Works matching IS 23755636 AND DT 2016 AND VI 17 AND IP 1
1
- Journal of Applied Testing Technology, 2016, v. 17, n. 1, p. 33
- Wolkowitz, Amanda A.;
- Davis-Becker, Susan L.;
- Gerrow, Jack D.
- Article
2
- Journal of Applied Testing Technology, 2016, v. 17, n. 1, p. 1
- Article
3
- Journal of Applied Testing Technology, 2016, v. 17, n. 1, p. 1
- Dickison, Philip;
- Xiao Luo;
- Doyoung Kim;
- Woo, Ada;
- Muntean, William;
- Bergstrom, Betty
- Article