Works matching IS 2199160X AND DT 2022 AND VI 8 AND IP 7


Results: 66
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    Defect Engineering for High Performance and Extremely Reliable a‐IGZO Thin‐Film Transistor in QD‐OLED (Adv. Electron. Mater. 7/2022).

    Published in:
    Advanced Electronic Materials, 2022, v. 8, n. 7, p. 1, doi. 10.1002/aelm.202270036
    By:
    • Park, Young‐Gil;
    • Cho, Dong Yeon;
    • Kim, Ran;
    • Kim, Kang Hyun;
    • Lee, Ju Won;
    • Lee, Doo Hyoung;
    • Jeong, Soo Im;
    • Ahn, Na Ri;
    • Lee, Woo‐Geun;
    • Choi, Jae Beom;
    • Kim, Min Jung;
    • Kim, Donghyun;
    • Jin, Seunghee;
    • Park, Dong Geun;
    • Kim, Jungchun;
    • Choi, Saeyan;
    • Bang, Seain;
    • Lee, Jae Woo
    Publication type:
    Article
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    Mechanism of Spin‐Orbit Torques in Platinum Oxide Systems.

    Published in:
    Advanced Electronic Materials, 2022, v. 8, n. 7, p. 1, doi. 10.1002/aelm.202101335
    By:
    • Nath, Jayshankar;
    • Trifu, Alexandru Vladimir;
    • Gabor, Mihai Sebastian;
    • Hallal, Ali;
    • Auffret, Stephane;
    • Labau, Sebastien;
    • Mahjoub, Aymen;
    • Chan, Edmond;
    • Chaurasiya, Avinash Kumar;
    • Mondal, Amrit Kumar;
    • Yang, Haozhe;
    • Schmoranzerova, Eva;
    • Nsibi, Mohamed Ali;
    • Joumard, Isabelle;
    • Barman, Anjan;
    • Pelissier, Bernard;
    • Chshiev, Mairbek;
    • Gaudin, Gilles;
    • Miron, Ioan Mihai
    Publication type:
    Article
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    Luminescent High‐Mobility 2D Organic Semiconductor Single Crystals.

    Published in:
    Advanced Electronic Materials, 2022, v. 8, n. 7, p. 1, doi. 10.1002/aelm.202101281
    By:
    • Fedorenko, Roman S.;
    • Kuevda, Alexey V.;
    • Trukhanov, Vasiliy A.;
    • Konstantinov, Vladislav G.;
    • Sosorev, Andrey Yu.;
    • Sonina, Alina A.;
    • Kazantsev, Maxim S.;
    • Surin, Nikolay M.;
    • Grigorian, Souren;
    • Borshchev, Oleg V.;
    • Ponomarenko, Sergey A.;
    • Paraschuk, Dmitry Yu.
    Publication type:
    Article
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    Strong Piezoelectricity in 3R‐MoS<sub>2</sub> Flakes.

    Published in:
    Advanced Electronic Materials, 2022, v. 8, n. 7, p. 1, doi. 10.1002/aelm.202101131
    By:
    • Hallil, Hamida;
    • Cai, Weifan;
    • Zhang, Kang;
    • Yu, Peng;
    • Liu, Sheng;
    • Xu, Ran;
    • Zhu, Chao;
    • Xiong, Qihua;
    • Liu, Zheng;
    • Zhang, Qing
    Publication type:
    Article
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    CeO<sub>2</sub> Doping of Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub> Thin Films for High Endurance Ferroelectric Memories.

    Published in:
    Advanced Electronic Materials, 2022, v. 8, n. 7, p. 1, doi. 10.1002/aelm.202101258
    By:
    • Yu, Zhouchangwan;
    • Saini, Balreen;
    • Liao, Pei‐Jean;
    • Chang, Yu‐Kai;
    • Hou, Duen‐Huei;
    • Nien, Chih‐Hung;
    • Shih, Yu‐Chuan;
    • Yeong, Sai Hooi;
    • Afanas'ev, Valeri;
    • Huang, Fei;
    • Baniecki, John D.;
    • Mehta, Apurva;
    • Chang, Chih‐Sheng;
    • Wong, H.‐S. Philip;
    • Tsai, Wilman;
    • McIntyre, Paul C.
    Publication type:
    Article
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