Works matching IS 2520811X AND DT 2024 AND VI 7 AND IP 1
1
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00246-5
- Article
2
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00237-6
- Weng, Zhankun;
- Niu, Haobo;
- Wang, Rui;
- Zhong, Huazhen;
- Wang, Shenzhi;
- Liu, Ri;
- Zhu, Xiaona;
- Wang, Bowei;
- Li, Tao;
- Wang, Wei;
- Xu, Hongmei;
- Wang, Zuobin
- Article
3
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00245-6
- Article
4
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00241-w
- Liu, Tiancheng;
- Hong, Yutong;
- Wu, Jiajun;
- Zhu, Wule;
- Ju, Bingfeng
- Article
5
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00243-8
- Liu, Shiquan;
- An, Liang;
- Li, Hui;
- Fu, Xiang;
- Ju, Bing-Feng;
- Chen, Yuan-Liu
- Article
6
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00244-7
- Chen, Zhixian;
- Zhan, Zejin;
- Zhang, Junqi;
- Xiao, Yuxi;
- Deng, Hui
- Article
7
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00242-9
- Gao, Feng;
- Xu, Yongjia;
- Li, Yanling;
- Zhong, Wenbin;
- Yu, Yang;
- Li, Duo;
- Jiang, Xiangqian
- Article
8
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00240-x
- Wu, Kaiyue;
- Zhang, Jianfu;
- Zheng, Zhongpeng;
- Li, Zhiwei;
- Ding, Peiyuan;
- Liu, Jiahui;
- Wang, Jianjian
- Article
9
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00239-4
- Pirillo, Federico;
- Shao, Huan;
- Petrò, Stefano;
- Moroni, Giovanni
- Article
10
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00238-5
- Baker, Kaiya;
- Brown, Hayden;
- Gebre, Fisseha;
- Xu, Jiajun
- Article
11
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00235-8
- Berkson, Joel;
- Angel, Roger;
- Bender, Chad;
- Monson, Andrew;
- Gray, Peter;
- Schwab, Christian;
- Foster, Warren;
- Kim, Daewook
- Article
12
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00241-w
- Liu, Tiancheng;
- Hong, Yutong;
- Wu, Jiajun;
- Zhu, Wule;
- Ju, Bingfeng
- Article
13
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00234-9
- Wei, Xinyang;
- Mitchell, Alasdair;
- Sun, Rongyan;
- Yu, Nan;
- Yamamura, Kazuya
- Article
14
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00236-7
- Wang, Manfei;
- Xu, Jinkai;
- Ren, Wanfei;
- Yang, Zhengyi
- Article
15
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00233-w
- Guan, Yizhao;
- Masui, Shozo;
- Kadoya, Shotaro;
- Michihata, Masaki;
- Takahashi, Satoru
- Article
16
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00232-x
- Yoshikawa, Motoya;
- Fujii, Saeko;
- Kadoya, Shotaro;
- Sugihara, Tatsuya;
- Michihata, Masaki;
- Takahashi, Satoru
- Article
17
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00231-y
- Wang, Tao;
- Tian, Yanling;
- Lu, Zhilai;
- Wang, Weijie;
- Zhang, Zhao;
- Zhu, Guangwei;
- Tang, Hui;
- Zhang, Dawei
- Article
18
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00229-6
- Degenhardt, Johannes;
- Bounaim, Mohammed Wassim;
- Deng, Nan;
- Tutsch, Rainer;
- Dai, Gaoliang
- Article
19
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00230-z
- Zhang, Xu;
- Wang, Zi;
- Liu, Mengnan;
- Song, Zhengxun;
- Wang, Zuobin;
- Dong, Litong
- Article
20
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00228-7
- Dong, Jiaqi;
- Yao, Chengyuan;
- Zhu, Yuanhao;
- Li, Shaojie;
- Liu, Bowen;
- Fan, JinTao;
- Hu, Chunguang;
- Song, Youjian;
- Hu, Minglie
- Article
21
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00226-9
- Tang, Chuan;
- Chen, Lei;
- Qian, Linmao
- Article
22
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00225-w
- Berkson, Joel;
- Hyatt, Justin;
- Julicher, Nathan;
- Jeong, Byeongjoon;
- Pimienta, Isaac;
- Ball, Rachel;
- Ellis, Wyatt;
- Voris, Jason;
- Torres-Barajas, Diego;
- Kim, Daewook
- Article
23
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00224-x
- Liang, Huiqiang;
- Wei, Zhenghao;
- Fang, Jiongchong;
- Li, Yanming;
- Li, Changli;
- Xie, Zhirun;
- Ng, Yun Hau;
- Zeng, Guosong
- Article
24
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00223-y
- Sardhara, Trushal;
- Shkurmanov, Alexander;
- Li, Yong;
- Riedel, Lukas;
- Shi, Shan;
- Cyron, Christian J.;
- Aydin, Roland C.;
- Ritter, Martin
- Article
25
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-023-00219-0
- Wang, Pengfeng;
- Li, Yuntang;
- Gao, Xiang;
- Ye, Yueliang;
- Li, Ruirui;
- Li, Xiaolu;
- Chen, Yuan;
- Jin, Jie;
- Zhang, Cong
- Article
26
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-023-00221-6
- Wang, Shengtong;
- Luo, Linbin;
- Li, Xinghui
- Article
27
- Nanomanufacturing & Metrology, 2024, v. 7, n. 1, p. 1, doi. 10.1007/s41871-024-00222-z
- Zhang, Yuheng;
- Xu, Zongwei;
- Zhang, Kun;
- Song, Ying;
- Dong, Bing;
- Wang, Jianshi;
- Yan, Mengzhi;
- Sun, Qingqing
- Article