Published in:

Optical Engineering, 2013, v. 52, n. 1, p. 010503-1, doi. 10.1117/1.OE.52.1.010503

By:

Wenlin Liao;
Yifan Dai;
Xuhui Xie;
Lin Zhou

Publication type:

Article

Corrective capability analysis and machining error control in ion beam figuring of high-precision optical mirrors.

Published in:

Optical Engineering, 2012, v. 51, n. 3, p. 033402-1, doi. 10.1117/1.OE.51.3.033402

By:

Wenlin Liao;
Yifan Dai;
Xuhui Xie;
Lin Zhou;
Zheng Yuan

Publication type:

Article

Influence of the Secondary Ion Beam Source on the Laser Damage Mechanism and Stress Evolution of IBS Hafnia Layers.

Published in:

Applied Sciences (2076-3417), 2021, v. 11, n. 1, p. 189, doi. 10.3390/app11010189

By:

Stevanovic, Igor;
Balogh-Michels, Zoltán;
Bächli, Andreas;
Wittwer, Valentin J.;
Südmeyer, Thomas;
Stuck, Alexander;
Gischkat, Thomas

Publication type:

Article

Enhanced planarization technology by reactive ion beam etching and using a nanoimprint resist.

Published in:

Applied Physics A: Materials Science & Processing, 2025, v. 131, n. 6, p. 1, doi. 10.1007/s00339-025-08540-9

By:

Lingenfelder, Lukas P.;
Finzel, Annemarie;
Dornberg, Gregor;
Zajadacz, Joachim;
Frost, Frank

Publication type:

Article

On the Effect of Etching with a Focused Ga+ Ion Beam in the Energy Range 12–30 keV on the Luminescent Properties of the Al0.18Ga0.82As/GaAs/Al0.18Ga0.82As Heterostructure.

Published in:

Semiconductors, 2023, v. 57, n. 6, p. 316, doi. 10.1134/S1063782623080171

By:

Voznyuk, G. V.;
Grigorenko, I. N.;
Lila, A. S.;
Mitrofanov, M. I.;
Nikolaev, D. N.;
Evtikhiev, V. P.

Publication type:

Article

Simulation of Material Sputtering and Gallium Implantation during Focused Ion Beam Irradiation of a Silicon Substrate.

Published in:

Semiconductors, 2023, v. 57, n. 1, p. 58, doi. 10.1134/S1063782623010086

By:

Podorozhniy, O. V.;
Rumyantsev, A. V.;
Volkov, R. L.;
Borgardt, N. I.

Publication type:

Article

Simulation of Silicon Carbide Sputtering by a Focused Gallium Ion Beam.

Published in:

Semiconductors, 2022, v. 56, n. 13, p. 487, doi. 10.1134/S1063782622130085

By:

Rumyantsev, A. V.;
Podorozhniy, O. V.;
Volkov, R. L.;
Borgardt, N. I.

Publication type:

Article

Effect of Annealing on Luminescence of InGaN/GaN Structures Etched by a Focused Ion Beam.

Published in:

Semiconductors, 2019, v. 53, n. 16, p. 2121, doi. 10.1134/S106378261912025X

By:

Sakharov, A. V.;
Usov, S. O.;
Rodin, S. N.;
Lundin, W. V.;
Tsatsulnikov, A. F.;
Mitrofanov, M. I.;
Levitskii, I. V.;
Voznyuk, G. V.;
Kaliteevskii, M. A.;
Evtikhiev, V. P.

Publication type:

Article

Evolution of Rutherford's ion beam science to applied research activities at GNS Science.

Published in:

Journal of the Royal Society of New Zealand, 2021, v. 51, n. 3/4, p. 574, doi. 10.1080/03036758.2021.1897021

By:

Kennedy, John V.;
Trompetter, William Joseph;
Murmu, Peter P.;
Leveneur, Jerome;
Gupta, Prasanth;
Fiedler, Holger;
Fang, Fang;
Futter, John;
Purcell, Chris

Publication type:

Article

Nano‐Kirigami Structures and Branched Nanowires Fabricated by Focused Ion Beam‐Induced Milling, Bending, and Deposition (Adv. Mater. Interfaces 28/2022).

Published in:

Advanced Materials Interfaces, 2022, v. 9, n. 28, p. 1, doi. 10.1002/admi.202270155

By:

Xia, Deying;
Notte, John

Publication type:

Article

Physiological and Differential Proteomic Analysis at Seedling Stage by Induction of Heavy-Ion Beam Radiation in Wheat Seeds.

Published in:

Frontiers in Genetics, 2022, v. 13, p. 1, doi. 10.3389/fgene.2022.942806

By:

Yuqi Li;
Jiayu Gu;
Irshad, Ahsan;
Linshu Zhao;
Huijun Guo;
Hongchun Xiong;
Yongdun Xie;
Shirong Zhao;
Yuping Ding;
Libin Zhou;
Fuquan Kong;
Zhengwu Fang;
Luxiang Liu

Publication type:

Article

Formation of High-Power Pulsed Titanium Ion Beams of Submillisecond Duration from Vacuum Arc Plasma.

