Works matching IS 2199160X AND DT 2018 AND VI 4 AND IP 1
1
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201870009
- Article
2
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201870008
- Takeda, Yasunori;
- Yoshimura, Yudai;
- Shiwaku, Rei;
- Hayasaka, Kazuma;
- Sekine, Tomohito;
- Okamoto, Tomoko;
- Matsui, Hiroyuki;
- Kumaki, Daisuke;
- Katayama, Yoshinori;
- Tokito, Shizuo
- Article
3
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201870007
- Wang, Fengyun;
- Song, Longfei;
- Zhang, Hongchao;
- Meng, You;
- Luo, Linqu;
- Xi, Yan;
- Liu, Lei;
- Han, Ning;
- Yang, Zaixing;
- Tang, Jie;
- Shan, Fukai;
- Ho, Johnny C.
- Article
4
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201870006
- Pyo, Soonjae;
- Choi, Jungwook;
- Kim, Jongbaeg
- Article
5
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700501
- Zuo, Guangzheng;
- Li, Zhaojun;
- Wang, Ergang;
- Kemerink, Martijn
- Article
6
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700483
- Secor, Ethan B.;
- Cook, Alexander B.;
- Tabor, Christopher E.;
- Hersam, Mark C.
- Article
7
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700458
- Lübben, Michael;
- Wiefels, Stefan;
- Waser, Rainer;
- Valov, Ilia
- Article
8
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700442
- Wang, Lin;
- Huang, Li;
- Tan, Wee Chong;
- Feng, Xuewei;
- Chen, Li;
- Ang, Kah‐wee
- Article
9
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700427
- Pyo, Soonjae;
- Choi, Jungwook;
- Kim, Jongbaeg
- Article
10
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700424
- Pang, Qingqing;
- Chen, Hongliang;
- Wang, Xiuyan;
- Wang, Tao;
- Wang, Deyan;
- Feng, Shaoguang;
- Lu, Hongliang;
- Li, Qiaowei
- Article
11
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700414
- Xue, Guobiao;
- Zhao, Yan;
- Zhao, Xikang;
- Li, Hanying;
- Mei, Jianguo
- Article
12
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700399
- Park, So Jeong;
- Jeon, Dae‐young;
- Piontek, Sabrina;
- Grube, Matthias;
- Ocker, Johannes;
- Sessi, Violetta;
- Heinzig, André;
- Trommer, Jens;
- Kim, Gyu‐tae;
- Mikolajick, Thomas;
- Weber, Walter M.
- Article
13
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700390
- Oyama, Tatsuya;
- Mori, Tatsuya;
- Hashimoto, Tomohiro;
- Kamiya, Muneaki;
- Ichikawa, Takahiro;
- Komiyama, Hideaki;
- Yang, Yu Seok;
- Yasuda, Takuma
- Article
14
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700386
- Choi, Byung Doo;
- Park, Joohyung;
- Baeg, Kang‐jun;
- Kang, Minji;
- Heo, Jae Sang;
- Kim, Seonhyoung;
- Won, Jongkook;
- Yu, Seungwoo;
- Ahn, Kyunghan;
- Lee, Tae Hoon;
- Hong, Jongin;
- Kim, Dong‐yu;
- Usta, Hakan;
- Kim, Choongik;
- Park, Sung Kyu;
- Kim, Myung‐gil
- Article
15
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700377
- Lu, Xiaowei;
- Khatib, Omar;
- Du, Xutao;
- Duan, Jiahua;
- Wei, Wei;
- Liu, Xianli;
- Bechtel, Hans A.;
- D'apuzzo, Fausto;
- Yan, Mingtao;
- Buyanin, Alexander;
- Fu, Qiang;
- Chen, Jianing;
- Salmeron, Miquel;
- Zeng, Jie;
- Raschke, Markus B.;
- Jiang, Peng;
- Bao, Xinhe
- Article
16
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700367
- Wen, Zhenchao;
- Kubota, Takahide;
- Takanashi, Koki
- Article
17
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700348
- Kahmann, Simon;
- Sytnyk, Mykhailo;
- Schrenker, Nadine;
- Matt, Gebhard J.;
- Spiecker, Erdmann;
- Heiss, Wolfgang;
- Brabec, Christoph J.;
- Loi, Maria A.
