Works matching IS 2199160X AND DT 2018 AND VI 4 AND IP 10
1
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201870049
- Ozdemir, Mehmet;
- Kim, Sang Woo;
- Kim, Hyungsug;
- Kim, Myung‐Gil;
- Kim, Bumjoon J.;
- Kim, Choongik;
- Usta, Hakan
- Article
2
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201870048
- Article
3
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201870047
- Sánchez‐Díaz, Antonio;
- Rodríguez‐Martínez, Xabier;
- Córcoles‐Guija, Laura;
- Mora‐Martín, Germán;
- Campoy‐Quiles, Mariano
- Article
4
- 2018
- Piva, Nicola;
- Greco, Francesco;
- Garbugli, Michele;
- Iacchetti, Antonio;
- Mattoli, Virgilio;
- Caironi, Mario
- Letter to the Editor
5
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201800621
- Caironi, Mario;
- Müller, Christian;
- Hauff, Elizabeth;
- Sommer, Michael
- Article
6
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700581
- Shin, Younghun;
- Massetti, Matteo;
- Komber, Hartmut;
- Biskup, Till;
- Nava, Diego;
- Lanzani, Guglielmo;
- Caironi, Mario;
- Sommer, Michael
- Article
7
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700505
- Göhler, Clemens;
- Wagenpfahl, Alexander;
- Deibel, Carsten
- Article
8
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700481
- Pirotte, Geert;
- Verstappen, Pieter;
- Vanderzande, Dirk;
- Maes, Wouter
- Article
9
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700480
- Biniek, Laure;
- Hamidi‐Sakr, Amer;
- Grodd, Linda;
- Escoubas, Stéphanie;
- Dappe, Yannick J.;
- Grigorian, Souren;
- Schmutz, Marc;
- Brinkmann, Martin
- Article
10
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700477
- Sánchez‐Díaz, Antonio;
- Rodríguez‐Martínez, Xabier;
- Córcoles‐Guija, Laura;
- Mora‐Martín, Germán;
- Campoy‐Quiles, Mariano
- Article
11
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700474
- Article
12
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700464
- Paterson, Alexandra F.;
- Lin, Yen‐Hung;
- Mottram, Alexander D.;
- Fei, Zhuping;
- Niazi, Muhammad R.;
- Kirmani, Ahmad R.;
- Amassian, Aram;
- Solomeshch, Olga;
- Tessler, Nir;
- Heeney, Martin;
- Anthopoulos, Thomas D.
- Article
13
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700435
- Deng, Lin‐Long;
- Xie, Su‐Yuan;
- Gao, Feng
- Article
14
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700416
- Holliday, Sarah;
- Luscombe, Christine K.
- Article
15
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700356
- Xie, Renxuan;
- Colby, Ralph H.;
- Gomez, Enrique D.
- Article
16
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700410
- Nikolka, Mark;
- Hurhangee, Michael;
- Sadhanala, Aditya;
- Chen, Hu;
- McCulloch, Iain;
- Sirringhaus, Henning
- Article
17
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700382
- Squillaci, Marco A.;
- Cipriani, Alessio;
- Melucci, Manuela;
- Zambianchi, Massimo;
- Caminati, Grabriella;
- Samorì, Paolo
- Article
18
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700375
- Boufflet, Pierre;
- Bovo, Gianluca;
- Occhi, Luca;
- Yuan, Hua‐Kang;
- Fei, Zhuping;
- Han, Yang;
- Anthopoulos, Thomas D.;
- Stavrinou, Paul N.;
- Heeney, Martin
- Article
19
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700358
- Song, Xin;
- Gasparini, Nicola;
- Baran, Derya
- Article
20
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700412
- Hofmann, Anna Isabel;
- Cloutet, Eric;
- Hadziioannou, Georges
- Article
21
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700354
- Ozdemir, Mehmet;
- Kim, Sang Woo;
- Kim, Hyungsug;
- Kim, Myung‐Gil;
- Kim, Bumjoon J.;
- Kim, Choongik;
- Usta, Hakan
- Article
22
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700349
- Campos, Antonio;
- Zhang, Qiaoming;
- Ajayakumar, M. R.;
- Leonardi, Francesca;
- Mas‐Torrent, Marta
- Article
23
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700345
- Strobel, Noah;
- Eckstein, Ralph;
- Lehr, Jonathan;
- Lemmer, Uli;
- Hernandez‐Sosa, Gerardo
- Article
24
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700331
- Held, Martin;
- Laiho, Patrik;
- Kaskela, Antti;
- Gannott, Florentina;
- Rother, Marcel;
- Kauppinen, Esko;
- Zaumseil, Jana
- Article
25
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700325
- Piva, Nicola;
- Greco, Francesco;
- Garbugli, Michele;
- Iacchetti, Antonio;
- Mattoli, Virgilio;
- Caironi, Mario
- Article
26
- Advanced Electronic Materials, 2018, v. 4, n. 10, p. N.PAG, doi. 10.1002/aelm.201700271
- Lai, Stefano;
- Temiño, Inés;
- Cramer, Tobias;
- del Pozo, Freddy G.;
- Fraboni, Beatrice;
- Cosseddu, Piero;
- Bonfiglio, Annalisa;
- Mas‐Torrent, Marta
- Article