Works matching IS 2520811X AND DT 2020 AND VI 3 AND IP 3
Results: 8
Foreword to the Special Issue on Nanofabrication, Atomic and Close-to-atomic Scale Manufacturing.
- Published in:
- 2020
- By:
- Publication type:
- Editorial
Centre for Precision Manufacturing.
- Published in:
- 2020
- By:
- Publication type:
- Editorial
On-Line Measurement Method for Diameter and Roundness Error of Balls.
- Published in:
- Nanomanufacturing & Metrology, 2020, v. 3, n. 3, p. 218, doi. 10.1007/s41871-020-00071-6
- By:
- Publication type:
- Article
PMMA-Based Microsphere Mask for Sub-wavelength Photolithography.
- Published in:
- Nanomanufacturing & Metrology, 2020, v. 3, n. 3, p. 199, doi. 10.1007/s41871-020-00070-7
- By:
- Publication type:
- Article
Remote Absolute Roll-Angle Measurement in Range of 180° Based on Polarization Modulation.
- Published in:
- Nanomanufacturing & Metrology, 2020, v. 3, n. 3, p. 228, doi. 10.1007/s41871-020-00069-0
- By:
- Publication type:
- Article
Algorithm of Micro-Grooving and Imaging Processing for the Generation of High-Resolution Structural Color Images.
- Published in:
- Nanomanufacturing & Metrology, 2020, v. 3, n. 3, p. 187, doi. 10.1007/s41871-020-00068-1
- By:
- Publication type:
- Article
Atomic and Close-to-Atomic Scale Manufacturing: A Review on Atomic Layer Removal Methods Using Atomic Force Microscopy.
- Published in:
- Nanomanufacturing & Metrology, 2020, v. 3, n. 3, p. 167, doi. 10.1007/s41871-020-00067-2
- By:
- Publication type:
- Article
Photoluminescence and Raman Spectroscopy Study on Color Centers of Helium Ion-Implanted 4H–SiC.
- Published in:
- Nanomanufacturing & Metrology, 2020, v. 3, n. 3, p. 205, doi. 10.1007/s41871-020-00061-8
- By:
- Publication type:
- Article