Works matching IS 23755636 AND DT 2022
1
- Journal of Applied Testing Technology, 2022, p. 72
- Article
2
- Journal of Applied Testing Technology, 2022, p. 95
- Wongvorachan, Tarid;
- Ka Wing Lai;
- Bulut, Okan;
- Yi-Shan Tsai;
- Guanliang Chen
- Article
3
- Journal of Applied Testing Technology, 2022, p. 53
- Mead, Alan D.;
- Chenxuan Zhou
- Article
4
- Journal of Applied Testing Technology, 2022, p. 41
- Becker, Kirk A.;
- Shu-chuan Kao
- Article
5
- Journal of Applied Testing Technology, 2022, p. 21
- Firoozi, Tahereh;
- Bulut, Okan;
- Epp, Carrie Demmans;
- Naeimabadi, Ali;
- Barbosa, Denilson
- Article
6
- Journal of Applied Testing Technology, 2022, p. 30
- Micir, Ian;
- Swygert, Kimberly;
- D'Angelo, Jean
- Article
7
- Journal of Applied Testing Technology, 2022, p. 4
- Jinnie Shin;
- Gierl, Mark J.
- Article
8
- Journal of Applied Testing Technology, 2022, p. 1
- Article
9
- Journal of Applied Testing Technology, 2022, v. 23, p. 54
- Becker, Kirk;
- Huijuan Meng
- Article
10
- Journal of Applied Testing Technology, 2022, v. 23, p. 46
- Muckle, Timothy J.;
- Yu Meng;
- Johnson, Samuel
- Article
11
- Journal of Applied Testing Technology, 2022, v. 23, p. 36
- Hurtz, Gregory M.;
- Weiner, John A.
- Article
12
- Journal of Applied Testing Technology, 2022, v. 23, p. 15
- Morin, Maxim;
- Alves, Cecilia;
- De Champlain, André
- Article
13
- Journal of Applied Testing Technology, 2022, v. 23, p. 5
- Article
14
- Journal of Applied Testing Technology, 2022, v. 23, p. 1
- Weiner, John A.;
- Henderson, Dianne
- Article