Works matching IS 8756758X AND DT 2005 AND VI 28 AND IP 8
Results: 12
Micromechanical testing of SU-8 cantilevers.
- Published in:
- Fatigue & Fracture of Engineering Materials & Structures, 2005, v. 28, n. 8, p. 735, doi. 10.1111/j.1460-2695.2005.00873.x
- By:
- Publication type:
- Article
Mechanical characterization of single crystal silicon and UV-LIGA nickel thin films using tensile tester operated in AFM.
- Published in:
- Fatigue & Fracture of Engineering Materials & Structures, 2005, v. 28, n. 8, p. 675, doi. 10.1111/j.1460-2695.2005.00883.x
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- Publication type:
- Article
Advanced resonant ultrasound spectroscopy for measuring anisotropic elastic constants of thin films.
- Published in:
- Fatigue & Fracture of Engineering Materials & Structures, 2005, v. 28, n. 8, p. 657, doi. 10.1111/j.1460-2695.2005.00885.x
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- Publication type:
- Article
Amorphous Mo–N and Mo–Si–N films in microelectromechanical systems.
- Published in:
- Fatigue & Fracture of Engineering Materials & Structures, 2005, v. 28, n. 8, p. 743, doi. 10.1111/j.1460-2695.2005.00887.x
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- Publication type:
- Article
Fracture tests of microsized TiAl specimens.
- Published in:
- Fatigue & Fracture of Engineering Materials & Structures, 2005, v. 28, n. 8, p. 695, doi. 10.1111/j.1460-2695.2005.00893.x
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- Publication type:
- Article
A study of the mechanical and fatigue properties of metallic microwires.
- Published in:
- Fatigue & Fracture of Engineering Materials & Structures, 2005, v. 28, n. 8, p. 723, doi. 10.1111/j.1460-2695.2005.00898.x
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- Publication type:
- Article
Tensile testing of silicon thin films.
- Published in:
- Fatigue & Fracture of Engineering Materials & Structures, 2005, v. 28, n. 8, p. 665, doi. 10.1111/j.1460-2695.2005.00910.x
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- Publication type:
- Article
Fracture toughness measurement of thin-film silicon.
- Published in:
- Fatigue & Fracture of Engineering Materials & Structures, 2005, v. 28, n. 8, p. 687, doi. 10.1111/j.1460-2695.2005.00920.x
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- Publication type:
- Article
Characterization of structural films using microelectromechanical resonators.
- Published in:
- Fatigue & Fracture of Engineering Materials & Structures, 2005, v. 28, n. 8, p. 711, doi. 10.1111/j.1460-2695.2005.00921.x
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- Publication type:
- Article
Fatigue and fracture of a Ni–P amorphous alloy thin film on the micrometer scale.
- Published in:
- Fatigue & Fracture of Engineering Materials & Structures, 2005, v. 28, n. 8, p. 703, doi. 10.1111/j.1460-2695.2005.00923.x
- By:
- Publication type:
- Article
Characterization of Micro/Nano Electro-Mechanical Systems (MEMS/NEMS).
- Published in:
- 2005
- By:
- Publication type:
- Editorial
Information on conferences/seminars.
- Published in:
- 2005
- Publication type:
- Other