Works matching IS 2199160X AND DT 2017 AND VI 3 AND IP 2
1
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201770008
- Article
2
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201600375
- Heo, Hoseok;
- Sung, Ji Ho;
- Ahn, Ji‐Hoon;
- Ghahari, Fereshte;
- Taniguchi, Takashi;
- Watanabe, Kenji;
- Kim, Philip;
- Jo, Moon‐Ho
- Article
3
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201770010
- Park, Seoungwoong;
- Park, Siyong;
- Park, Sangki;
- Ryu, Hochung;
- Park, Jong‐Jin
- Article
4
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201770009
- Article
5
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201770006
- Brus, Viktor V.;
- Gluba, Marc A.;
- Mai, Cheng‐Kang;
- Fronk, Stephanie L.;
- Rappich, Jörg;
- Nickel, Norbert H.;
- Bazan, Guillermo C.
- Article
6
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201600421
- Thiburce, Quentin;
- Campbell, Alasdair J.
- Article
7
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201600426
- Zhang, Chuang;
- Sun, Dali;
- Vardeny, Z. Valy
- Article
8
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201600470
- Patel, Jay B.;
- Wong‐Leung, Jennifer;
- Van Reenen, Stephan;
- Sakai, Nobuya;
- Wang, Jacob Tse Wei;
- Parrott, Elizabeth S.;
- Liu, Mingzhen;
- Snaith, Henry J.;
- Herz, Laura M.;
- Johnston, Michael B.
- Article
9
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201770007
- Hou, Linrui;
- Bao, Ruiqi;
- Rehan, Muhammad;
- Tong, Liuniu;
- Pang, Gang;
- Zhang, Xiaogang;
- Yuan, Changzhou
- Article
10
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201600515
- Brus, Viktor V.;
- Gluba, Marc A.;
- Mai, Cheng‐Kang;
- Fronk, Stephanie L.;
- Rappich, Jörg;
- Nickel, Norbert H.;
- Bazan, Guillermo C.
- Article
11
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201600399
- Kuc, Agnieszka;
- Cusati, Teresa;
- Dib, Elias;
- Oliveira, Augusto F.;
- Fortunelli, Alessandro;
- Iannaccone, Giuseppe;
- Heine, Thomas;
- Fiori, Gianluca
- Article
12
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201600473
- Andrei, Virgil;
- Bethke, Kevin;
- Madzharova, Fani;
- Beeg, Sebastian;
- Knop‐Gericke, Axel;
- Kneipp, Janina;
- Rademann, Klaus
- Article
13
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201600366
- Prieto‐Ruiz, Juan Pablo;
- Miralles, Sara G.;
- Großmann, Nicolas;
- Aeschlimann, Martin;
- Cinchetti, Mirko;
- Prima‐García, Helena;
- Coronado, Eugenio
- Article
14
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201600458
- Wang, Jian;
- Xu, Liang;
- Zhang, Bo;
- Lee, Yun‐Ju;
- Hsu, Julia W. P.
- Article
15
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201600440
- Park, Seoungwoong;
- Park, Siyong;
- Park, Sangki;
- Ryu, Hochung;
- Park, Jong‐Jin
- Article
16
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201600438
- Brus, Viktor V.;
- Lang, Felix;
- Bundesmann, Jürgen;
- Seidel, Sophie;
- Denker, Andrea;
- Rech, Bernd;
- Landi, Giovanni;
- Neitzert, Heinz C.;
- Rappich, Jörg;
- Nickel, Norbert H.
- Article
17
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201600429
- Pudzs, Kaspars;
- Vembris, Aivars;
- Rutkis, Martins;
- Woodward, Simon
- Article
18
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201600425
- Wang, Ran;
- Xu, Zhen;
- Zhuang, Jihan;
- Liu, Zheng;
- Peng, Li;
- Li, Zheng;
- Liu, Yingjun;
- Gao, Weiwei;
- Gao, Chao
- Article
19
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201600404
- Kim, Hae Jin;
- Yoon, Kyung Jean;
- Park, Tae Hyung;
- Kim, Han Joon;
- Kwon, Young Jae;
- Shao, Xing Long;
- Kwon, Dae Eun;
- Kim, Yu Min;
- Hwang, Cheol Seong
- Article
20
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201600311
- Lu, Chien;
- Lee, Wen‐Ya;
- Gu, Xiaodan;
- Xu, Jie;
- Chou, Ho‐Hsiu;
- Yan, Hongping;
- Chiu, Yu‐Cheng;
- He, Mingqian;
- Matthews, James R.;
- Niu, Weijun;
- Tok, Jeffery B.‐H.;
- Toney, Michael F.;
- Chen, Wen‐Chang;
- Bao, Zhenan
- Article
21
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201600322
- Hou, Linrui;
- Bao, Ruiqi;
- Rehan, Muhammad;
- Tong, Liuniu;
- Pang, Gang;
- Zhang, Xiaogang;
- Yuan, Changzhou
- Article
22
- Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201600240
- Kang, Boseok;
- Ge, Feng;
- Qiu, Longzhen;
- Cho, Kilwon
- Article