Published in:

Russian Physics Journal, 2023, v. 65, n. 11, p. 1940, doi. 10.1007/s11182-023-02854-y

By:

Ryabchikov, A. I.;
Dektyarev, S. V.;
Korneva, O. S.;
Vakhrushev, D. O.

Publication type:

Article

Space Charge Lenses for Intensive Ion Beams Formation.

Published in:

Acta Physica Polonica: A, 2019, v. 135, n. 4, p. 841, doi. 10.12693/APhysPolA.135.841

By:

HASANOV, I. S.;
ORUDJEV, V. A.;
GURBANOV, I. I.;
AKBAROV, E. M.

Publication type:

Article

Development of an Argon Gas Cluster Ion Beam for ToF‐SIMS Analysis.

Published in:

Bulletin of the Korean Chemical Society, 2019, v. 40, n. 9, p. 877, doi. 10.1002/bkcs.11840

By:

Lee, Sang Ju;
Choi, Chang Min;
Min, Boo Ki;
Baek, Ji Young;
Eo, Jae Yeong;
Choi, Myoung Choul

Publication type:

Article

Modification of Keggin anion structure with ion beams—A new spectroscopic insights into the effects of keV‐ and MeV‐ion beam irradiation on 12‐tungstophosphoric acid.

Published in:

Journal of Raman Spectroscopy, 2022, v. 53, n. 11, p. 1974, doi. 10.1002/jrs.6423

By:

Mravik, Željko;
Bajuk‐Bogdanović, Danica;
Jovanović, Sonja;
Rmuš, Jelena;
Olejniczak, Andrzej;
Mraković, Ana;
Lazarević, Jasmina;
Uskoković‐Marković, Snežana;
Lazarević, Nenad;
Skuratov, Vladimir;
Jovanović, Zoran

Publication type:

Article

Limiting Damage to 2D Materials during Focused Ion Beam Processing.

Published in:

Physica Status Solidi (B), 2020, v. 257, n. 12, p. 1, doi. 10.1002/pssb.202000318

By:

Andersen, Anton Bay;
Shivayogimath, Abhay;
Booth, Tim;
Kadkhodazadeh, Shima;
Hansen, Thomas Willum

Publication type:

Article

A Comparative Study of Gallium-, Xenon-, and Helium-Focused Ion Beams for the Milling of GaN.

Published in:

Nanomaterials (2079-4991), 2023, v. 13, n. 21, p. 2898, doi. 10.3390/nano13212898

By:

Jiang, Shuai;
Ortalan, Volkan

Publication type:

Article

Detection of ZrO2 Nanoparticles in Lung Tissue Sections by Time-of-Flight Secondary Ion Mass Spectrometry and Ion Beam Microscopy.

Published in:

Nanomaterials (2079-4991), 2018, v. 8, n. 1, p. 44, doi. 10.3390/nano8010044

By:

Veith, Lothar;
Böttner, Julia;
Vennemann, Antje;
Breitenstein, Daniel;
Engelhard, Carsten;
Meijer, Jan;
Estrela-Lopis, Irina;
Wiemann, Martin;
Hagenhoff, Birgit

Publication type:

Article

Nanoporous Structure Formation on the Surface of InSb by Ion Beam Irradiation.

Published in:

Nanomaterials (2079-4991), 2017, v. 7, n. 8, p. 204, doi. 10.3390/nano7080204

By:

Takashi Miyaji;
Noriko Nitta

Publication type:

Article

Controllable Fabrication of Gallium Ion Beam on Quartz Nanogrooves.

Published in:

Micromachines, 2024, v. 15, n. 9, p. 1105, doi. 10.3390/mi15091105

By:

Mo, Peizhen;
Cheng, Jinyan;
Xu, Qiuchen;
Liu, Hongru;
Wang, Chengyong;
Li, Suyang;
Yuan, Zhishan

Publication type:

Article

Atomic Depth Image Transfer of Large-Area Optical Quartz Materials Based on Pulsed Ion Beam.

Published in:

Micromachines, 2024, v. 15, n. 7, p. 914, doi. 10.3390/mi15070914

By:

Ran, Shuyang;
Wen, Kefan;
Xie, Lingbo;
Zhou, Xingyu;
Tian, Ye;
Qiao, Shuo;
Shi, Feng;
Peng, Xing

Publication type:

Article

Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions.

Published in:

Micromachines, 2019, v. 10, n. 12, p. 799, doi. 10.3390/mi10120799

By:

De Teresa, José María;
Orús, Pablo;
Córdoba, Rosa;
Philipp, Patrick

Publication type:

Article

Local Structural Modifications in Metallic Micropillars Induced by Plasma Focused Ion Beam Processing.

Published in:

Materials (1996-1944), 2023, v. 16, n. 22, p. 7220, doi. 10.3390/ma16227220

By:

Singh, Kritika;
Rout, Surya Snata;
Krywka, Christina;
Davydok, Anton

Publication type:

Article

Ion-Induced Lateral Damage in the Focused Ion Beam Patterning of Topological Insulator Bi 2 Se 3 Thin Films.

