Works matching IS 2199160X AND DT 2018 AND VI 4 AND IP 11
1
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201870054
- Gan, Zhikai;
- Zhou, Peiqi;
- Dong, Anhua;
- Zheng, Diyuan;
- Wang, Hui
- Article
2
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201870053
- Article
3
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201870052
- Raeis‐Hosseini, Niloufar;
- Lim, Seokjae;
- Hwang, Hyunsang;
- Rho, Junsuk
- Article
4
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201870051
- Tu, Luqi;
- Wang, Xudong;
- Wang, Jianlu;
- Meng, Xiangjian;
- Chu, Junhao
- Article
5
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201870050
- Karnaushenko, Dmitriy D.;
- Karnaushenko, Daniil;
- Grafe, Hans‐Joachim;
- Kataev, Vladislav;
- Büchner, Bernd;
- Schmidt, Oliver G.
- Article
6
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800375
- Moon, Yejin;
- Lee, Chulyeon;
- Kim, Hwajeong;
- Kim, Youngkyoo
- Article
7
- 2018
- Zhu, Li;
- He, Gang;
- Li, Wendong;
- Yang, Bing;
- Fortunato, Elvira;
- Martins, Rodrigo
- Correction Notice
8
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800252
- Song, Zhongqian;
- Li, Weiyan;
- Bao, Yu;
- Wang, Wei;
- Liu, Zhenbang;
- Han, Fangjie;
- Han, Dongxue;
- Niu, Li
- Article
9
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800371
- Fu, Yang Ming;
- Wan, Chang Jin;
- Yu, Fei;
- Xiao, Hui;
- Tao, Jian;
- Guo, Yan Bo;
- Gao, Wan Tian;
- Zhu, Li Qiang
- Article
10
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800360
- Raeis‐Hosseini, Niloufar;
- Lim, Seokjae;
- Hwang, Hyunsang;
- Rho, Junsuk
- Article
11
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800354
- Dang, Dongfeng;
- Wang, Zhiheng;
- Liu, Kunkun;
- Liu, Yong;
- Sung, Herman H. Y.;
- Williams, Ian D.;
- Kwok, Ryan T. K.;
- Lam, Jacky W. Y.;
- Su, Shi‐Jian;
- Tang, Ben Zhong
- Article
12
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800311
- Wu, Yi‐Lin;
- Matsuhisa, Naoji;
- Zalar, Peter;
- Fukuda, Kenjiro;
- Yokota, Tomoyuki;
- Someya, Takao
- Article
13
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800270
- Li, Ruiping;
- Li, Lain‐Jong;
- Cheng, Yingchun;
- Huang, Wei
- Article
14
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800362
- Tisserant, Jean‐Nicolas;
- Beck, Sebastian;
- Barf, Marc‐Michael;
- Kowalsky, Wolfgang;
- Lovrincic, Robert
- Article
15
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800298
- Karnaushenko, Dmitriy D.;
- Karnaushenko, Daniil;
- Grafe, Hans‐Joachim;
- Kataev, Vladislav;
- Büchner, Bernd;
- Schmidt, Oliver G.
- Article
16
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800351
- Zhou, Zhen;
- Zhang, Su‐Wei;
- Zhang, Yao;
- Luo, Jin;
- Sun, Wei;
- Wang, Xuping;
- Li, Jing‐Feng
- Article
17
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800231
- Tu, Luqi;
- Wang, Xudong;
- Wang, Jianlu;
- Meng, Xiangjian;
- Chu, Junhao
- Article
18
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800243
- Jeong, Hakyung;
- Park, Sungsik;
- Lee, Jongsu;
- Won, Philip;
- Ko, Seung‐Hwan;
- Lee, Dongjin
- Article
19
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800256
- Huang, Ting‐Kai;
- Chen, Jui‐Yuan;
- Ting, Yi‐Hsin;
- Wu, Wen‐Wei
- Article
20
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800251
- Woo, Youngjun;
- Hong, Woonggi;
- Yang, Sang Yoon;
- Kim, Ho Jin;
- Cha, Jun‐Hwe;
- Lee, Jae Eun;
- Lee, Khang June;
- Kang, Taegyu;
- Choi, Sung‐Yool
- Article
21
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800237
- Wang, Xin;
- Wu, Yao;
- Li, Guanwen;
- Wu, Jun;
- Zhang, XiaoBing;
- Li, Qing;
- Wang, Baoping;
- Chen, Jing;
- Lei, Wei
- Article
22
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800234
- Gan, Zhikai;
- Zhou, Peiqi;
- Dong, Anhua;
- Zheng, Diyuan;
- Wang, Hui
- Article
23
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800215
- Barsotti, Jonathan;
- Hirata, Ikue;
- Pignatelli, Francesca;
- Caironi, Mario;
- Greco, Francesco;
- Mattoli, Virgilio
- Article
24
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800189
- Xu, Nuo;
- Yoon, Kyung Jean;
- Kim, Kyung Min;
- Fang, Liang;
- Hwang, Cheol Seong
- Article
25
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800161
- Zhu, Yaxing;
- Yu, Aifang;
- Cao, Ran;
- Wen, Rongmei;
- Jia, Mengmeng;
- Lei, Ying;
- Zhang, Yang;
- Liu, Yudong;
- Zhai, Junyi
- Article
26
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800156
- Han, Yu;
- Zhong, Hui;
- Liu, Nan;
- Liu, Yuxuan;
- Lin, Jie;
- Jin, Peng
- Article
27
- Advanced Electronic Materials, 2018, v. 4, n. 11, p. N.PAG, doi. 10.1002/aelm.201800116
- Xiong, Fei;
- Wang, Min;
- Zhang, Hui;
- Xie, Lin;
- Guo, ChangJin;
- Shao, Jian;
- Jiang, Zuimin;
- Chen, Qingming;
- Hu, Wanbiao
- Article