Works matching IS 2199160X AND DT 2018 AND VI 4 AND IP 2
1
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201870013
- Article
2
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201870012
- Ashar, A. Z.;
- Ganesh, N.;
- Narayan, K. S.
- Article
3
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201870011
- Schönhals, Alexander;
- Rosário, Carlos M. M.;
- Hoffmann‐Eifert, Susanne;
- Waser, Rainer;
- Menzel, Stephan;
- Wouters, Dirk J.
- Article
4
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201870010
- Ji, Xu;
- Chen, Liang;
- Xu, Mengxuan;
- Dong, Mei;
- Yan, Kun;
- Cheng, Shuang;
- Kong, Xueqian;
- Wang, Tongyao;
- Liu, Jiandang;
- Gu, Bingchuan;
- Wang, Huanhua;
- Liu, Zhiyong;
- Wang, Shuao;
- Huang, Feng;
- Ouyang, Xiaoping
- Article
5
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201700561
- Banerjee, Writam;
- Zhang, Xumeng;
- Luo, Qing;
- Lv, Hangbing;
- Liu, Qi;
- Long, Shibing;
- Liu, Ming
- Article
6
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201700664
- Article
7
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201700551
- Lu, Zengxing;
- Yang, Xiaodong;
- Jin, Chen;
- Li, Peilian;
- Wan, Jian‐guo;
- Liu, Jun‐ming
- Article
8
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201700380
- Song, Chen;
- Hu, Zhanhao;
- Luo, Yu;
- Cun, Yangke;
- Wang, Lei;
- Ying, Lei;
- Huang, Fei;
- Peng, Junbiao;
- Wang, Jian;
- Cao, Yong
- Article
9
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201700526
- Kielar, Marcin;
- Daanoune, Mehdi;
- François‐Martin, Olivier;
- Flament, Bruno;
- Dhez, Olivier;
- Pandey, Ajay K.;
- Chambon, Sylvain;
- Clerc, Raphaël;
- Hirsch, Lionel
- Article
10
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201700490
- Honma, Yuta;
- Itoh, Keisuke;
- Masunaga, Hiroyasu;
- Fujiwara, Akihiko;
- Nishizaki, Terukazu;
- Iguchi, Satoshi;
- Sasaki, Takahiko
- Article
11
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201700455
- Wan, Bensong;
- Zhou, Qionghua;
- Zhang, Junying;
- Wang, Yue;
- Yang, Bingchao;
- Lv, Weiming;
- Zhang, Baoshun;
- Zeng, Zhongming;
- Chen, Qian;
- Wang, Jinlan;
- Wang, Wenhong;
- Wen, Fusheng;
- Xiang, Jianyong;
- Xu, Bo;
- Zhao, Zhisheng;
- Tian, Yongjun;
- Liu, Zhongyuan
- Article
12
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201700434
- Kim, Min‐gu;
- Alrowais, Hommood;
- Brand, Oliver
- Article
13
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201700496
- Li, Zaifang;
- Sun, Hengda;
- Hsiao, Ching‐Lien;
- Yao, Yulong;
- Xiao, Yiqun;
- Shahi, Maryam;
- Jin, Yingzhi;
- Cruce, Alex;
- Liu, Xianjie;
- Jiang, Youyu;
- Meng, Wei;
- Qin, Fei;
- Ederth, Thomas;
- Fabiano, Simone;
- Chen, Weimin M.;
- Lu, Xinhui;
- Birch, Jens;
- Brill, Joseph W.;
- Zhou, Yinhua;
- Crispin, Xavier
- Article
14
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201700495
- Aggas, John R.;
- Lutkenhaus, Jodie;
- Guiseppi‐Elie, Anthony
- Article
15
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201700335
- Zeng, Qingsheng;
- Liu, Zheng
- Article
16
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201700397
- Fan, Fei;
- Zhang, Bin;
- Song, Sannian;
- Liu, Bo;
- Cao, Yaming;
- Chen, Yu
- Article
17
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201700429
- Wang, Ging‐Ji Nathan;
- Gasperini, Andrea;
- Bao, Zhenan
- Article
18
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201700352
- Nakamura, Nobuhiro;
- Kim, Junghwan;
- Hosono, Hideo
- Article
19
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201700362
- Ashar, A. Z.;
- Ganesh, N.;
- Narayan, K. S.
- Article
20
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201700323
- Chen, Yu;
- Liu, Junyi;
- Sun, Qiang;
- Kawazoe, Yoshiyuki;
- Jena, Puru
- Article
21
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201700307
- Ji, Xu;
- Chen, Liang;
- Xu, Mengxuan;
- Dong, Mei;
- Yan, Kun;
- Cheng, Shuang;
- Kong, Xueqian;
- Wang, Tongyao;
- Liu, Jiandang;
- Gu, Bingchuan;
- Wang, Huanhua;
- Liu, Zhiyong;
- Wang, Shuao;
- Huang, Feng;
- Ouyang, Xiaoping
- Article
22
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201700243
- Schönhals, Alexander;
- Rosário, Carlos M. M.;
- Hoffmann‐Eifert, Susanne;
- Waser, Rainer;
- Menzel, Stephan;
- Wouters, Dirk J.
- Article
23
- Advanced Electronic Materials, 2018, v. 4, n. 2, p. 1, doi. 10.1002/aelm.201700043
- Park, Saungeun;
- Chang, Hsiao‐Yu;
- Rahimi, Somayyeh;
- Lee, Alvin L.;
- Tao, Li;
- Akinwande, Deji
- Article