Works matching IS 2199160X AND DT 2018 AND VI 4 AND IP 4
1
- Advanced Electronic Materials, 2018, v. 4, n. 4, p. 1, doi. 10.1002/aelm.201870022
- Liu, Jindong;
- Feng, Yu;
- Tang, Rujun;
- Zhao, Run;
- Gao, Ju;
- Shi, Daning;
- Yang, Hao
- Article
2
- Advanced Electronic Materials, 2018, v. 4, n. 4, p. 1, doi. 10.1002/aelm.201870021
- Article
3
- Advanced Electronic Materials, 2018, v. 4, n. 4, p. 1, doi. 10.1002/aelm.201870020
- Kim, Chaewon;
- Kim, Yong‐Hoon;
- Noh, Yong‐Young;
- Hong, Sung‐Jei;
- Lee, Mi Jung
- Article
4
- Advanced Electronic Materials, 2018, v. 4, n. 4, p. 1, doi. 10.1002/aelm.201700608
- Tian, He;
- Wang, Xuefeng;
- Zhao, Haiming;
- Mi, Wentian;
- Yang, Yi;
- Chiu, Po‐Wen;
- Ren, Tian‐Ling
- Article
5
- Advanced Electronic Materials, 2018, v. 4, n. 4, p. 1, doi. 10.1002/aelm.201700596
- Lin, Qiqi;
- Hu, Wei;
- Zang, Zhigang;
- Zhou, Miao;
- Du, Juan;
- Wang, Ming;
- Han, Shuai;
- Tang, Xiaosheng
- Article
6
- Advanced Electronic Materials, 2018, v. 4, n. 4, p. 1, doi. 10.1002/aelm.201700586
- Wan, Yongbiao;
- Qiu, Zhiguang;
- Hong, Ying;
- Wang, Yan;
- Zhang, Jianming;
- Liu, Qingxian;
- Wu, Zhigang;
- Guo, Chuan Fei
- Article
7
- Advanced Electronic Materials, 2018, v. 4, n. 4, p. 1, doi. 10.1002/aelm.201700567
- Zhou, Guangdong;
- Duan, Shukai;
- Li, Ping;
- Sun, Bai;
- Wu, Bo;
- Yao, Yanqing;
- Yang, Xiude;
- Han, Juanjuan;
- Wu, Jinggao;
- Wang, Gang;
- Liao, Liping;
- Lin, Cunyan;
- Hu, Wei;
- Xu, Cunyun;
- Liu, Debei;
- Chen, Tian;
- Chen, Lijia;
- Zhou, Ankun;
- Song, Qunliang
- Article
8
- Advanced Electronic Materials, 2018, v. 4, n. 4, p. 1, doi. 10.1002/aelm.201700563
- Lee, Suyoun;
- Lee, Young Tack;
- Park, Seong Gon;
- Lee, Kyu Hyoung;
- Kim, Sung Wng;
- Hwang, Do Kyung;
- Lee, Kimoon
- Article
9
- Advanced Electronic Materials, 2018, v. 4, n. 4, p. 1, doi. 10.1002/aelm.201700560
- Huang, Weichuan;
- Zhao, Wenbo;
- Luo, Zhen;
- Yin, Yuewei;
- Lin, Yue;
- Hou, Chuangming;
- Tian, Bobo;
- Duan, Chun‐Gang;
- Li, Xiao‐Guang
- Article
10
- Advanced Electronic Materials, 2018, v. 4, n. 4, p. 1, doi. 10.1002/aelm.201700521
- Park, Youngjun;
- Han, Un‐Bin;
- Kim, Min‐Kyu;
- Lee, Jang‐Sik
- Article
11
- Advanced Electronic Materials, 2018, v. 4, n. 4, p. 1, doi. 10.1002/aelm.201700550
- Lee, Suhui;
- Chen, Yuanfeng;
- Jeon, Jaekwon;
- Park, Chanju;
- Jang, Jin
- Article
12
- Advanced Electronic Materials, 2018, v. 4, n. 4, p. 1, doi. 10.1002/aelm.201700543
- Jiang, Shanshan;
- He, Gang;
- Liu, Mao;
- Zhu, Li;
- Liang, Shuang;
- Li, Wendong;
- Sun, Zhaoqi;
- Tian, Mingliang
- Article
13
- Advanced Electronic Materials, 2018, v. 4, n. 4, p. 1, doi. 10.1002/aelm.201700524
- Fang, Mingxu;
- Wang, Fang;
- Han, Yemei;
- Feng, Yulin;
- Ren, Tianling;
- Li, Yue;
- Tang, Dengxuan;
- Song, Zhitang;
- Zhang, Kailiang
- Article
14
- Advanced Electronic Materials, 2018, v. 4, n. 4, p. 1, doi. 10.1002/aelm.201700522
- Liu, Jindong;
- Feng, Yu;
- Tang, Rujun;
- Zhao, Run;
- Gao, Ju;
- Shi, Daning;
- Yang, Hao
- Article
15
- Advanced Electronic Materials, 2018, v. 4, n. 4, p. 1, doi. 10.1002/aelm.201700559
- Nahid, Masrur M.;
- Welford, Adam;
- Gann, Eliot;
- Thomsen, Lars;
- Sharma, Kamendra P.;
- McNeill, Christopher R.
- Article
16
- Advanced Electronic Materials, 2018, v. 4, n. 4, p. 1, doi. 10.1002/aelm.201700447
- Jia, Tanhua;
- Fuh, Huei‐Ru;
- Chen, Dengyun;
- Abid, Mohamed;
- Abid, Mourad;
- Zhang, Duan;
- Sarker, Anas B.;
- Cho, Jiung;
- Choi, Miri;
- Chun, Byong Sun;
- Xu, Hongjun;
- Ó Coileáin, Cormac;
- Liu, Huajun;
- Chang, Ching‐Ray;
- Wu, Han‐Chun
- Article
17
- Advanced Electronic Materials, 2018, v. 4, n. 4, p. 1, doi. 10.1002/aelm.201700440
- Kim, Chaewon;
- Kim, Yong‐Hoon;
- Noh, Yong‐Young;
- Hong, Sung‐Jei;
- Lee, Mi Jung
- Article
18
- Advanced Electronic Materials, 2018, v. 4, n. 4, p. 1, doi. 10.1002/aelm.201700413
- Teranishi, Takashi;
- Katsuji, Naoto;
- Chajima, Keisuke;
- Yasuhara, Sou;
- Inohara, Masahiro;
- Yoshikawa, Yumi;
- Yasui, Shintaro;
- Hayashi, Hidetaka;
- Kishimoto, Akira;
- Itoh, Mitsuru
- Article
19
- Advanced Electronic Materials, 2018, v. 4, n. 4, p. 1, doi. 10.1002/aelm.201700277
- Navaraj, William Taube;
- Gupta, Shoubhik;
- Lorenzelli, Leandro;
- Dahiya, Ravinder
- Article
20
- Advanced Electronic Materials, 2018, v. 4, n. 4, p. 1, doi. 10.1002/aelm.201700489
- Park, Min Hyuk;
- Chung, Ching‐Chang;
- Schenk, Tony;
- Richter, Claudia;
- Hoffmann, Michael;
- Wirth, Steffen;
- Jones, Jacob L.;
- Mikolajick, Thomas;
- Schroeder, Uwe
- Article