Works matching IS 2199160X AND DT 2017 AND VI 3 AND IP 8
1
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201700096
- Volkov, Anton V.;
- Singh, Sandeep Kumar;
- Stavrinidou, Eleni;
- Gabrielsson, Roger;
- Franco‐Gonzalez, Juan F.;
- Cruce, Alex;
- Chen, Weimin M.;
- Simon, Daniel T.;
- Berggren, Magnus;
- Zozoulenko, Igor V.
- Article
2
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201700079
- Rodriguez‐Hernandez, Gerardo;
- Hosseini, Peiman;
- Ríos, Carlos;
- Wright, C. David;
- Bhaskaran, Harish
- Article
3
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201700139
- Pham, Hong Duc;
- Wu, Zhifang;
- Ono, Luis K.;
- Manzhos, Sergei;
- Feron, Krishna;
- Motta, Nunzio;
- Qi, Yabing;
- Sonar, Prashant
- Article
4
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201700029
- Jiang, Chen;
- Ma, Hanbin;
- Hasko, David Gregory;
- Guo, Xiaojun;
- Nathan, Arokia
- Article
5
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201700115
- Li, Peicheng;
- Hong, Weiji;
- Li, Yiying;
- Ingram, Grayson;
- Lu, Zheng‐Hong
- Article
6
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201600542
- Gao, Wenxiu;
- You, Lu;
- Wang, Yaojin;
- Yuan, Guoliang;
- Chu, Ying‐Hao;
- Liu, Zhiguo;
- Liu, Jun‐Ming
- Article
7
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201700134
- Shimada, Takahiro;
- Xu, Tao;
- Araki, Yasumitsu;
- Wang, Jie;
- Kitamura, Takayuki
- Article
8
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201600195
- Hui, Fei;
- Grustan‐Gutierrez, Enric;
- Long, Shibing;
- Liu, Qi;
- Ott, Anna K.;
- Ferrari, Andrea C.;
- Lanza, Mario
- Article
9
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201700181
- Saxena, Nitin;
- Čorić, Mihael;
- Greppmair, Anton;
- Wernecke, Jan;
- Pflüger, Mika;
- Krumrey, Michael;
- Brandt, Martin S.;
- Herzig, Eva M.;
- Müller‐Buschbaum, Peter
- Article
10
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201770032
- Hui, Fei;
- Grustan‐Gutierrez, Enric;
- Long, Shibing;
- Liu, Qi;
- Ott, Anna K.;
- Ferrari, Andrea C.;
- Lanza, Mario
- Article
11
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201700135
- Shi, Rui;
- Wang, Xiangjing;
- Wang, Zhan;
- Cao, Lijun;
- Song, Mengya;
- Huang, Xiao;
- Liu, Juqing;
- Huang, Wei
- Article
12
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201600409
- Lai, Stefano;
- Cosseddu, Piero;
- Basiricò, Laura;
- Ciavatti, Andrea;
- Fraboni, Beatrice;
- Bonfiglio, Annalisa
- Article
13
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201700026
- Christensen, Dennis V.;
- von Soosten, Merlin;
- Trier, Felix;
- Jespersen, Thomas S.;
- Smith, Anders;
- Chen, Yunzhong;
- Pryds, Nini
- Article
14
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201770033
- Zhang, Zhong‐Da;
- Gao, Xu;
- Zhong, Ya‐Nan;
- Liu, Jie;
- Zhang, Lin‐Xi;
- Wang, Shun;
- Xu, Jian‐Long;
- Wang, Sui‐Dong
- Article
15
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201770034
- Article
16
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201770035
- Article
17
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201770036
- Töpper, Tino;
- Lörcher, Samuel;
- Deyhle, Hans;
- Osmani, Bekim;
- Leung, Vanessa;
- Pfohl, Thomas;
- Müller, Bert
- Article
18
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201700080
- Rother, Marcel;
- Brohmann, Maximilian;
- Yang, Shuyi;
- Grimm, Stefan B.;
- Schießl, Stefan P.;
- Graf, Arko;
- Zaumseil, Jana
- Article
19
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201700106
- Kobashi, Kazuyoshi;
- Hayakawa, Ryoma;
- Chikyow, Toyohiro;
- Wakayama, Yutaka
- Article
20
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201700107
- Cheng, Xue‐Feng;
- Shi, Er‐Bo;
- Hou, Xiang;
- Shu, Jie;
- He, Jing‐Hui;
- Li, Hua;
- Xu, Qing‐Feng;
- Li, Na‐Jun;
- Chen, Dong‐Yun;
- Lu, Jian‐Mei
- Article
21
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201600416
- Ling, Haifeng;
- Tan, Kangming;
- Fang, Qiyun;
- Xu, Xinshui;
- Chen, Hao;
- Li, Wenwen;
- Liu, Yefan;
- Wang, Laiyuan;
- Yi, Mingdong;
- Huang, Ru;
- Qian, Yan;
- Xie, Linghai;
- Huang, Wei
- Article
22
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201700052
- Zhang, Zhong‐Da;
- Gao, Xu;
- Zhong, Ya‐Nan;
- Liu, Jie;
- Zhang, Lin‐Xi;
- Wang, Shun;
- Xu, Jian‐Long;
- Wang, Sui‐Dong
- Article
23
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201700073
- Töpper, Tino;
- Lörcher, Samuel;
- Deyhle, Hans;
- Osmani, Bekim;
- Leung, Vanessa;
- Pfohl, Thomas;
- Müller, Bert
- Article
24
- Advanced Electronic Materials, 2017, v. 3, n. 8, p. n/a, doi. 10.1002/aelm.201700077
- Song, Enming;
- Fang, Hui;
- Jin, Xin;
- Zhao, Jianing;
- Jiang, Chunsheng;
- Yu, Ki Jun;
- Zhong, Yiding;
- Xu, Dong;
- Li, Jinghua;
- Fang, Guanhua;
- Du, Haina;
- Zhang, Jize;
- Park, Jeong Min;
- Huang, Yonggang;
- Alam, Muhammad A.;
- Mei, Yongfeng;
- Rogers, John A.
- Article