Works matching IS 2199160X AND DT 2017 AND VI 3 AND IP 4
1
- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201700013
- Wang, Hui;
- Zhao, Dan;
- Khan, Zia Ulla;
- Puzinas, Skomantas;
- Jonsson, Magnus P.;
- Berggren, Magnus;
- Crispin, Xavier
- Article
2
- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201770019
- Article
3
- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201770017
- Zhang, Ting;
- Li, Kaiwei;
- Li, Chengchao;
- Ma, Shaoyang;
- Hng, Huey Hoon;
- Wei, Lei
- Article
4
- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201770018
- Article
5
- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201700025
- Esro, Mazran;
- Kolosov, Oleg;
- Stolojan, Vlad;
- Jones, Peter J.;
- Milne, William I.;
- Adamopoulos, George
- Article
6
- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201700018
- Ren, Xinglong;
- Bruzek, Matthew J.;
- Hanifi, David A.;
- Schulzetenberg, Aaron;
- Wu, Yanfei;
- Kim, Chang‐Hyun;
- Zhang, Zhuoran;
- Johns, James E.;
- Salleo, Alberto;
- Fratini, Simone;
- Troisi, Alessandro;
- Douglas, Christopher J.;
- Frisbie, C. Daniel
- Article
7
- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201770016
- Senkovskiy, Boris V.;
- Fedorov, Alexander V.;
- Haberer, Danny;
- Farjam, Mani;
- Simonov, Konstantin A.;
- Preobrajenski, Alexei B.;
- Mårtensson, Niels;
- Atodiresei, Nicolae;
- Caciuc, Vasile;
- Blügel, Stefan;
- Rosch, Achim;
- Verbitskiy, Nikolay I.;
- Hell, Martin;
- Evtushinsky, Daniil V.;
- German, Raphael;
- Marangoni, Tomas;
- van Loosdrecht, Paul H. M.;
- Fischer, Felix R.;
- Grüneis, Alexander
- Article
8
- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201600508
- Li, Linglong;
- Cao, Ye;
- Somnath, Suhas;
- Yang, Yaodong;
- Jesse, Stephen;
- Ehara, Yoshitaka;
- Funakubo, Hiroshi;
- Chen, Long‐Qing;
- Kalinin, Sergei V.;
- Vasudevan, Rama K.
- Article
9
- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201600554
- Zhang, Ting;
- Li, Kaiwei;
- Li, Chengchao;
- Ma, Shaoyang;
- Hng, Huey Hoon;
- Wei, Lei
- Article
10
- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201600548
- Chen, Chien‐Tung;
- Lee, Wen‐Ya;
- Shen, Tien‐Lin;
- Wu, Hung‐Chin;
- Shih, Chien‐Chung;
- Ye, Bo‐Wei;
- Lin, Tzu‐Yao;
- Chen, Wen‐Chang;
- Chen, Yang‐Fang
- Article
11
- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201600546
- Zhang, Yuan;
- Phan, Hung;
- Zhou, Huiqiong;
- Zhang, Xuning;
- Zhou, Jiyu;
- Moudgil, Karttikay;
- Barlow, Stephen;
- Marder, Seth R.;
- Facchetti, Antonio;
- Nguyen, Thuc‐Quyen
- Article
12
- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201600524
- Chen, Bolin;
- Das, Suprem R.;
- Zheng, Wei;
- Zhu, Bowen;
- Xu, Biao;
- Hong, Sungbum;
- Sun, Chenghan;
- Wang, Xinwei;
- Wu, Yue;
- Claussen, Jonathan C.
- Article
13
- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201700007
- Yin, Hang;
- Cheung, Sin Hang;
- Ngai, Jenner H. L.;
- Ho, Carr Hoi Yi;
- Chiu, Ka Lok;
- Hao, Xiaotao;
- Li, Ho Wa;
- Cheng, Yuanhang;
- Tsang, Sai Wing;
- So, Shu Kong
- Article
14
- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201600490
- Senkovskiy, Boris V.;
- Fedorov, Alexander V.;
- Haberer, Danny;
- Farjam, Mani;
- Simonov, Konstantin A.;
- Preobrajenski, Alexei B.;
- Mårtensson, Niels;
- Atodiresei, Nicolae;
- Caciuc, Vasile;
- Blügel, Stefan;
- Rosch, Achim;
- Verbitskiy, Nikolay I.;
- Hell, Martin;
- Evtushinsky, Daniil V.;
- German, Raphael;
- Marangoni, Tomas;
- van Loosdrecht, Paul H. M.;
- Fischer, Felix R.;
- Grüneis, Alexander
- Article
15
- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201600505
- Fengler, Franz P. G.;
- Pešić, Milan;
- Starschich, Sergej;
- Schneller, Theodor;
- Künneth, Christopher;
- Böttger, Ulrich;
- Mulaosmanovic, Halid;
- Schenk, Tony;
- Park, Min Hyuk;
- Nigon, Robin;
- Muralt, Paul;
- Mikolajick, Thomas;
- Schroeder, Uwe
- Article
16
- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201600502
- Sun, Mengxing;
- Fang, Qiyi;
- Xie, Dan;
- Sun, Yilin;
- Xu, Jianlong;
- Teng, Changjiu;
- Dai, Ruixuan;
- Yang, Pu;
- Li, Zhixin;
- Li, Weiwei;
- Zhang, Yanfeng
- Article
17
- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201600455
- Joo, Yunsik;
- Yoon, Jaeyoung;
- Ha, Jewook;
- Kim, Taehoon;
- Lee, Seunghwan;
- Lee, Byeongmoon;
- Pang, Changhyun;
- Hong, Yongtaek
- Article
18
- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201600400
- Zhou, Changjian;
- Chai, Yang
- Article
19
- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201600364
- Shim, Jaewoo;
- Park, Hyung‐Youl;
- Kang, Dong‐Ho;
- Kim, Jin‐Ok;
- Jo, Seo‐Hyeon;
- Park, Yongkook;
- Park, Jin‐Hong
- Article
20
- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201600325
- Du, Songnan;
- Li, Gongtan;
- Cao, Xuhong;
- Wang, Yan;
- Lu, Huiling;
- Zhang, Shengdong;
- Liu, Chuan;
- Zhou, Hang
- Article