Works matching IS 23755636 AND DT 2017 AND VI 18
1
- Journal of Applied Testing Technology, 2017, v. 18, p. 32
- de Klerk, Sebastiaan;
- Kato, Pamela M.
- Article
2
- Journal of Applied Testing Technology, 2017, v. 18, p. 19
- Bauer, Malcolm;
- Wylie, Caroline;
- Jackson, Tanner;
- Mislevy, Bob;
- Hoffman-John, Erin;
- John, Michael;
- Corrigan, Seth
- Article
3
- Journal of Applied Testing Technology, 2017, v. 18, p. 7
- Article
4
- Journal of Applied Testing Technology, 2017, v. 18, p. 1
- Kato, Pamela M.;
- de Klerk, Sebastiaan
- Article
5
- Journal of Applied Testing Technology, 2017, v. 18, n. 1, p. 1
- Lazarus, Sheryl S.;
- van den Heuvel, Jill R.;
- Thurlow, Martha L.
- Article
6
- Journal of Applied Testing Technology, 2017, v. 18, n. 1, p. 13
- Weiner, John A.;
- Hurtz, Gregory M.
- Article