Works matching IS 2199160X AND DT 2020 AND VI 6 AND IP 9
1
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000536
- Shan, Xuanyu;
- Wang, Zhongqiang;
- Lin, Ya;
- Zeng, Tao;
- Zhao, Xiaoning;
- Xu, Haiyang;
- Liu, Yichun
- Article
2
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202070038
- Article
3
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202070037
- Yeasmin, Rubaya;
- Duy, Le Thai;
- Han, Seungik;
- Seo, Hyungtak
- Article
4
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000536
- Shan, Xuanyu;
- Wang, Zhongqiang;
- Lin, Ya;
- Zeng, Tao;
- Zhao, Xiaoning;
- Xu, Haiyang;
- Liu, Yichun
- Article
5
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202070036
- Cheng, Long;
- Li, Jiancong;
- Zheng, Hao‐Xuan;
- Yuan, Peng;
- Yin, Jiahao;
- Yang, Ling;
- Luo, Qing;
- Li, Yi;
- Lv, Hangbing;
- Chang, Ting‐Chang;
- Miao, Xiangshui
- Article
6
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000721
- Liu, Xiaomeng;
- Fu, Tianda;
- Ward, Joy;
- Gao, Hongyan;
- Yin, Bing;
- Woodard, Trevor;
- Lovley, Derek R.;
- Yao, Jun
- Article
7
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000496
- Peng, Songang;
- Jin, Zhi;
- Yao, Yao;
- Huang, Xinnan;
- Zhang, Dayong;
- Niu, Jiebin;
- Shi, Jingyuan;
- Zhang, Yanhui;
- Yu, Guanghui
- Article
8
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000537
- Article
9
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000536
- Shan, Xuanyu;
- Wang, Zhongqiang;
- Lin, Ya;
- Zeng, Tao;
- Zhao, Xiaoning;
- Xu, Haiyang;
- Liu, Yichun
- Article
10
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000527
- Yeasmin, Rubaya;
- Duy, Le Thai;
- Han, Seungik;
- Seo, Hyungtak
- Article
11
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000515
- Zhao, Baolin;
- Gothe, Bastian;
- Sarcletti, Marco;
- Zhao, Yuhan;
- Rejek, Tobias;
- Liu, Xin;
- Park, Hyoungwon;
- Strohriegl, Peter;
- Halik, Marcus
- Article
12
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000549
- Wang, Ziyang;
- Chen, Bo;
- Sun, Shibin;
- Pan, Likun;
- Gao, Yang
- Article
13
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000490
- Aniés, Filip;
- Wang, Simeng;
- Hodsden, Thomas;
- Panidi, Julianna;
- Fei, Zhuping;
- Jiao, Xuechen;
- Wong, Yi Hang Cherie;
- McNeill, Christopher R.;
- Anthopoulos, Thomas D.;
- Heeney, Martin
- Article
14
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000488
- Banerjee, Writam;
- Hwang, Hyunsang
- Article
15
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000479
- Hong, Sungjae;
- Kim, Kang Lib;
- Cho, Yongjae;
- Cho, Hyunmin;
- Park, Ji Hoon;
- Park, Cheolmin;
- Im, Seongil
- Article
16
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000457
- Cheng, Long;
- Li, Jiancong;
- Zheng, Hao‐Xuan;
- Yuan, Peng;
- Yin, Jiahao;
- Yang, Ling;
- Luo, Qing;
- Li, Yi;
- Lv, Hangbing;
- Chang, Ting‐Chang;
- Miao, Xiangshui
- Article
17
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000438
- Duan, Yiwei;
- Qian, Jun;
- Guo, Jianhang;
- Jiang, Sai;
- Yang, Chengdong;
- Wang, Hengyuan;
- Wang, Qijing;
- Shi, Yi;
- Li, Yun
- Article
18
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000434
- Ryu, Jin Joo;
- Jeon, Kanghyeok;
- Kim, Guhyun;
- Yang, Min Kyu;
- Kim, Chunjoong;
- Jeong, Doo Seok;
- Kim, Gun Hwan
- Article
19
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000429
- Cataldi, Pietro;
- Papageorgiou, Dimitrios G.;
- Pinter, Gergo;
- Kretinin, Andrey V.;
- Sampson, William W.;
- Young, Robert J.;
- Bissett, Mark;
- Kinloch, Ian A.
- Article
20
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000412
- Lee, Hyerin;
- Beom, Keonwon;
- Kim, Minju;
- Kang, Chi Jung;
- Yoon, Tae‐Sik
- Article
21
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000337
- Wu, Yuanpeng;
- Laleyan, David A.;
- Deng, Zihao;
- Ahn, Chihyo;
- Aiello, Anthony F.;
- Pandey, Ayush;
- Liu, Xianhe;
- Wang, Ping;
- Sun, Kai;
- Ahmadi, Elaheh;
- Sun, Yi;
- Kira, Mackillo;
- Bhattacharya, Pallab K.;
- Kioupakis, Emmanouil;
- Mi, Zetian
- Article
22
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000332
- Bai, Wangfeng;
- Zhao, Xinyu;
- Ding, Yuqin;
- Wang, Leijie;
- Zheng, Peng;
- Hao, Jigong;
- Zhai, Jiwei
- Article
23
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000250
- Nasrallah, Iyad;
- Ravva, Mahesh Kumar;
- Broch, Katharina;
- Novak, Jiri;
- Armitage, John;
- Schweicher, Guillaume;
- Sadhanala, Aditya;
- Anthony, John E.;
- Bredas, Jean‐Luc;
- Sirringhaus, Henning
- Article
24
- Advanced Electronic Materials, 2020, v. 6, n. 9, p. 1, doi. 10.1002/aelm.202000137
- Liang, Yuhang;
- Li, Feng;
- Zheng, Rongkun
- Article