Works matching IS 23755636 AND DT 2019 AND VI 20
1
- Journal of Applied Testing Technology, 2019, v. 20, p. 60
- Article
2
- Journal of Applied Testing Technology, 2019, v. 20, p. 37
- Article
3
- Journal of Applied Testing Technology, 2019, v. 20, p. 21
- Betts, Joe;
- Muntean, William;
- Doyoung Kim;
- Jorion, Natalie;
- Dickison, Philip
- Article
4
- Journal of Applied Testing Technology, 2019, v. 20, p. 11
- Lipner, Rebecca S.;
- Brossman, Bradley G.;
- Grosso, Louis J.
- Article
5
- Journal of Applied Testing Technology, 2019, v. 20, p. 2
- Schuwirth, Lambert W. T.;
- Van Der Vleuten, Cees P. M.
- Article
6
- Journal of Applied Testing Technology, 2019, v. 20, p. 1
- Peabody, Michael R.;
- van der Vleuten, Cees
- Article
7
- Journal of Applied Testing Technology, 2019, v. 20, p. 69
- McNamara, Jennifer;
- Bent, Margaret;
- Grace, Paul
- Article
8
- Journal of Applied Testing Technology, 2019, v. 20, p. 60
- Heinzen, Thomas E.;
- Ivezaj, Stephanie
- Article
9
- Journal of Applied Testing Technology, 2019, v. 20, p. 52
- Smith, Ginny;
- Shute, Valerie;
- Muenzenberger, Amber
- Article
10
- Journal of Applied Testing Technology, 2019, v. 20, p. 43
- Keehn, Suzanne;
- Claggett, Stuart
- Article
11
- Journal of Applied Testing Technology, 2019, v. 20, p. 35
- Van Voorhis, Victoria;
- Paris, Benjamin
- Article
12
- Journal of Applied Testing Technology, 2019, v. 20, p. 17
- Lehman, Blair;
- Jackson, G. Tanner;
- Forsyth, Carol
- Article
13
- Journal of Applied Testing Technology, 2019, v. 20, p. 1
- Article
14
- Journal of Applied Testing Technology, 2019, v. 20, n. 1, p. 1
- Hurtz, Gregory M.;
- Weiner, John A.
- Article
15
- Journal of Applied Testing Technology, 2019, v. 20, n. 1, p. 16
- Article