Works matching IS 23755636 AND DT 2022 AND VI 23
1
- Journal of Applied Testing Technology, 2022, v. 23, p. 54
- Becker, Kirk;
- Huijuan Meng
- Article
2
- Journal of Applied Testing Technology, 2022, v. 23, p. 46
- Muckle, Timothy J.;
- Yu Meng;
- Johnson, Samuel
- Article
3
- Journal of Applied Testing Technology, 2022, v. 23, p. 36
- Hurtz, Gregory M.;
- Weiner, John A.
- Article
4
- Journal of Applied Testing Technology, 2022, v. 23, p. 15
- Morin, Maxim;
- Alves, Cecilia;
- De Champlain, André
- Article
5
- Journal of Applied Testing Technology, 2022, v. 23, p. 5
- Article
6
- Journal of Applied Testing Technology, 2022, v. 23, p. 1
- Weiner, John A.;
- Henderson, Dianne
- Article