Works matching IS 22875123 AND DT 2020 AND VI 50 AND IP 1
1
- Applied Microscopy, 2020, v. 50, n. 1, p. N.PAG, doi. 10.1186/s42649-020-00049-0
- Kim, Seunghyun;
- Boo, Hee-Ock;
- Ahn, Taeho;
- Bae, Chun-Sik
- Article
2
- Applied Microscopy, 2020, v. 50, n. 1, p. 1, doi. 10.1186/s42649-020-00048-1
- Kim, Dong-Gyu;
- Lee, Sol;
- Kim, Kwanpyo
- Article
3
- Applied Microscopy, 2020, v. 50, n. 1, p. 1, doi. 10.1186/s42649-020-00047-2
- Ryu, Gyeong Hee;
- Chan, Ren-Jie
- Article
4
- Applied Microscopy, 2020, v. 50, n. 1, p. N.PAG, doi. 10.1186/s42649-020-00046-3
- Kang, Jihun;
- Kang, Eun-Hye;
- Yun, Young-Shik;
- Ji, Seungmuk;
- Yun, In-Sik;
- Yeo, Jong-Souk
- Article
5
- Applied Microscopy, 2020, v. 50, n. 1, p. N.PAG, doi. 10.1186/s42649-020-00045-4
- Article
6
- Applied Microscopy, 2020, v. 50, n. 1, p. N.PAG, doi. 10.1186/s42649-020-00044-5
- Tordoff, Ben;
- Hartfield, Cheryl;
- Holwell, Andrew J.;
- Hiller, Stephan;
- Kaestner, Marcus;
- Kelly, Stephen;
- Lee, Jaehan;
- Müller, Sascha;
- Perez-Willard, Fabian;
- Volkenandt, Tobias;
- White, Robin;
- Rodgers, Thomas
- Article
7
- Applied Microscopy, 2020, v. 50, n. 1, p. N.PAG, doi. 10.1186/s42649-020-00041-8
- Wang, Feng;
- Henninen, Trond R.;
- Keller, Debora;
- Erni, Rolf
- Article
8
- Applied Microscopy, 2020, v. 50, n. 1, p. N.PAG, doi. 10.1186/s42649-020-00038-3
- Kim, Hyun-Tae;
- Park, Jong-Young
- Article
9
- Applied Microscopy, 2020, v. 50, n. 1, p. N.PAG, doi. 10.1186/s42649-020-00042-7
- Article
10
- Applied Microscopy, 2020, v. 50, n. 1, p. N.PAG, doi. 10.1186/s42649-020-00040-9
- Sun, Yan;
- Lee, Seung-Min;
- Ku, Bon-Jin;
- Moon, Myung-Jin
- Article
11
- Applied Microscopy, 2020, v. 50, n. 1, p. N.PAG, doi. 10.1186/s42649-020-00039-2
- Kim, Hong-Kyu;
- Kim, Sung-Hoon;
- Ahn, Jae-Pyoung
- Article
12
- Applied Microscopy, 2020, v. 50, n. 1, p. 1, doi. 10.1186/s42649-020-00033-8
- Kim, Eunjin;
- Lee, Jiyoung;
- Noh, Seulgi;
- Kwon, Ohkyung;
- Mun, Ji Young
- Article
13
- Applied Microscopy, 2020, v. 50, n. 1, p. N.PAG, doi. 10.1186/s42649-020-00043-6
- Kwon, Yena;
- An, Byeong-Seon;
- Shin, Yeon-Ju;
- Yang, Cheol-Woong
- Article
14
- Applied Microscopy, 2020, v. 50, n. 1, p. 1, doi. 10.1186/s42649-020-00036-5
- Kim, Hyo-Jeong;
- Sun, Yan;
- Moon, Myung-Jin
- Article
15
- Applied Microscopy, 2020, v. 50, n. 1, p. 1, doi. 10.1186/s42649-020-00034-7
- Article
16
- Applied Microscopy, 2020, v. 50, n. 1, p. 1, doi. 10.1186/s42649-020-00035-6
- Bhattacharya, Raktim;
- Saha, Sulagna;
- Kostina, Olga;
- Muravnik, Lyudmila;
- Mitra, Adinpunya
- Article
17
- Applied Microscopy, 2020, v. 50, n. 1, p. 1, doi. 10.1186/s42649-020-00029-4
- Article
18
- Applied Microscopy, 2020, v. 50, n. 1, p. N.PAG, doi. 10.1186/s42649-020-00037-4
- Powell, Kaden M.;
- Yoon, Heayoung P.
- Article
19
- Applied Microscopy, 2020, v. 50, n. 1, p. 1, doi. 10.1186/s42649-020-00027-6
- Kim, Hyun-Wook;
- Oh, Seung Hak;
- Lee, Se Jeong;
- Na, Ji eun;
- Rhyu, Im Joo
- Article
20
- Applied Microscopy, 2020, v. 50, n. 1, p. 1, doi. 10.1186/s42649-020-00028-5
- Article
21
- Applied Microscopy, 2020, v. 50, n. 1, p. 1, doi. 10.1186/s42649-020-00030-x
- Sun, Yan;
- Kim, Hyo-Jeong;
- Moon, Myung-Jin
- Article
22
- Applied Microscopy, 2020, v. 50, n. 1, p. 1, doi. 10.1186/s42649-020-00026-7
- Baik, Sung-Il;
- Kim, Young-Woon
- Article
23
- Applied Microscopy, 2020, v. 50, n. 1, p. 1, doi. 10.1186/s42649-020-00032-9
- Kumar, Arun;
- Singh, Pritam;
- Nanda, Arun
- Article
24
- Applied Microscopy, 2020, v. 50, n. 1, p. 1, doi. 10.1186/s42649-020-00031-w
- Park, Yong Soo;
- Kim, Yeonji;
- Kim, Sung Won;
- Kim, In-Beom
- Article
25
- Applied Microscopy, 2020, v. 50, n. 1, p. 1, doi. 10.1186/s42649-019-0024-2
- Kim, Daeyoung;
- Chang, Hye Jung;
- Choi, Hyunjoo
- Article