Works matching IS 23755636 AND DT 2008 AND VI 9 AND IP 3

Examining Panelist Data froma Bilingual Standard Setting Study.

Published in:

Journal of Applied Testing Technology, 2008, v. 9, n. 3, p. 1

By:

• Rodeck, Elaine M.;
• Tzu-Yun Chin;
• Davis, Susan L.;
• Plake, Barbara S.

Publication type:

Article