Works matching IS 2520811X AND DT 2022 AND VI 5 AND IP 4
Results: 28
Foreword to the Special Issue on the 7th International Conference on Nanomanufacturing (nanoMan2021).
- Published in:
- 2022
- By:
- Publication type:
- Editorial
Impact of Pulsed Laser Parameters and Scanning Pattern on the Properties of Thin-Walled Parts Manufactured Using Laser Metal Deposition.
- Published in:
- Nanomanufacturing & Metrology, 2022, v. 5, n. 4, p. 381, doi. 10.1007/s41871-022-00175-1
- By:
- Publication type:
- Article
Correction: Pure Metal Clusters with Atomic Precision for Nanomanufacturing.
- Published in:
- 2022
- By:
- Publication type:
- Correction Notice
Correction to: Indirect Measurement Methods for Quality and Process Control in Nanomanufacturing.
- Published in:
- 2022
- By:
- Publication type:
- Correction Notice
Correction: Research Activities of Nanodimensional Standards Using Atomic Force Microscopes, Transmission Electron Microscope, and Scanning Electron Microscope at the National Metrology Institute of Japan.
- Published in:
- 2022
- By:
- Publication type:
- Correction Notice
Correction: Flexible Evanescent Wave Interference Lithography System for Sub-half-Wavelength Complex Relief Structures Fabrication.
- Published in:
- 2022
- By:
- Publication type:
- Correction Notice
Adaptive Thermoforming and Structural Design of Millimeter-Wave Antenna Panels.
- Published in:
- Nanomanufacturing & Metrology, 2022, v. 5, n. 4, p. 327, doi. 10.1007/s41871-022-00169-z
- By:
- Publication type:
- Article
Correction: Verification of Characteristics of Gaussian Filter Series for Surface Roughness in ISO and Proposal of Filter Selection Guidelines.
- Published in:
- 2022
- By:
- Publication type:
- Correction Notice
Correction: A Proposal of Hyperbolic Fitting Method by Applying the Properties of Functions for Plateau Surface Analysis in ISO 13565–3.
- Published in:
- 2022
- By:
- Publication type:
- Correction Notice
Correction: A Proposal of a Spline Filter that Achieves Both Robustness and Lower Compatibility.
- Published in:
- 2022
- By:
- Publication type:
- Correction Notice
Correction: Comparison of EUV Photomask Metrology Between CD-AFM and TEM.
- Published in:
- 2022
- By:
- Publication type:
- Correction Notice
Correction: Closed-Loop Control of an XYZ Micro-Stage and Designing of Mechanical Structure for Reduction in Motion Errors.
- Published in:
- 2022
- By:
- Publication type:
- Correction Notice
Correction: Additive Manufacturing of Metal Micro-ring and Tube by Laser-Assisted Electrophoretic Deposition with Laguerre–Gaussian Beam.
- Published in:
- 2022
- By:
- Publication type:
- Correction Notice
Correction: Fundamental Investigations in the Design of Five-Axis Nanopositioning Machines for Measurement and Fabrication Purposes.
- Published in:
- 2022
- By:
- Publication type:
- Correction Notice
Correction: Active Air Venting of Mold Cavity to Improve Performance of Injection Molded Direct Joining.
- Published in:
- 2022
- By:
- Publication type:
- Correction Notice
Correction: Ghost Imaging with Deep Learning for Position Mapping of Weakly Scattered Light Source.
- Published in:
- 2022
- By:
- Publication type:
- Correction Notice
Correction: DMPFIT: A Tool for Atomic-Scale Metrology via Nonlinear Least-Squares Fitting of Peaks in Atomic-Resolution TEM Images.
- Published in:
- 2022
- By:
- Publication type:
- Correction Notice
Correction: Measurement Method of Internal Residual Stress in Plastic Parts Using Terahertz Spectroscopy.
- Published in:
- 2022
- By:
- Publication type:
- Correction Notice
Correction: Design and Development of Oblique-Incident Interferometer for Form Measurement of Hand-Scraped Surfaces.
- Published in:
- 2022
- By:
- Publication type:
- Correction Notice
Correction: In-Process Diameter Measurement Technique for Micro-optical Fiber with Standing Wave Illumination.
- Published in:
- 2022
- By:
- Publication type:
- Correction Notice
Correction: A Comprehensive FIB Lift-out Sample Preparation Method for Scanning Probe Microscopy.
- Published in:
- 2022
- By:
- Publication type:
- Correction Notice
Correction of Interferometric High-Order Nonlinearity Error in Metrological Atomic Force Microscopy.
- Published in:
- Nanomanufacturing & Metrology, 2022, v. 5, n. 4, p. 412, doi. 10.1007/s41871-022-00154-6
- By:
- Publication type:
- Article
Profile Compensation for Single-Point Diamond Turning of Microlens Array.
- Published in:
- Nanomanufacturing & Metrology, 2022, v. 5, n. 4, p. 403, doi. 10.1007/s41871-022-00147-5
- By:
- Publication type:
- Article
Precision Milling of Integrated Turbine Based on a Non-Contact On-Machine Measurement System.
- Published in:
- Nanomanufacturing & Metrology, 2022, v. 5, n. 4, p. 394, doi. 10.1007/s41871-022-00146-6
- By:
- Publication type:
- Article
Plowing-Extrusion Processes and Performance of Functional Surface Structures of Copper Current Collectors for Lithium-Ion Batteries.
- Published in:
- Nanomanufacturing & Metrology, 2022, v. 5, n. 4, p. 336, doi. 10.1007/s41871-022-00141-x
- By:
- Publication type:
- Article
Capillary Performance of Nanoporous Aluminum Braided Wicks Prepared by Anodic Oxidation.
- Published in:
- Nanomanufacturing & Metrology, 2022, v. 5, n. 4, p. 370, doi. 10.1007/s41871-022-00138-6
- By:
- Publication type:
- Article
Suppression Strategy of Micro-waviness error in Ultra-precision Parallel Grinding.
- Published in:
- Nanomanufacturing & Metrology, 2022, v. 5, n. 4, p. 423, doi. 10.1007/s41871-022-00130-0
- By:
- Publication type:
- Article
Numerical Analysis of Microchannels Designed for Heat Sinks.
- Published in:
- Nanomanufacturing & Metrology, 2022, v. 5, n. 4, p. 354, doi. 10.1007/s41871-021-00118-2
- By:
- Publication type:
- Article