Works matching IS 2199160X AND DT 2017 AND VI 3 AND IP 3
1
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201770014
- Article
2
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201770013
- Article
3
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600498
- Zhang, Ganghua;
- Liu, Fengliang;
- Gu, Tingting;
- Zhao, Yongsheng;
- Li, Nana;
- Yang, Wenge;
- Feng, Shouhua
- Article
4
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201770011
- Fioretti, Angela N.;
- Stokes, Adam;
- Young, Matthew R.;
- Gorman, Brian;
- Toberer, Eric S.;
- Tamboli, Adele C.;
- Zakutayev, Andriy
- Article
5
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201770015
- Ford, Michael J.;
- Labram, John G.;
- Wang, Ming;
- Wang, Hengbin;
- Nguyen, Thuc‐Quyen;
- Bazan, Guillermo C.
- Article
6
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201700005
- Collins, Samuel D.;
- Mikhnenko, Oleksandr V.;
- Nguyen, Thanh Luan;
- Rengert, Zachary D.;
- Bazan, Guillermo C.;
- Woo, Han Young;
- Nguyen, Thuc‐Quyen
- Article
7
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600544
- Fioretti, Angela N.;
- Stokes, Adam;
- Young, Matthew R.;
- Gorman, Brian;
- Toberer, Eric S.;
- Tamboli, Adele C.;
- Zakutayev, Andriy
- Article
8
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600540
- Chen, Yan;
- Zhang, Yang;
- Yuan, Feifei;
- Ding, Fei;
- Schmidt, Oliver G.
- Article
9
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600537
- Ford, Michael J.;
- Labram, John G.;
- Wang, Ming;
- Wang, Hengbin;
- Nguyen, Thuc‐Quyen;
- Bazan, Guillermo C.
- Article
10
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600535
- Liang, Guojin;
- Hu, Haibo;
- Liao, Lei;
- He, Yunbin;
- Ye, Changhui
- Article
11
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600534
- Huang, Siya;
- Liu, Yuan;
- Guo, Chuan Fei;
- Ren, Zhifeng
- Article
12
- 2017
- Goetz, Katelyn P.;
- Tsutsumi, Jun'ya;
- Pookpanratana, Sujitra;
- Chen, Jihua;
- Corbin, Nathan S.;
- Behera, Rakesh K.;
- Coropceanu, Veaceslav;
- Richter, Curt A.;
- Hacker, Christina A.;
- Hasegawa, Tatsuo;
- Jurchescu, Oana D.
- Letter to the Editor
13
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600517
- Oh, Eunho;
- Byun, Junghwan;
- Lee, Byeongmoon;
- Kim, Sangwoo;
- Kim, Daesik;
- Yoon, Jaeyoung;
- Hong, Yongtaek
- Article
14
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600516
- Xu, Dikai;
- He, Jian;
- Yu, Xuegong;
- Gao, Dace;
- Ma, Lingling;
- Mu, Xinhui;
- Zhong, Mengyao;
- Xu, Yang;
- Ye, Jichun;
- Xu, Mingsheng;
- Yang, Deren
- Article
15
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600513
- Liu, Ao;
- Guo, Zidong;
- Liu, Guoxia;
- Zhu, Chundan;
- Zhu, Huihui;
- Shin, Byoungchul;
- Fortunato, Elvira;
- Martins, Rodrigo;
- Shan, Fukai
- Article
16
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600509
- Shao, Feng;
- Feng, Ping;
- Wan, Changjin;
- Wan, Xiang;
- Yang, Yi;
- Shi, Yi;
- Wan, Qing
- Article
17
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600503
- Araoka, Fumito;
- Isoda, Morio;
- Miyajima, Daigo;
- Seo, Inseon;
- Oh‐e, Masahito;
- Aida, Takuzo;
- Takezoe, Hideo
- Article
18
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600378
- Pattanasattayavong, Pichaya;
- Promarak, Vinich;
- Anthopoulos, Thomas D.
- Article
19
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600483
- Zhao, Yudan;
- Huo, Yujia;
- Xiao, Xiaoyang;
- Wang, Yingcheng;
- Zhang, Tianfu;
- Jiang, Kaili;
- Wang, Jiaping;
- Fan, Shoushan;
- Li, Qunqing
- Article
20
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600449
- Wang, Shun;
- Zhang, Ting;
- Li, Kaiwei;
- Ma, Shaoyang;
- Chen, Ming;
- Lu, Ping;
- Wei, Lei
- Article
21
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600452
- Kang, Tae Sung;
- Yoon, Kap Soo;
- Baek, Gwang Ho;
- Ko, Won Bae;
- Yang, Seung Mo;
- Yeon, Bum Mo;
- Hong, Jin Pyo
- Article
22
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600437
- Article
23
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600498
- Zhang, Ganghua;
- Liu, Fengliang;
- Gu, Tingting;
- Zhao, Yongsheng;
- Li, Nana;
- Yang, Wenge;
- Feng, Shouhua
- Article
24
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600369
- Xie, Wei;
- Zhang, Xin;
- Leighton, Chris;
- Frisbie, C. Daniel
- Article
25
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600314
- Article
26
- Advanced Electronic Materials, 2017, v. 3, n. 3, p. 1, doi. 10.1002/aelm.201600282
- Wan, Caihua;
- Zhang, Xuan;
- Yuan, Zhonghui;
- Fang, Chi;
- Kong, Wenjie;
- Zhang, Qintong;
- Wu, Hao;
- Khan, Usman;
- Han, Xiufeng
- Article