Published in:

Materials (1996-1944), 2023, v. 16, n. 6, p. 2244, doi. 10.3390/ma16062244

By:

Gracia-Abad, Rubén;
Sangiao, Soraya;
Kumar Chaluvadi, Sandeep;
Orgiani, Pasquale;
Teresa, José María De

Publication type:

Article

Comparative Sample Preparation Using Focused Ion Beam and Ultramicrotomy of Human Dental Enamel and Dentine for Multimicroscopic Imaging at Micro- and Nanoscale.

Published in:

Materials (1996-1944), 2022, v. 15, n. 9, p. 3084, doi. 10.3390/ma15093084

By:

Witzke, Katharina;
Frank, Marcus;
Specht, Olaf;
Schulz, Ute;
Oehlschläger, Claudia;
Behrend, Detlef;
Ottl, Peter;
Warkentin, Mareike

Publication type:

Article

Monitoring Carbon in Electron and Ion Beam Deposition within FIB-SEM.

Published in:

Materials (1996-1944), 2021, v. 14, n. 11, p. 3034, doi. 10.3390/ma14113034

By:

Farr, Nicholas T. H.;
Hughes, Gareth M.;
Rodenburg, Cornelia

Publication type:

Article

Creation of Controlled Defects Inside Colloidal Crystal Arrays with a Focused Ion Beam.

Published in:

Nanoscale Research Letters, 2010, v. 5, n. 7, p. 1182, doi. 10.1007/s11671-010-9623-0

By:

Magni, Simone;
Milani, Marziale

Publication type:

Article

In Situ Study of Nanostructure and Electrical Resistance of Nanocluster Films Irradiated with Ion Beams.

Published in:

Advanced Functional Materials, 2014, v. 24, n. 39, p. 6210, doi. 10.1002/adfm.201400553

By:

Jiang, Weilin;
Sundararajan, Jennifer A.;
Varga, Tamas;
Bowden, Mark E.;
Qiang, You;
McCloy, John S.;
Henager, Charles. H.;
Montgomery, Robert O.

Publication type:

Article

Fabrication of Specimens for Atom Probe Tomography Using a Combined Gallium and Neon Focused Ion Beam Milling Approach.

Published in:

Microscopy & Microanalysis, 2023, v. 29, n. 5, p. 1628, doi. 10.1093/micmic/ozad078

By:

Allen, Frances I;
Blanchard, Paul T;
Lake, Russell;
Pappas, David;
Xia, Deying;
Notte, John A;
Zhang, Ruopeng;
Minor, Andrew M;
Sanford, Norman A

Publication type:

Article

Polarimetry for 3 He Ion Beams from Laser–Plasma Interactions.

Published in:

Instruments (2410-390X), 2022, v. 6, n. 4, p. 61, doi. 10.3390/instruments6040061

By:

Zheng, Chuan;
Fedorets, Pavel;
Engels, Ralf;
Kannis, Chrysovalantis;
Engin, Ilhan;
Möller, Sören;
Swaczyna, Robert;
Feilbach, Herbert;
Glückler, Harald;
Lennartz, Manfred;
Pfeifer, Heinz;
Pfennings, Johannes;
Schneider, Claus M.;
Schnitzler, Norbert;
Soltner, Helmut;
Büscher, Markus

Publication type:

Article

Features of Electronic Emission from Surface of Dielectric Thin-film Materials with Ion-beam Etching.

Published in:

Journal of Nano- & Electronic Physics, 2014, v. 6, n. 3, p. 03031-1

By:

Kurochka, A.;
Sergienko, A.;
Kurochka, S.;
Kolybelkin, V.

Publication type:

Article

Miniaturized Supercapacitors: Focused Ion Beam Reduced Graphene Oxide Supercapacitors with Enhanced Performance Metrics.

Published in:

Advanced Energy Materials, 2015, v. 5, n. 19, p. n/a, doi. 10.1002/aenm.201570102

By:

Lobo, Derrek E.;
Banerjee, Parama Chakraborty;
Easton, Christopher D.;
Majumder, Mainak

Publication type:

Article

Anisotropic ion beam etching of fused silica to mitigate subsurface damage.

Published in:

International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2020, v. 34, n. 8, p. N.PAG, doi. 10.1142/S0217979220500605

By:

Li, Bo;
Xiang, Xia;
Tian, Chengxiang;
Hou, Chunyuan;
Liao, Wei;
Deng, Hongxiang;
Jiang, Xiaolong;
Wang, Haijun;
Yuan, Xiaodong;
Jiang, Xiaodong;
Zu, Xiaotao

Publication type:

Article

High-molecular-weight glutenin subunit-deficient mutants induced by ion beam and the effects of Glu-1 loci deletion on wheat quality properties.

Published in:

Journal of the Science of Food & Agriculture, 2016, v. 96, n. 4, p. 1289, doi. 10.1002/jsfa.7221

By:

Zhang, Lujun;
Chen, Qiufang;
Su, Mingjie;
Yan, Biao;
Zhang, Xiangqi;
Jiao, Zhen

Publication type:

Article