- Article
18
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700340
- Wang, Ji‐wun;
- Liu, Yen‐po;
- Chen, Po‐han;
- Chuang, Meng‐hsi;
- Pezeshki, Atiye;
- Ling, Dah‐chin;
- Chen, Jeng‐chung;
- Chen, Yung‐fu;
- Lee, Yi‐hsien
- Article
19
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700339
- Couly, Cedric;
- Alhabeb, Mohamed;
- Van Aken, Katherine L.;
- Kurra, Narendra;
- Gomes, Luisa;
- Navarro‐suárez, Adriana M.;
- Anasori, Babak;
- Alshareef, Husam N.;
- Gogotsi, Yury
- Article
20
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700337
- Jiang, Tao;
- Zhang, Limin;
- Zhang, Xu;
- Zhang, Chi;
- Peng, Wenbo;
- Xiao, Tianxiao;
- Wang, Zhong Lin
- Article
21
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700336
- Wang, Fengyun;
- Song, Longfei;
- Zhang, Hongchao;
- Meng, You;
- Luo, Linqu;
- Xi, Yan;
- Liu, Lei;
- Han, Ning;
- Yang, Zaixing;
- Tang, Jie;
- Shan, Fukai;
- Ho, Johnny C.
- Article
22
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700329
- Lu, Shuaicheng;
- Zhao, Yang;
- Chen, Chao;
- Zhou, Ying;
- Li, Dengbing;
- Li, Kanghua;
- Chen, Wenhao;
- Wen, Xixing;
- Wang, Chong;
- Kondrotas, Rokas;
- Lowe, Nathan;
- Tang, Jiang
- Article
23
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700326
- Pfattner, Raphael;
- Foudeh, Amir M.;
- Liong, Celine;
- Bettinson, Lance;
- Hinckley, Allison C.;
- Kong, Desheng;
- Bao, Zhenan
- Article
24
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700317
- Park, Hong‐ki;
- Choi, Jaewu
- Article
25
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700313
- Takeda, Yasunori;
- Yoshimura, Yudai;
- Shiwaku, Rei;
- Hayasaka, Kazuma;
- Sekine, Tomohito;
- Okamoto, Tomoko;
- Matsui, Hiroyuki;
- Kumaki, Daisuke;
- Katayama, Yoshinori;
- Tokito, Shizuo
- Article
26
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700308
- Martín, Jaime;
- Dyson, Matthew;
- Reid, Obadiah G.;
- Li, Ruipeng;
- Nogales, Aurora;
- Smilgies, Detlef‐m.;
- Silva, Carlos;
- Rumbles, Garry;
- Amassian, Aram;
- Stingelin, Natalie
- Article
27
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700299
- Tao, Ran;
- Mouis, Mireille;
- Ardila, Gustavo
- Article
28
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700285
- Wu, Hua;
- Zhang, Yu;
- Zhang, Xiaoyu;
- Lu, Min;
- Sun, Chun;
- Bai, Xue;
- Zhang, Tieqiang;
- Sun, Guang;
- Yu, William W.
- Article
29
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700242
- Wolba, Benjamin;
- Seidel, Jan;
- Cazorla, Claudio;
- Godau, Christian;
- Haußmann, Alexander;
- Eng, Lukas M.
- Article
30
- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201600501
- Tsao, J. Y.;
- Chowdhury, S.;
- Hollis, M. A.;
- Jena, D.;
- Johnson, N. M.;
- Jones, K. A.;
- Kaplar, R. J.;
- Rajan, S.;
- Van De Walle, C. G.;
- Bellotti, E.;
- Chua, C. L.;
- Collazo, R.;
- Coltrin, M. E.;
- Cooper, J. A.;
- Evans, K. R.;
- Graham, S.;
- Grotjohn, T. A.;
- Heller, E. R.;
- Higashiwaki, M.;
- Islam, M. S.
- Article