Works matching IS 2199160X AND DT 2018 AND VI 4 AND IP 6
1
- 2018
- Yoo, Hocheon;
- Hong, Seongin;
- Moon, Hyunseong;
- On, Sungmin;
- Ahn, Hyungju;
- Lee, Han‐Koo;
- Kim, Sunkook;
- Hong, Young Ki;
- Kim, Jae‐Joon
- Cover Art
2
- Advanced Electronic Materials, 2018, v. 4, n. 6, p. 1, doi. 10.1002/aelm.201870031
- Article
3
- 2018
- Niu, Wei;
- Liu, Wenqing;
- Gu, Min;
- Chen, Yongda;
- Zhang, Xiaoqian;
- Zhang, Minhao;
- Chen, Yequan;
- Wang, Ji;
- Du, Jun;
- Song, Fengqi;
- Pan, Xiaoqing;
- Pryds, Nini;
- Wang, Xuefeng;
- Wang, Peng;
- Xu, Yongbing;
- Chen, Yunzhong;
- Zhang, Rong
- Cover Art
4
- 2018
- Zalar, Peter;
- Matsuhisa, Naoji;
- Suzuki, Toshiki;
- Enomoto, Shintaro;
- Koizumi, Mari;
- Yokota, Tomoyuki;
- Sekino, Masaki;
- Someya, Takao
- Cover Art
5
- 2018
- Seo, Young‐Min;
- Cho, Hye‐Jin;
- Jang, Hyeon‐Sik;
- Jang, Wonseok;
- Lim, Jae‐Young;
- Jang, Yamujin;
- Gu, Taejun;
- Choi, Jae‐Young;
- Whang, Dongmok
- Cover Art
6
- Advanced Electronic Materials, 2018, v. 4, n. 6, p. 1, doi. 10.1002/aelm.201800096
- Zhang, Ziyang;
- Wang, Yaoyuan;
- Li, Huanglong;
- Wu, Yujie;
- Wang, Guanrui;
- Shi, Luping
- Article
7
- Advanced Electronic Materials, 2018, v. 4, n. 6, p. 1, doi. 10.1002/aelm.201800055
- Niu, Wei;
- Liu, Wenqing;
- Gu, Min;
- Chen, Yongda;
- Zhang, Xiaoqian;
- Zhang, Minhao;
- Chen, Yequan;
- Wang, Ji;
- Du, Jun;
- Song, Fengqi;
- Pan, Xiaoqing;
- Pryds, Nini;
- Wang, Xuefeng;
- Wang, Peng;
- Xu, Yongbing;
- Chen, Yunzhong;
- Zhang, Rong
- Article
8
- Advanced Electronic Materials, 2018, v. 4, n. 6, p. 1, doi. 10.1002/aelm.201800030
- Gao, Rongli;
- Xu, Zhiyi;
- Bai, Lang;
- Zhang, Qingmei;
- Wang, Zhenhua;
- Cai, Wei;
- Chen, Gang;
- Deng, Xiaoling;
- Cao, Xianlong;
- Luo, Xiaodong;
- Fu, Chunling
- Article
9
- Advanced Electronic Materials, 2018, v. 4, n. 6, p. 1, doi. 10.1002/aelm.201700665
- Yoon, Jongwon;
- Ji, Yongsung;
- Lee, Seoung‐Ki;
- Hyon, Jinho;
- Tour, James M.
- Article
10
- Advanced Electronic Materials, 2018, v. 4, n. 6, p. 1, doi. 10.1002/aelm.201700644
- Liu, Ao;
- Zhu, Huihui;
- Liu, Guoxia;
- Noh, Yong‐Young;
- Fortunato, Elvira;
- Martins, Rodrigo;
- Shan, Fukai
- Article
11
- Advanced Electronic Materials, 2018, v. 4, n. 6, p. 1, doi. 10.1002/aelm.201700639
- Yoo, Hocheon;
- Hong, Seongin;
- Moon, Hyunseong;
- On, Sungmin;
- Ahn, Hyungju;
- Lee, Han‐Koo;
- Kim, Sunkook;
- Hong, Young Ki;
- Kim, Jae‐Joon
- Article
12
- Advanced Electronic Materials, 2018, v. 4, n. 6, p. 1, doi. 10.1002/aelm.201700624
- Lee, Chang‐Seok;
- Shin, Keun Wook;
- Song, Hyun‐Jae;
- Park, Hyun;
- Cho, Yeonchoo;
- Im, Dong‐Hyun;
- Lee, Hyangsook;
- Lee, Jae‐Ho;
- Won, Jung Yeon;
- Chung, Jae Gwan;
- Kim, Changhyun;
- Byun, Kyung‐Eun;
- Lee, Eun‐Kyu;
- Kim, Yongsung;
- Ko, Wonhee;
- Lim, Han Jin;
- Park, Seongjun;
- Shin, Hyeon‐Jin
- Article
13
- Advanced Electronic Materials, 2018, v. 4, n. 6, p. 1, doi. 10.1002/aelm.201700620
- Choi, Songhee;
- Chang, Sung‐Jin;
- Oh, Junhyeob;
- Jang, Jae Hyuck;
- Lee, Shinbuhm
- Article
14
- Advanced Electronic Materials, 2018, v. 4, n. 6, p. 1, doi. 10.1002/aelm.201700534
- Yang, Shyuan;
- Park, Steve;
- Bintinger, Johannes;
- Bonnassieux, Yvan;
- Anthony, John;
- Kymissis, Ioannis
- Article
15
- Advanced Electronic Materials, 2018, v. 4, n. 6, p. 1, doi. 10.1002/aelm.201700388
- Sahatiya, Parikshit;
- Badhulika, Sushmee
- Article
16
- Advanced Electronic Materials, 2018, v. 4, n. 6, p. 1, doi. 10.1002/aelm.201700622
- Seo, Young‐Min;
- Cho, Hye‐Jin;
- Jang, Hyeon‐Sik;
- Jang, Wonseok;
- Lim, Jae‐Young;
- Jang, Yamujin;
- Gu, Taejun;
- Choi, Jae‐Young;
- Whang, Dongmok
- Article
17
- Advanced Electronic Materials, 2018, v. 4, n. 6, p. 1, doi. 10.1002/aelm.201700601
- Zalar, Peter;
- Matsuhisa, Naoji;
- Suzuki, Toshiki;
- Enomoto, Shintaro;
- Koizumi, Mari;
- Yokota, Tomoyuki;
- Sekino, Masaki;
- Someya, Takao
- Article
18
- Advanced Electronic Materials, 2018, v. 4, n. 6, p. 1, doi. 10.1002/aelm.201700562
- Yousry, Yasmin Mohamed;
- Yao, Kui;
- Chen, Shuting;
- Liew, Weng Heng;
- Ramakrishna, Seeram
- Article