Works matching IS 26738244 AND DT 2022 AND VI 2 AND IP 2
1
- Metrology, 2022, v. 2, n. 2, p. 311, doi. 10.3390/metrology2020019
- Kok, Gertjan;
- Wübbeler, Gerd;
- Elster, Clemens
- Article
2
- Metrology, 2022, v. 2, n. 2, p. 293, doi. 10.3390/metrology2020018
- Liu, Yang;
- Liu, Jigou;
- Kennel, Ralph
- Article
3
- Metrology, 2022, v. 2, n. 2, p. 274, doi. 10.3390/metrology2020017
- Jamakatel, Prakash;
- Eberhardt, Maximilian;
- Kerber, Florian
- Article
4
- Metrology, 2022, v. 2, n. 2, p. 263, doi. 10.3390/metrology2020016
- Xu, Xin;
- Hagemeier, Sebastian;
- Lehmann, Peter
- Article
5
- Metrology, 2022, v. 2, n. 2, p. 241, doi. 10.3390/metrology2020015
- Guillory, Joffray;
- Truong, Daniel;
- Wallerand, Jean-Pierre
- Article
6
- Metrology, 2022, v. 2, n. 2, p. 230, doi. 10.3390/metrology2020014
- Skibicki, Jacek Dominik;
- Licow, Roksana
- Article
7
- Metrology, 2022, v. 2, n. 2, p. 216, doi. 10.3390/metrology2020013
- Dello Iacono, Salvatore;
- Di Leo, Giuseppe;
- Liguori, Consolatina;
- Paciello, Vincenzo
- Article
8
- Metrology, 2022, v. 2, n. 2, p. 180, doi. 10.3390/metrology2020012
- Holst, Christoph-Alexander;
- Lohweg, Volker
- Article
9
- Metrology, 2022, v. 2, n. 2, p. 161, doi. 10.3390/metrology2020011
- Article
10
- Metrology, 2022, v. 2, n. 2, p. 150, doi. 10.3390/metrology2020010
- Bystrov, Aleksandr;
- Wang, Yi;
- Gardner, Peter
- Article