Works matching IS 2520811X AND DT 2022 AND VI 5 AND IP 2
Results: 12
Foreword to the Special Issue on Atomic and Close-to-Atomic Scale Metrology.
- Published in:
- 2022
- By:
- Publication type:
- Editorial
Atomic Force Microscope with an Adjustable Probe Direction and Integrated Sensing and Actuation.
- Published in:
- Nanomanufacturing & Metrology, 2022, v. 5, n. 2, p. 139, doi. 10.1007/s41871-022-00143-9
- By:
- Publication type:
- Article
Scanning and Splicing Atom Lithography for Self-traceable Nanograting Fabrication.
- Published in:
- Nanomanufacturing & Metrology, 2022, v. 5, n. 2, p. 179, doi. 10.1007/s41871-022-00140-y
- By:
- Publication type:
- Article
DMPFIT: A Tool for Atomic-Scale Metrology via Nonlinear Least-Squares Fitting of Peaks in Atomic-Resolution TEM Images.
- Published in:
- Nanomanufacturing & Metrology, 2022, v. 5, n. 2, p. 101, doi. 10.1007/s41871-022-00137-7
- By:
- Publication type:
- Article
Slice Thickness Optimization for the Focused Ion Beam-Scanning Electron Microscopy 3D Tomography of Hierarchical Nanoporous Gold.
- Published in:
- Nanomanufacturing & Metrology, 2022, v. 5, n. 2, p. 112, doi. 10.1007/s41871-022-00134-w
- By:
- Publication type:
- Article
Origins of Ultrafast Pulse Laser-Induced Nano Straight Lines with Potential Applications in Detecting Subsurface Defects in Silicon Carbide Wafers.
- Published in:
- Nanomanufacturing & Metrology, 2022, v. 5, n. 2, p. 167, doi. 10.1007/s41871-022-00133-x
- By:
- Publication type:
- Article
Polarization Measurement Method Based on Liquid Crystal Variable Retarder (LCVR) for Atomic Thin-Film Thickness.
- Published in:
- Nanomanufacturing & Metrology, 2022, v. 5, n. 2, p. 159, doi. 10.1007/s41871-022-00131-z
- By:
- Publication type:
- Article
Automatic Measurement of Silicon Lattice Spacings in High-Resolution Transmission Electron Microscopy Images Through 2D Discrete Fourier Transform and Inverse Discrete Fourier Transform.
- Published in:
- Nanomanufacturing & Metrology, 2022, v. 5, n. 2, p. 119, doi. 10.1007/s41871-022-00129-7
- By:
- Publication type:
- Article
Analysis of Line-Edge Roughness Using EUV Scatterometry.
- Published in:
- Nanomanufacturing & Metrology, 2022, v. 5, n. 2, p. 149, doi. 10.1007/s41871-022-00126-w
- By:
- Publication type:
- Article
AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes.
- Published in:
- Nanomanufacturing & Metrology, 2022, v. 5, n. 2, p. 127, doi. 10.1007/s41871-022-00125-x
- By:
- Publication type:
- Article
Comparison of EUV Photomask Metrology Between CD-AFM and TEM.
- Published in:
- Nanomanufacturing & Metrology, 2022, v. 5, n. 2, p. 91, doi. 10.1007/s41871-022-00124-y
- By:
- Publication type:
- Article
Research Activities of Nanodimensional Standards Using Atomic Force Microscopes, Transmission Electron Microscope, and Scanning Electron Microscope at the National Metrology Institute of Japan.
- Published in:
- Nanomanufacturing & Metrology, 2022, v. 5, n. 2, p. 83, doi. 10.1007/s41871-021-00119-1
- By:
- Publication type:
- Article