Works matching IS 2199160X AND DT 2018 AND VI 4 AND IP 7
1
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201800090
- Duong, Duc T.;
- Tuchman, Yaakov;
- Chakthranont, Pong;
- Cavassin, Priscila;
- Colucci, Renan;
- Jaramillo, Thomas F.;
- Salleo, Alberto;
- Faria, Gregório C.
- Article
2
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201870034
- Liu, Chunlin;
- Liang, Hongwei;
- Wu, Dun;
- Lu, Xiangyu;
- Wang, Qiang
- Article
3
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201800087
- Perry, Erin E.;
- Labram, John G.;
- Venkatesan, Naveen R.;
- Nakayama, Hidenori;
- Chabinyc, Michael L.
- Article
4
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201870035
- Article
5
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201800207
- He, Junyang;
- Fang, Nan;
- Nakamura, Keigo;
- Ueno, Keiji;
- Taniguchi, Takashi;
- Watanabe, Kenji;
- Nagashio, Kosuke
- Article
6
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201800081
- Han, Chan Su;
- Cho, Ahra;
- Kim, Da Bin;
- Cho, Yong Soo
- Article
7
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201800106
- Yoshimoto, Takuya;
- Goto, Taichi;
- Shimada, Kei;
- Iwamoto, Bungo;
- Nakamura, Yuichi;
- Uchida, Hironaga;
- Ross, Caroline A.;
- Inoue, Mitsuteru
- Article
8
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201870033
- Han, Chan Su;
- Cho, Ahra;
- Kim, Da Bin;
- Cho, Yong Soo
- Article
9
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201800171
- Li, Dong;
- Zheng, Dongxing;
- Jin, Chao;
- Li, Peng;
- Liu, Xinjun;
- Zheng, Wanchao;
- Bai, Haili
- Article
10
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201800186
- Dai, Mingzhi;
- Guan, Jianmin;
- Song, Zhitang
- Article
11
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201800167
- Kumaresan, Yogeenth;
- Lee, Ryeri;
- Lim, Namsoo;
- Pak, Yusin;
- Kim, Hyeonghun;
- Kim, Woochul;
- Jung, Gun‐Young
- Article
12
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201800154
- Li, Qiu;
- Wei, Aixiang;
- Lu, Jianting;
- Tao, Lili;
- Yang, Yibin;
- Luo, Dongxiang;
- Liu, Jun;
- Xiao, Ye;
- Zhao, Yu;
- Li, Jingbo
- Article
13
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201800110
- Molina‐Lopez, Francisco;
- Wu, Hung‐Chin;
- Wang, Ging‐Ji Nathan;
- Yan, Hongping;
- Shaw, Leo;
- Xu, Jie;
- Toney, Michael F.;
- Bao, Zhenan
- Article
14
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201800114
- Gegevičius, Rokas;
- Treideris, Marius;
- Pakštas, Vidas;
- Franckevičius, Marius;
- Gulbinas, Vidmantas
- Article
15
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201800077
- Shi, Shengwei;
- Sun, Zhengyi;
- Liu, Xianjie;
- Bedoya‐Pinto, Amilcar;
- Graziosi, Patrizio;
- Yu, Huangzhong;
- Li, Wenting;
- Liu, Gang;
- Hueso, Luis;
- Dediu, Valentin A.;
- Fahlman, Mats
- Article
16
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201800073
- Koleśnik‐Gray, Maria;
- Sysoev, Vitalii I.;
- Gollwitzer, Stefan;
- Pinakov, Dmitry V.;
- Chekhova, Galina N.;
- Bulusheva, Lyubov G.;
- Okotrub, Alexander V.;
- Krstić, Vojislav
- Article
17
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201800092
- Liu, Chunlin;
- Liang, Hongwei;
- Wu, Dun;
- Lu, Xiangyu;
- Wang, Qiang
- Article
18
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201800091
- Park, Min Hyuk;
- Chung, Ching‐Chang;
- Schenk, Tony;
- Richter, Claudia;
- Opsomer, Karl;
- Detavernier, Christophe;
- Adelmann, Christoph;
- Jones, Jacob L.;
- Mikolajick, Thomas;
- Schroeder, Uwe
- Article
19
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201800075
- Huang, Yanli;
- Zhao, Chunlin;
- Wu, Jiagang
- Article
20
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201700514
- Kim, Chang‐Hyun;
- Thomas, Suzanne;
- Kim, Ji Hwan;
- Elliott, Martin;
- Macdonald, J. Emyr;
- Yoon, Myung‐Han
- Article
21
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201800062
- Funck, Carsten;
- Marchewka, Astrid;
- Bäumer, Christoph;
- Schmidt, Peter C.;
- Müller, Phillip;
- Dittmann, Regina;
- Martin, Manfred;
- Waser, Rainer;
- Menzel, Stephan
- Article
22
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201800032
- Fernandes, Cristina;
- Santa, Ana;
- Santos, Ângelo;
- Bahubalindruni, Pydi;
- Deuermeier, Jonas;
- Martins, Rodrigo;
- Fortunato, Elvira;
- Barquinha, Pedro
- Article
23
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201700661
- He, Shuai;
- DuChene, Joseph S.;
- Qiu, Jingjing;
- Puretzky, Alexander A.;
- Gai, Zheng;
- Wei, Wei David
- Article
24
- Advanced Electronic Materials, 2018, v. 4, n. 7, p. 1, doi. 10.1002/aelm.201700655
- Yue, Hong‐Lin;
- Sung, Hsin‐Hung;
- Chen, Fang‐Chung
- Article