Works matching IS 26738244 AND DT 2024 AND VI 4 AND IP 4

Results: 13

Advancing Molecular Spectroscopy Efficiency with Extensive Parallelism.

Published in:

Metrology, 2024, v. 4, n. 4, p. 736, doi. 10.3390/metrology4040043

By:

Li, Jiaqi;
Fernandez, Rodrigo;
Gutierrez, Bernardo;
Pedersen, Jan;
Zhou, Yan

Publication type:

Article

Novel Method of Fitting a Nonlinear Function to Data of Measurement Based on Linearization by Change Variables, Examples and Uncertainty.

Published in:

Metrology, 2024, v. 4, n. 4, p. 718, doi. 10.3390/metrology4040042

By:

Warsza, Zygmunt L.;
Puchalski, Jacek;
Więcek, Tomasz

Publication type:

Article

Reflectivity Thresholds and Optical Loss Predictions in Resonant Photonic Cavities.

Published in:

Metrology, 2024, v. 4, n. 4, p. 765, doi. 10.3390/metrology4040044

By:

Ferreira, Paulo Henrique Dias;
Amaral, Douglas Ramos do;
Tribuzi, Vinicius;
Marroquin, John Fredy Ricardo;
Felix, Jorlandio Francisco;
Ghiglieno, Filippo

Publication type:

Article

SurfILE: An Open-Source Python Package for Surface Topography Analysis.

Published in:

Metrology, 2024, v. 4, n. 4, p. 695, doi. 10.3390/metrology4040041

By:

Giura, Andrea;
Zucco, Massimo;
Ribotta, Luigi

Publication type:

Article

Investigation of the Measurement Systems' Suitability for the Non-Destructive Measurement of Complex Polymer-Based Micro and Nanostructures.

Published in:

Metrology, 2024, v. 4, n. 4, p. 673, doi. 10.3390/metrology4040040

By:

Burkert, Selina;
Schwörer, Lukas;
Schubert, Tim;
Grundmann, Jana;
Stein, David;
Heinrich, Andreas

Publication type:

Article

Differential Hall Effect Metrology for Electrical Characterization of Advanced Semiconductor Layers.

Published in:

Metrology, 2024, v. 4, n. 4, p. 547, doi. 10.3390/metrology4040034

By:

Basol, Bulent M.;
Joshi, Abhijeet

Publication type:

Article

Various Grids in Moiré Measurements.

Published in:

Metrology, 2024, v. 4, n. 4, p. 619, doi. 10.3390/metrology4040038

By:

Saveljev, Vladimir

Publication type:

Article

Evaluation of Image Segmentation Methods for In Situ Quality Assessment in Additive Manufacturing.

Published in:

Metrology, 2024, v. 4, n. 4, p. 598, doi. 10.3390/metrology4040037

By:

Saini, Tushar;
Shiakolas, Panos S.;
McMurrough, Christopher

Publication type:

Article

Accurate Technique for the Calibration of High-Voltage Capacitance and Dissipation Factor Bridges up to 1 kHz.

Published in:

Metrology, 2024, v. 4, n. 4, p. 578, doi. 10.3390/metrology4040036

By:

Agazar, Mohamed;
Saadeddine, Hanane

Publication type:

Article

Plantar Load System Analysis Using FSR Sensors and Interpolation Methods.

Published in:

Metrology, 2024, v. 4, n. 4, p. 566, doi. 10.3390/metrology4040035

By:

Trujillo-Hernández, Gabriel;
Ortiz-Villaseñor, Dayanna;
Rodríguez-Quiñonez, Julio C.;
Ramírez-Hernández, Luis Roberto;
Murrieta-Rico, Fabian N.;
Mercado-Herrera, Abelardo;
Raygoza-Limón, María E.;
Orduño-Osuna, Jesús Heriberto

Publication type:

Article

A Statistical Approach for Characterizing the Behaviour of Roughness Parameters Measured by a Multi-Physics Instrument on Ground Surface Topographies: Four Novel Indicators.

Published in:

Metrology, 2024, v. 4, n. 4, p. 640, doi. 10.3390/metrology4040039

By:

Moreau, Clément;
Lemesle, Julie;
Páez Margarit, David;
Blateyron, François;
Bigerelle, Maxence

Publication type:

Article

Using a Multivariate Virtual Experiment for Uncertainty Evaluation with Unknown Variance.

Published in:

Metrology, 2024, v. 4, n. 4, p. 534, doi. 10.3390/metrology4040033

By:

Marschall, Manuel;
Hughes, Finn;
Wübbeler, Gerd;
Kok, Gertjan;
van Dijk, Marcel;
Elster, Clemens

Publication type:

Article

Navigating Safer Car Routes Based on Measured Car Accidents.

Published in:

Metrology, 2024, v. 4, n. 4, p. 517, doi. 10.3390/metrology4040032

By:

Gandur, Nazir L.;
Ekwaro-Osire, Stephen;
Rasty, Jahan;
Parker, Olin;
Fernandes, Guilherme

Publication type:

Article